Patents by Inventor William Hagerup
William Hagerup has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11454651Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: GrantFiled: December 7, 2020Date of Patent: September 27, 2022Assignee: Tektronix, Inc.Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Patent number: 11249111Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: GrantFiled: July 5, 2018Date of Patent: February 15, 2022Assignee: Tektronix, Inc.Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Publication number: 20210088553Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: ApplicationFiled: December 7, 2020Publication date: March 25, 2021Applicant: Tektronix, Inc.Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Patent number: 10241133Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.Type: GrantFiled: November 7, 2017Date of Patent: March 26, 2019Assignee: Tektronix, Inc.Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann, Daniel J. Ayres
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Patent number: 10168356Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.Type: GrantFiled: August 19, 2015Date of Patent: January 1, 2019Assignee: Tektronix, Inc.Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock
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Patent number: 10119992Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.Type: GrantFiled: April 1, 2015Date of Patent: November 6, 2018Assignee: Tektronix, Inc.Inventors: William A. Hagerup, Julie A. Campbell, Ira G. Pollock, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann, Daniel J. Ayres, Christina D. Enns
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Publication number: 20180313870Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: ApplicationFiled: July 5, 2018Publication date: November 1, 2018Applicant: Tektronix, Inc.Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Patent number: 10041975Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: GrantFiled: November 23, 2015Date of Patent: August 7, 2018Assignee: Tektronix, Inc.Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Publication number: 20180059139Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.Type: ApplicationFiled: November 7, 2017Publication date: March 1, 2018Applicant: Tektronix, Inc.Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F.M. Ullom, Charles M. Hartmann, Daniel J. Ayres
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Patent number: 9810715Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.Type: GrantFiled: December 31, 2014Date of Patent: November 7, 2017Assignee: Tektronix, Inc.Inventors: Julie A. Campbell, Ira G. Pollock, William A. Hagerup, Christina D. Enns
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Patent number: 9772391Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.Type: GrantFiled: January 24, 2014Date of Patent: September 26, 2017Assignee: Tektronix, Inc.Inventors: John J. Pickerd, William A. Hagerup, William Q. Law
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Publication number: 20170052216Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.Type: ApplicationFiled: August 19, 2015Publication date: February 23, 2017Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock
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Publication number: 20160291054Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.Type: ApplicationFiled: April 1, 2015Publication date: October 6, 2016Inventors: William A. Hagerup, Julie A. Campbell, Ira G. Pollock, James E. Spinar, Kathleen F.M. Ullom, Charles M. Hartmann, Daniel J. Ayres, Christina D. Enns
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Publication number: 20160187382Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.Type: ApplicationFiled: December 31, 2014Publication date: June 30, 2016Inventors: Julie A. Campbell, Ira G. Pollock, William A. Hagerup, Christina D. Enns
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Publication number: 20160077128Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: ApplicationFiled: November 23, 2015Publication date: March 17, 2016Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Patent number: 9194888Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: GrantFiled: October 11, 2012Date of Patent: November 24, 2015Assignee: TEKTRONIX, INC.Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
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Publication number: 20150212185Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.Type: ApplicationFiled: January 24, 2014Publication date: July 30, 2015Applicant: Tektronix, Inc.Inventors: John J. Pickerd, William A. Hagerup, William Q. Law
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Publication number: 20140103951Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.Type: ApplicationFiled: October 11, 2012Publication date: April 17, 2014Inventors: Daniel G. KNIERIM, William A. HAGERUP, Barton T. HICKMAN, Ira G. Pollock
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Patent number: 7994801Abstract: A new methodology for the measurement of the S-parameters of a high impedance probe allows obtaining a full two port S-parameter set for the high impedance probe. The measured probe S-parameters are then used for characterization of probes. An alternative method characterizes half of the fixture and termination as a one-port network and expanding it into a two-port error box. The two-port error box is then cascaded with the probe input.Type: GrantFiled: May 8, 2008Date of Patent: August 9, 2011Assignee: Tektronix, Inc.Inventors: William A. Hagerup, Laudie Doubrava
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Patent number: 7460983Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.Type: GrantFiled: August 23, 2006Date of Patent: December 2, 2008Assignee: Tektronix, Inc.Inventors: John J. Pickerd, Kan Tan, William A. Hagerup, Rolf P. Anderson, Sharon M. Mc Masters