Patents by Inventor Wingra T. Fang

Wingra T. Fang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7564894
    Abstract: A transceiver that includes a receiver configured to receive a data signal, a controller, a first memory that includes a first table associated with a first set of gain values and a second table associated with a second set of gain values, and a second memory accessible by an external host is provided. The controller is configured to access a first value associated with a strength of the data signal from the receiver, access a second value associated with the first value from the first table, generate a third value using the second value, and store the third value in the second memory.
    Type: Grant
    Filed: June 28, 2007
    Date of Patent: July 21, 2009
    Assignee: Avago Technologies Fiber IP (Singapore) Pte. Ltd.
    Inventors: Kevin Reid Woolf, Angeline Young Rodriguez, Wei-Yung Chen, Wingra T. Fang
  • Patent number: 7463674
    Abstract: A transceiver that includes a receiver configured to receive a data signal, a controller, a first memory that includes a first table associated with a first set of gain values and a second table associated with a second set of gain values, and a second memory accessible by an external host is provided. The controller is configured to access a first value associated with a strength of the data signal from the receiver, access a second value associated with the first value from the first table, generate a third value using the second value, and store the third value in the second memory.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: December 9, 2008
    Assignee: Avago Technologies Fiber IP (Singapore) Pte. Ltd.
    Inventors: Kevin Reid Woolf, Angeline Young Rodriguez, Wei-Yung Chen, Wingra T. Fang
  • Patent number: 7426348
    Abstract: An optical transceiver connectable to a test apparatus. The optical transceiver includes a least one test apparatus interface configured to receive from the test apparatus an input causing at least a first transceiver operating parameter to have a level substantially equal to a known value, at least one sensor configured to measure a level of at least one transceiver operating parameter including the level of the first transceiver operating parameter, a data interface configured to provide a value representative of the level of the first transceiver operating parameter, and a controller. The controller is configured to receive and convert the representative value to an actual value using a defined function having a plurality of predetermined coefficients and to provide the actual value to the test apparatus via the data interface.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: September 16, 2008
    Assignee: Avago Technologies Fiber IP Pte Ltd
    Inventors: Peter H. Mahowald, Wingra T. Fang
  • Publication number: 20040202476
    Abstract: A transceiver that includes a receiver configured to receive a data signal, a controller, a first memory that includes a first table associated with a first set of gain values and a second table associated with a second set of gain values, and a second memory accessible by an external host is provided. The controller is configured to access a first value associated with a strength of the data signal from the receiver, access a second value associated with the first value from the first table, generate a third value using the second value, and store the third value in the second memory.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 14, 2004
    Inventors: Kevin Reid Woolf, Angeline Young Rodriguez, Wei-Yung Chen, Wingra T. Fang
  • Publication number: 20040136722
    Abstract: An optical transceiver connectable to a test apparatus. The optical transceiver includes a least one test apparatus interface configured to receive from the test apparatus an input causing at least a first transceiver operating parameter to have a level substantially equal to a known value, at least one sensor configured to measure a level of at least one transceiver operating parameter including the level of the first transceiver operating parameter, a data interface configured to provide a value representative of the level of the first transceiver operating parameter, and a controller. The controller is configured to receive and convert the representative value to an actual value using a defined function having a plurality of predetermined coefficients and to provide the actual value to the test apparatus via the data interface.
    Type: Application
    Filed: January 15, 2003
    Publication date: July 15, 2004
    Inventors: Peter H. Mahowald, Wingra T. Fang
  • Patent number: 6165914
    Abstract: The rapid growth of thick thermally grown oxide layers on silicon wafers is described herein. By patterning and etching a plurality of pillars on the surface of the silicon wafer, oxide growth is primarily lateral and not vertical, enabling it to proceed much faster. In other embodiments, the pillars are fabricated with an oxygen barrier on their top surface, preventing oxide growth on the top of the pillars and resulting in an oxide layer with a more planar upper surface.
    Type: Grant
    Filed: November 12, 1997
    Date of Patent: December 26, 2000
    Assignee: Agilent Technologies
    Inventor: Wingra T. Fang