Abstract: A probe (1) for electron microscopy is cut from a solid material. A sample surface (3) is configured on the same, which is treated with an ion beam (J) at a predetermined angle of incidence such that the material is ablated from the sample surface (3) by means of etching until the desired observation surface (20) is exposed on the sample (1) in the region of the incidence zone (4) of the ion beam (J), which enables the viewing (12) of the desired region of the sample (1) using an electron microscope. For this purpose, at least two stationary ion beams (J1, J2) are guided onto the sample surface (3) at a predetermined angle (?) in alignment with each other such that the ion beams (J1, J2) at least come in contact with each other on the sample surface (3), or cross each other, and form an incidence zone (4) in that location, and that both the sample (1) and the ion beams (J1, J2) are not moved, and thus are operated in a stationary manner.

Abstract: A probe (1) for electron microscopy is cut from a solid material. A sample surface (3) is configured on the same, which is treated with an ion beam (J) at a predetermined angle of incidence such that the material is ablated from the sample surface (3) by means of etching until the desired observation surface (20) is exposed on the sample (1) in the region of the incidence zone (4) of the ion beam (J), which enables the viewing (12) of the desired region of the sample (1) using an electron microscope.

Abstract: TEM FIB samples of a solid state material are subsequently thinned through a subsequent treatment step free of contamination and free of destruction to extremely thin thicknesses through the alternate-sided bombardment of the sample surfaces with an ion beam, with which high-resolution observation and analysis of the sample material with a TEM becomes possible.

Abstract: TEM samples are cut from a solid state material with length (l) and width (b) and with a front-side sample surface (7) onto which a curable adhesive of the flowable type is applied for fixing a fiber (2) with a diameter (d) aligned on the sample surface (7) in the longitudinal direction of the sample substantially centrally with respect to the width (b), with the adhesive (3) applied substantially over the entire area on the sample surface (7) and the fiber (2) aligning itself upon being placed onto the adhesive (3) and being wetted essentially along its entire length with the adhesive and the latter subsequently being cured. A simple and economical preparation of TEM samples with high quality is thereby made possible.

Abstract: TEM FIB samples of a solid state material are subsequently thinned through a subsequent treatment step free of contamination and free of destruction to extremely thin thicknesses through the alternate-sided bombardment of the sample surfaces with an ion beam, with which high-resolution observation and analysis of the sample material with a TEM becomes possible.

Abstract: The invention relates to a ion beam preparation device for electron microscopy which is capable of observing the preparation process with the aid of a scanning electron microscope (3) and hence deliberately operate on the sample (4). The device is fitted with a multi-axis sample bench, at least on ion source (1, 2), a scanning electron microscope (3) with electron detectors (7, 9, 8) to image secondary electrons (SE), back-scatter electrons (RE) and transmitted electrons (TE), an electron source as a discharger for isolating samples and a light microscope (5). The ability to observe the etching process in situ permits precise monitoring of the etching stage, e.g. the degree of thickness reduction of the sample, at high resolution and, with the aid of a control device (19), it is possible automatically to terminate the thinning process to precise instructions.

Abstract: A discharging device is provided at the bottom of a glass melting furnace. The device includes an inductively heated outlet unit including a compression flange having an inlet opening and an outlet pipe extending from the compression flange to form therewith a unit having a T-shaped cross section. The outlet pipe is penetrated by an outlet channel communicating with the inlet opening. The outlet pipe projects downwardly out of an opening in the furnace. An outlet block is seated on the compression flange and has an outlet channel flush with the inlet opening of the compression flange. An annular supporting flange supports the outlet unit from the bottom against the compression flange, with the annular supporting flange being supported by a bottom carrier plate of the furnace and the outlet pipe of the outlet unit projecting through an opening in the annular supporting flange.

Abstract: A bottom outlet device is provided for a glass melting furnace, with heating of a glass melt being effected to within the temperature range of the electrical conductivity of the melt by way of electrodes disposed in the interior of the furnace and projecting into the melt. An inductively heatable and metallic outlet unit projects from the bottom of the furnace and includes an outlet opening and an interior outlet channel communicating with the outlet opening. An outlet block comprised of ceramic bricks is disposed above the outlet unit and includes a throughgoing channel which opens toward the interior of the furnace and which is flush with the interior outlet channel of the outlet unit. A bottom electrode comprised of metal is disposed at a lowermost portion of the interior of the furnace. The bottom electrode is penetrated by a further channel which is flush with the throughgoing channel in the outlet block and is thereby in communication with the outlet opening of the outlet unit.