Patents by Inventor William F. O'Neil

William F. O'Neil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5514865
    Abstract: A system for sensing images using a detector array and correcting errors in the image signals caused by gain and offset variations from detector to detector in the array is disclosed. To correct gain and offset errors, the detector array is dithered by moving the detector line of sight between consecutive frames according to a predetermined pattern. This dithering causes different detectors to image the same location in the scene during different frames, and causes two adjacent detectors to scan between the same two points in the scene during a cycle of the dither pattern. Image data generated from the dithering is used to remove gain and offset errors from the sensed images, and to generate gain and offset correction values to be stored in a table and applied to the sensed images. The system is also adapted to compensate for scene changes when the detector array is installed on a moving platform.
    Type: Grant
    Filed: June 10, 1994
    Date of Patent: May 7, 1996
    Assignee: Westinghouse Electric Corp.
    Inventor: William F. O'Neil
  • Patent number: 4670653
    Abstract: An infrared detector and imaging system responsive to the scanned image from an objective lens and scanner system, the infrared detector and imaging system comprising: a detector substrate; a sparsely populated staggered detector array formed on the detector substrate, the detector substrate having a focal plane surface receiving the scanned image from the objective lens and scanner system. A clock means provides clock signals. A control signal means is responsive to the clock signal for providing a sequence of predetermined scanner position signals. A servo responsive to each scanner position signal commands the scanner means to locate the scanned image at predetermined positions on the focal plane. A detector signal integration means receives and integrates an array of detector signals from the sparsely populated detector array.
    Type: Grant
    Filed: October 10, 1985
    Date of Patent: June 2, 1987
    Assignee: Rockwell International Corporation
    Inventors: Charles C. McConkle, William F. O'Neil, Michael J. Meier, Thomas P. Fjeldsted, James L. Thomas, Arthur F. Pfeifer