Abstract: The present invention relates to a minute measuring instrument for high speed and large area and a method thereof, and more particularly, to a minute measuring instrument for high speed and large area which measures properties of a specimen in high speed by a focused-beam ellipsometric part and then minutely remeasures the position showing a singular point by a minute measuring part and a method thereof.

Abstract: An organic light emitting display and a driving method thereof, capable of increasing manufacturing yield by widening a range of gamma correction. An exemplary organic light emitting display includes a display region with pixels at crossings of data and scan lines; a gamma correction unit; a gamma correction circuit; a data driver; and a scan driver. The gamma correction unit includes first and second register units for storing first and second gamma correction signals, the second gamma correction signal comprising a corrected first gamma correction signal; a booster unit for correcting the second gamma correction signal to generate a third gamma correction signal; and a multiplexer for selecting the second gamma correction signal or the third gamma correction signal outputted from the booster unit, and for transferring it to the gamma correction circuit.

Abstract: Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film. The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer, in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer so as to generate SPR according to an angle change of the polarized light; and a flow unit which supplies a buffer solution containing a bio material binding to or dissociation from the metal thin film generating surface plasmon, wherein the SPR and the ellipsometric phase change by change in an angle and a wavelength are simultaneously detected.

Abstract: Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer; and a multi-channel flow unit which supplies a buffer solution containing a bio material binding to or dissociation from a metal thin film generating surface plasmon.

Abstract: The present invention relates to a single-polarizer focused-beam ellipsometer. An ellipsometer according to the present invention includes a light source (210); a beam splitting part (220) for splitting a light generated in the light source (210) into a polarized light; an objective lens (230) for concentrately irradiating some of light split by the beam splitting part (220) onto a specimen (240); a photodetector (250) for detecting the light passed through the objective lens 230 and the beam splitting part (220) after reflected from the specimen (240) with unit cells; and a central processing unit (260) for correcting the intensity of the light detected by the photodetector (250) into a value corresponding to the unit cell of the photodetector (250) along multiple incidence plane passage of 360° with respect to respective incidence angles and processing the corrected value.

Abstract: The present invention relates to an ellipsometer, and more particularly, to an ellipsometer to find out the optical properties of the sample by analyzing the variation of the polarization of a light which has specific polarisation then reflected on a surface of the sample.

Abstract: Provided is a measurement method of Fourier coefficients using an integrating photometric detector, wherein, when measuring an exposure (Sj) with a predetermined time interval during a predetermined time period using an integrating photometric detector with respect to light of which amplitude varies with the time period, normalized Fourier coefficients (??2n, ??2n) for a waveform of an intensity of the light is determined by carrying out a discrete Fourier transform with respect to an equation for the measured exposure (Sj).

Abstract: The present invention relates to a minute measuring instrument for high speed and large area and a method thereof, and more particularly, to a minute measuring instrument for high speed and large area which measures properties of a specimen in high speed by a focused-beam ellipsometric part and then minutely remeasures the position showing a singular point by a minute measuring part and a method thereof.

Abstract: The present invention relates to a single-polarizer focused-beam ellipsometer. An ellipsometer according to the present invention includes a light source (210); a beam splitting part (220) for splitting a light generated in the light source (210) into a polarized light; an objective lens (230) for concentrately irradiating some of light split by the beam splitting part (220) onto a specimen (240); a photodetector (250) for detecting the light passed through the objective lens 230 and the beam splitting part (220) after reflected from the specimen (240) with unit cells; and a central processing unit (260) for correcting the intensity of the light detected by the photodetector (250) into a value corresponding to the unit cell of the photodetector (250) along multiple incidence plane passage of 360° with respect to respective incidence angles and processing the corrected value.

Abstract: An organic light emitting diode (OLED) display has an increased mechanical strength by improving the shape of a bezel combined to a panel assembly. The OLED display includes a panel assembly having a display area and a pad area, and a bezel accommodating the panel assembly. The bezel includes a bottom part on which the panel assembly is mounted, a side wall provided on a side of the bezel, and a hemming flange provided at another side of the bezel on which the side wall is not provided. The panel assembly is mounted in a manner that the pad area is turned towards the another side.

Abstract: The present invention relates to an ellipsometer, and more particularly, to an ellipsometer to find out the optical properties of the sample by analyzing the variation of the polarization of a light which has specific polarisation then reflected on a surface of the sample.

Abstract: An organic light emitting display and a driving method thereof, capable of increasing manufacturing yield by widening a range of gamma correction. An exemplary organic light emitting display includes a display region with pixels at crossings of data and scan lines; a gamma correction unit; a gamma correction circuit; a data driver; and a scan driver. The gamma correction unit includes first and second register units for storing first and second gamma correction signals, the second gamma correction signal comprising a corrected first gamma correction signal; a booster unit for correcting the second gamma correction signal to generate a third gamma correction signal; and a multiplexer for selecting the second gamma correction signal or the third gamma correction signal outputted from the booster unit, and for transferring it to the gamma correction circuit.

Abstract: An organic light emitting diode display module having packaging which protects one or more integrated circuits is disclosed. The packaging has first and second frames which enclose the display and connect to one another. The frames cover and protect the periphery of the light emitting device and the integrated circuits for the light emitting device.

Abstract: An organic light emitting diode (OLED) display has an increased mechanical strength by improving the shape of a bezel combined to a panel assembly. The OLED display includes a panel assembly having a display area and a pad area, and a bezel accommodating the panel assembly. The bezel includes a bottom part on which the panel assembly is mounted, a side wall provided on a side of the bezel, and a hemming flange provided at another side of the bezel on which the side wall is not provided. The panel assembly is mounted in a manner that the pad area is turned towards the another side.

Abstract: Disclosed is a liquid crystal display device including a liquid crystal panel having a shift register therein and an interface circuit for adjusting DC and AC levels, for compensating for a loss caused by elements and a resister of the shift register. A driving circuit of the liquid crystal display device includes a clock generation unit outputting a first clock signal as a gate clock signal, a second clock signal as an inverse signal of the first clock signal, and a start pulse, and a DC and AC level amplification unit for amplifying the first and second clock signals and the start pulse after adjusting DC and AC levels of the first and second clock signals and the start pulse, and outputting the first and second clock signals and the start pulse to the shift register.

Abstract: An ellipsometry system and method using spectral imaging are provided. The ellipsometry system includes a light source group for projecting a white light collimated to a multi-point region defined on the surface of a sample, a light analysis group for polarizing a reflected white light to analyze it, and a spectral imaging group for dispersing and imaging the polarized white light. The white light collimated to the multi-point region is input to the spectral imaging group and dispersed by a light dispersing means by wavelengths such that the dispersed lights are imaged on one axis of an imaging plane by the points forming the multi-point region and imaged on the other axis of the imaging plane by wavelengths, to obtain optical data having information about the physical property of the points and wavelengths. Accordingly, a large amount of data can be obtained by wavelengths and points to improve rapidity and reliability of measurement.

Abstract: Disclosed is a liquid crystal display device including a liquid crystal panel having a shift register therein and an interface circuit for adjusting DC and AC levels, for compensating for a loss caused by elements and a resister of the shift register. A driving circuit of the liquid crystal display device includes a clock generation unit outputting a first clock signal as a gate clock signal, a second clock signal as an inverse signal of the first clock signal, and a start pulse, and a DC and AC level amplification unit for amplifying the first and second clock signals and the start pulse after adjusting DC and AC levels of the first and second clock signals and the start pulse, and outputting the first and second clock signals and the start pulse to the shift register.