Patents by Inventor William Judson Hendrix

William Judson Hendrix has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9441937
    Abstract: An apparatus for measuring thickness of an object is provided. The apparatus includes a compression control system which further includes a movable platform, a compression sensor, and a switching device operatively coupled to the compression sensor. The apparatus also includes a measurement system operatively coupled to the switching device for receiving a signal representative of a toggle event at the switching device and configured to measure a gradient. The apparatus also includes a processing circuit operatively coupled to the switching device and the measurement system for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device by using the gradient and a communication circuit for transmitting a measured thickness of the object to a remote database.
    Type: Grant
    Filed: December 12, 2014
    Date of Patent: September 13, 2016
    Assignee: General Electric Company
    Inventors: Yakov Polishchuk, Robert William Tait, William Judson Hendrix, Jr., Michael Francis Strong
  • Patent number: 9255779
    Abstract: A taper gauge that includes an elongate taper assembly that has a tip section and an electronics section that includes a location determining element that collects data related to a measurement area when the tip section is inserted in the measurement area and a power source. An embodiment allows for increased precision, accuracy, and speed for wireless measurement of gaps. A method and system that uses the taper gauge.
    Type: Grant
    Filed: December 19, 2013
    Date of Patent: February 9, 2016
    Assignee: General Electric Company
    Inventors: John Brandon Laflen, John William Herbold, William Judson Hendrix, Jason Harris Karp, Yakov Polishchuk, Robert William Tait, Steven William Wik, Juntao Wu
  • Publication number: 20150096183
    Abstract: A taper gauge that includes an elongate taper assembly that has a tip section and an electronics section that includes a location determining element that collects data related to a measurement area when the tip section is inserted in the measurement area and a power source. An embodiment allows for increased precision, accuracy, and speed for wireless measurement of gaps. A method and system that uses the taper gauge.
    Type: Application
    Filed: December 19, 2013
    Publication date: April 9, 2015
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: John Brandon Laflen, John William Herbold, William Judson Hendrix, Jason Harris Karp, Yakov Polishchuk, Robert William Tait, Steven William Wik, Juntao Wu
  • Publication number: 20150096184
    Abstract: An apparatus for measuring thickness of an object is provided. The apparatus includes a compression control system which further includes a movable platform, a compression sensor, and a switching device operatively coupled to the compression sensor. The apparatus also includes a measurement system operatively coupled to the switching device for receiving a signal representative of a toggle event at the switching device and configured to measure a gradient. The apparatus also includes a processing circuit operatively coupled to the switching device and the measurement system for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device by using the gradient and a communication circuit for transmitting a measured thickness of the object to a remote database.
    Type: Application
    Filed: December 12, 2014
    Publication date: April 9, 2015
    Inventors: Yakov Polishchuk, Robert William Tait, William Judson Hendrix, JR., Michael Francis Strong