Patents by Inventor William D. Partlow

William D. Partlow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5837054
    Abstract: Crystals formed of a solid-solution of NiSiF.sub.6 6H.sub.2 O provide very good materials for filtering ultraviolet light and will not deteriorate in temperatures as high as 115.degree. C. They are particularly useful in sensing devices which seek to identify the presence of ultraviolet light in the UV missile warning band.
    Type: Grant
    Filed: August 30, 1996
    Date of Patent: November 17, 1998
    Assignee: Northrop Grumman Corporation
    Inventors: Narsingh B. Singh, William D. Partlow, Steven Strauch, Albert M. Stewart, John F. Jackovitz, David W. Coffey, Robert Mazelski
  • Patent number: 5788765
    Abstract: Crystals formed of a solid-solution of K.sub.2 Ni(SO.sub.4).sub.2 6H.sub.2 O provide very good materials for filtering ultraviolet light and will not deteriorate in temperatures as high as 110.degree. C. They are particularly useful in sensing devices which seek to identify the presence of ultraviolet light in the UV missile warning band.
    Type: Grant
    Filed: August 30, 1996
    Date of Patent: August 4, 1998
    Assignee: Northrop Grumman Corporation
    Inventors: Narsingh B. Singh, William D. Partlow, Steven Strauch, Albert M. Stewart, John F. Jackovitz, David W. Coffey
  • Patent number: 5742428
    Abstract: Crystals formed of a solid-solution of Ni(BF.sub.4).sub.2 6H.sub.2 O provide very good materials for filtering ultraviolet light and will not deteriorate in temperatures as high as 110.degree. C. They are particularly useful in sensing devices which seek to identify the presence of ultraviolet light in the UV missile warning band.
    Type: Grant
    Filed: September 30, 1996
    Date of Patent: April 21, 1998
    Assignee: Northrop Grumman Corporation
    Inventors: Narsingh B. Singh, William D. Partlow, Steven Strauch, Albert M. Stewart, John F. Jackovitz, David W. Coffey, Robert Mazelsky, James D.B. Smith
  • Patent number: 5573592
    Abstract: This invention discloses a method of synthesizing a Group III-V compound semi-conducting film from a Group III metal alkyl and Group V hydride wherein the method comprises providing a vacuum chamber in which the synthesis takes place, adsorbing at least one monolayer of said Group III metal alkyl on an inert surface, backfilling the chamber with a Group V hydride, adsorbing the Group V hydride on the inert surface, providing atomic hydrogen atoms from electron-induced dissociation of Group V hydride adsorbed on the surface, inducing an electron-induced depletion of carbon at a rate which is dependent on the pressure of the Groups V hydride, retaining substantially all Group III metal on the surface and providing a thermally stable Group III-V compound semi-conducting film on the inert SiO.sub.2 surface. Methods for synthesizing a multilayer Group III-V semi-conducting film and specifically a GaN film are also disclosed, along with the apparatus for the synthesis of Group III-V compound semi-conducting films.
    Type: Grant
    Filed: December 22, 1994
    Date of Patent: November 12, 1996
    Assignee: University of Pittsburgh of the Commonwealth system of Higher Education
    Inventors: Andreas H ubner, Scott R. Lucas, William D. Partlow, W. J. Choyke, J. A. Sch afer, John T. Yates, Jr.
  • Patent number: 5414195
    Abstract: The concentrations of residual heavy metal contaminants in the particulate material in a slurry produced in a particulate material washing process are monitored on-line and can be used to control the washing process. In alternative embodiments of the invention, x-rays, thermal neutrons or laser beams are directed at the slurry as it flows through a flow cell to induce emission of secondary x-rays, gamma rays or light, respectively, characteristic of the heavy metal contaminants and constituents representative of the solids contents of the slurry. These characteristic energies are measured and used to determine the concentration in ppm of the residual heavy metal contaminants in the particulate material within the slurry.
    Type: Grant
    Filed: June 17, 1992
    Date of Patent: May 9, 1995
    Assignee: Westinghouse Electric Corporation
    Inventors: Steven H. Peterson, Edward J. Lahoda, David C. Grant, Edward F. Sverdrup, Thomas V. Congedo, John Bartko, Robert E. Witkowski, Arthur L. Wolfe, William D. Partlow, Michael C. Skriba
  • Patent number: 5133901
    Abstract: The concentrations of residual heavy metal contaminants in the particulate material in a slurry produced in a particulate material washing process are monitored on-line and can be used to control the washing process. In alternative embodiments of the invention, x-rays, thermal neutrons or laser beams are directed at the slurry as it flows through a flow cell to induce emission of secondary x-rays, gamma rays or light, respectively, characteristic of the heavy metal contaminants and constituents representative of the solids contents of the slurry. These characteristic energies are measured and used to determine the concentration in ppm of the residual heavy metal contaminants in the particulate material within the slurry.
    Type: Grant
    Filed: March 1, 1991
    Date of Patent: July 28, 1992
    Assignee: Westinghouse Electric Corp.
    Inventors: Steven H. Peterson, Edward J. Lahoda, David C. Grant, Edward F. Sverdrup, Thomas V. Congedo, John Bartko, Robert E. Witkowski, Arthur L. Wolfe, William D. Partlow, Michael C. Skriba