Patents by Inventor William Jenko

William Jenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10180353
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Grant
    Filed: June 30, 2017
    Date of Patent: January 15, 2019
    Assignee: SpectraSensors, Inc.
    Inventors: Xiang Liu, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Publication number: 20180120159
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Application
    Filed: June 30, 2017
    Publication date: May 3, 2018
    Inventors: XIANG LIU, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Patent number: 9696204
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Grant
    Filed: August 3, 2015
    Date of Patent: July 4, 2017
    Assignee: SPECTRASENSORS, INC.
    Inventors: Xiang Liu, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch
  • Publication number: 20170038257
    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
    Type: Application
    Filed: August 3, 2015
    Publication date: February 9, 2017
    Inventors: Xiang Liu, Gary Yeh, Adam S. Chaimowitz, William Jenko, Alfred Feitisch