Patents by Inventor William B. Archibald
William B. Archibald has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20090262343Abstract: Wide band infrared spectroscopy of molecules in a variety of media is provided by apparatuses, materials and methods that allow real time spectroscopic view of molecules such as proteins in native environments. Precisely machined sample holders and algorithms are used to reduce spectroscopic effects of solvents such as water. Multiple samples can be analyzed simultaneously. Embodiments provide secondary and tertiary structure information of substances such as proteins based on molecular interactions that can be monitored and manipulated in real time.Type: ApplicationFiled: April 20, 2009Publication date: October 22, 2009Inventor: William B. ARCHIBALD
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Patent number: 7242000Abstract: This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques.Type: GrantFiled: March 18, 2003Date of Patent: July 10, 2007Assignee: Symyx Technologies, Inc.Inventors: William B. Archibald, Marc D. Hornbostel
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Patent number: 7076115Abstract: Computer programs and computer-implemented methods implement techniques for evaluating experimental data from a library of materials. The techniques receive a plurality of images of a library of materials that includes an array of members associated with locations in the library. User input identifying a plurality of regions of interest is received. A series of reduced data values is determined for one or more of the regions of interest as a statistical function of a plurality of pixel values for pixels in the corresponding regions. A figure of merit is calculated from one or more of the series of reduced data values for a library member at the corresponding library location. The regions of interest include a plurality of pixels in the images and correspond to locations in the library.Type: GrantFiled: March 16, 2004Date of Patent: July 11, 2006Assignee: Synyx Technologies, Inc.Inventors: Thomas Crevier, William B. Archibald, Marc Hornbostel, Dieter Schaefer, Thomas Boussie
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Patent number: 7033542Abstract: Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.Type: GrantFiled: February 14, 2003Date of Patent: April 25, 2006Inventors: William B. Archibald, Alfred W. Archibald
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Publication number: 20040175760Abstract: Computer programs and computer-implemented methods implement techniques for evaluating experimental data from a library of materials. The techniques receive a plurality of images of a library of materials that includes an array of members associated with locations in the library. User input identifying a plurality of regions of interest is received. A series of reduced data values is determined for one or more of the regions of interest as a statistical function of a plurality of pixel values for pixels in the corresponding regions. A figure of merit is calculated from one or more of the series of reduced data values for a library member at the corresponding library location. The regions of interest include a plurality of pixels in the images and correspond to locations in the library.Type: ApplicationFiled: March 16, 2004Publication date: September 9, 2004Applicant: Symyx Technologies, Inc.Inventors: Thomas Crevier, William B. Archibald, Marc Hornbostel, Dieter Schaefer, Thomas Boussie
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Patent number: 6738529Abstract: Computer programs and computer-implemented methods are disclosed for extracting and analyzing combinatorial chemical data from images. The invention receives a stream of data, identifies a plurality of regions of interest and determines a series of values for one or more regions of interest. The library includes a plurality of members. The data stream includes a series of images of the library. Each region of interest corresponds to a location in each of the images and to a location in the library. The series of values for each region includes a value for each of the images. Particular embodiments have the following features. The invention calculates a figure of merit for a library member from each series of values. The stream of data comprises a series of images generated at a frequency of greater than about 1, 6, 12 or 30 frames per second. The series of images is captured from a beginning of a combinatorial experiment to an end of a commercial experiment.Type: GrantFiled: October 8, 1999Date of Patent: May 18, 2004Assignee: Symyx Technologies, Inc.Inventors: Thomas Crevier, William B. Archibald, Marc Hornbostel, Dieter Schaefer, Thomas Boussie
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Publication number: 20040023302Abstract: This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques.Type: ApplicationFiled: March 18, 2003Publication date: February 5, 2004Applicant: Symyx Technologies, Inc.Inventors: William B. Archibald, Marc D. Hornbostel
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Publication number: 20030175160Abstract: Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.Type: ApplicationFiled: February 14, 2003Publication date: September 18, 2003Inventors: William B. Archibald, Alfred W. Archibald
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Publication number: 20030138025Abstract: A method and apparatus for high-throughput determination of phase change points of combinatorial libraries of metal alloys uses an infrared camera to monitor temperature-dependent changes in emissivity/reflectivity of the alloys. An infrared focal plane array monitors the emissivity/reflectivity changes over time, and the intensity of each heated member over time is correlated with temperature to detect the phase change points of the members.Type: ApplicationFiled: February 5, 2003Publication date: July 24, 2003Applicant: SYMYX TECHNOLOGIES, INC.Inventors: William B. Archibald, Marc Hornbostel
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Patent number: 6576906Abstract: This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques.Type: GrantFiled: October 8, 1999Date of Patent: June 10, 2003Assignee: Symyx Technologies, Inc.Inventors: William B. Archibald, Marc Hornbostel
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Patent number: 6536944Abstract: A method and apparatus for high-throughput determination of phase change points of combinatorial libraries of metal alloys uses an infrared camera to monitor temperature-dependent changes in emissivity/reflectivity of the alloys. An infrared focal plane array monitors the emissivity/reflectivity changes over time, and the intensity of each heated member over time is correlated with temperature to detect the phase change points of the members.Type: GrantFiled: October 8, 1999Date of Patent: March 25, 2003Assignee: Symyx Technologies, Inc.Inventors: William B. Archibald, Marc Hornbostel
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Patent number: 6225550Abstract: An improved material for a thermoelectric device and thermoelectric systems incorporating the same.Type: GrantFiled: September 9, 1999Date of Patent: May 1, 2001Assignee: Symyx Technologies, Inc.Inventors: Marc Hornbostel, William B. Archibald