Patents by Inventor William M. Silver
William M. Silver has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20130141591Abstract: This invention provides a Graphical User Interface (GUI) that operates in connection with a machine vision detector or other machine vision system, which provides a highly intuitive and industrial machine-like appearance and layout. The GUI includes a centralized image frame window surrounded by panes having buttons and specific interface components that the user employs in each step of a machine vision system set up and run procedure. One pane allows the user to view and manipulate a recorded filmstrip of image thumbnails taken in a sequence, and provides the filmstrip with specialized highlighting (colors or patterns) that indicate useful information about the underlying images. The programming of logic is performed using a programming window that includes a ladder logic arrangement.Type: ApplicationFiled: September 20, 2012Publication date: June 6, 2013Applicant: Cognex CorporationInventors: William M. Silver, Brian S. Phillips
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Patent number: 8422729Abstract: Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.Type: GrantFiled: June 27, 2007Date of Patent: April 16, 2013Assignee: Cognex CorporationInventors: William M. Silver, Robert J. Tremblay, Andrew Eames
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Patent number: 8411929Abstract: Disclosed are methods and systems for dynamic feature detection of physical features of objects in the field of view of a sensor. Dynamic feature detection substantially reduces the effects of accidental alignment of physical features with the pixel grid of a digital image by using the relative motion of objects or material in and/or through the field of view to capture and process a plurality of images that correspond to a plurality of alignments. Estimates of the position, weight, and other attributes of a feature are based on an analysis of the appearance of the feature as it moves in the field of view and appears at a plurality of pixel grid alignments. The resulting reliability and accuracy is superior to prior art static feature detection systems and methods.Type: GrantFiled: August 1, 2012Date of Patent: April 2, 2013Assignee: Cognex CorporationInventor: William M. Silver
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Patent number: 8363956Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 30, 2004Date of Patent: January 29, 2013Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Matthew L. Hill, Nigel J. Foster, Sanjay Nichani, Willard P. Foster, Adam Wagman
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Patent number: 8363942Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: January 29, 2013Assignee: Cognex Technology and Investment CorporationInventors: William M. Silver, E. John McGarry, Sanjay Nichani, Adam Wagman
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Patent number: 8363972Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: January 29, 2013Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Matthew L. Hill, Nigel J. Foster, Sanjay Nichani, Willard P. Foster, Adam Wagman
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Patent number: 8335380Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: December 18, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Sanjay Nichani, Adam Wagman
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Patent number: 8331673Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 30, 2004Date of Patent: December 11, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Matt Hill, Willard Foster
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Patent number: 8320675Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: November 27, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Sanjay Nichani, Adam Wagman
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Patent number: 8295552Abstract: Disclosed are systems and methods for setting various operating parameters of a vision detector from production line information that can be supplied by a manufacturing technician who is not skilled in the art of the invention. These operating parameters include shutter time, video gain, idle time, frame count, and locator search range. The production line information includes line speed, field of view size, direction of motion, and object spacing.Type: GrantFiled: April 29, 2009Date of Patent: October 23, 2012Assignee: Cognex Technology and Investment CorporationInventors: Brian V. Mirtich, William M. Silver
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Patent number: 8295613Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: October 23, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Sanjay Nichani, Adam Wagman
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Patent number: 8290238Abstract: Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.Type: GrantFiled: May 24, 2005Date of Patent: October 16, 2012Assignee: Cognex Technology and Investment CorporationInventor: William M. Silver
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Patent number: 8270748Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 24, 2004Date of Patent: September 18, 2012Assignee: Cognex CorporationInventors: William M. Silver, Sanjay Nichani, Adam Wagman
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Patent number: 8265395Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 21, 2004Date of Patent: September 11, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Matt Hill, Nigel J. Foster, Willard Foster
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Patent number: 8254695Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: August 28, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry, Sanjay Nichani, Adam Wagman
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Patent number: 8249297Abstract: Disclosed are methods and apparatus for automatic visual detection of events, for recording images of those events and retrieving them for display and human or automated analysis, and for sending synchronized signals to external equipment when events are detected. An event corresponds to a specific condition, among some time-varying conditions within the field of view of an imaging device, that can be detected by visual means based on capturing and analyzing digital images of a two-dimensional field of view in which the event may occur. Events may correspond to rare, short duration mechanical failures for which obtaining images for analysis is desirable. Events are detected by considering evidence obtained from an analysis of multiple images of the field of view, during which time moving mechanical components can be seen from multiple viewing perspectives.Type: GrantFiled: May 26, 2005Date of Patent: August 21, 2012Assignee: Cognex Technology and Investment CorporationInventor: William M. Silver
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Patent number: 8249329Abstract: Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.Type: GrantFiled: May 24, 2005Date of Patent: August 21, 2012Assignee: Cognex Technology and Investment CorporationInventor: William M Silver
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Patent number: 8249296Abstract: Disclosed are methods and apparatus for automatic visual detection of events, for recording images of those events and retrieving them for display and human or automated analysis, and for sending synchronized signals to external equipment when events are detected. An event corresponds to a specific condition, among some time-varying conditions within the field of view of an imaging device, that can be detected by visual means based on capturing and analyzing digital images of a two-dimensional field of view in which the event may occur. Events may correspond to rare, short duration mechanical failures for which obtaining images for analysis is desirable. Events are detected by considering evidence obtained from an analysis of multiple images of the field of view, during which time moving mechanical components can be seen from multiple viewing perspectives.Type: GrantFiled: May 26, 2005Date of Patent: August 21, 2012Assignee: Cognex Technology and Investment CorporationInventors: William M. Silver, Brian S. Phillips
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Patent number: 8249362Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurali of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.Type: GrantFiled: December 31, 2004Date of Patent: August 21, 2012Assignee: Cognex CorporationInventors: William M. Silver, E. John McGarry
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Patent number: 8243986Abstract: Disclosed are methods and apparatus for automatic visual detection of events, for recording images of those events and retrieving them for display and human or automated analysis, and for sending synchronized signals to external equipment when events are detected. An event corresponds to a specific condition, among some time-varying conditions within the field of view of an imaging device, that can be detected by visual means based on capturing and analyzing digital images of a two-dimensional field of view in which the event may occur. Events may correspond to rare, short duration mechanical failures for which obtaining images for analysis is desirable. Events are detected by considering evidence obtained from an analysis of multiple images of the field of view, during which time moving mechanical components can be seen from multiple viewing perspectives.Type: GrantFiled: May 26, 2005Date of Patent: August 14, 2012Assignee: Cognex Technology and Investment CorporationInventors: William M. Silver, Brian S. Phillips