Patents by Inventor William Todd Dyer

William Todd Dyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEM AND METHOD FOR GENERATING A YIELD MODEL FOR AN INTEGRATED CIRCUIT FABRICATION PROCESS AND METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT USING THE YIELD MODEL
    Publication number: 20070270994
    Abstract: A system for, and method of, generating a yield model pertaining to an integrated circuit (IC) fabrication process and a method of manufacturing an IC using the yield model. In one embodiment, the method of generating includes: (1) selecting X-variables as candidates for incorporation into the yield model, (2) sorting the candidates into an order based on a ranking criterion and (3) introducing the candidates in the order into a stepwise forward regression model until a marginal significance associated with a candidate to be introduced into the model falls below a threshold.
    Type: Application
    Filed: May 19, 2006
    Publication date: November 22, 2007
    Applicant: Texas Instruments, Incorporated
    Inventors: Joel Lynn Dobson, William Todd Dyer