Patents by Inventor Xiawa Wu

Xiawa Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11724315
    Abstract: A system and method of additive manufacturing is disclosed herein which when run or performed form a product with a powder-based additive manufacturing device by adding sequential layers of material on top of one another. As each sequential layer of material is added, the system and method can include monitoring the sequential layer with a defect analysis subsystem to detect whether the sequential layer has any defects. For a detected defect, it can be determined whether defect correction is required. For a required defect correction, one or more correction parameters for the required defect correction can be identified; and a correction command including the one or more correction parameters can be sent to the additive manufacturing device, the correction command causing the additive manufacturing device to help correct the detected defect in the sequential layer according to the correction parameters prior to moving on to a next sequential layer.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: August 15, 2023
    Assignee: Sentient Science Corporation
    Inventors: Jingfu Liu, Behrooz Jalalahmadi, Ziye Liu, Andrew Vechart, Xiawa Wu
  • Publication number: 20220062997
    Abstract: A system and method of additive manufacturing is disclosed herein which when run or performed form a product with a powder-based additive manufacturing device by adding sequential layers of material on top of one another. As each sequential layer of material is added, the system and method can include monitoring the sequential layer with a defect analysis subsystem to detect whether the sequential layer has any defects. For a detected defect, it can be determined whether defect correction is required. For a required defect correction, one or more correction parameters for the required defect correction can be identified; and a correction command including the one or more correction parameters can be sent to the additive manufacturing device, the correction command causing the additive manufacturing device to help correct the detected defect in the sequential layer according to the correction parameters prior to moving on to a next sequential layer.
    Type: Application
    Filed: September 2, 2020
    Publication date: March 3, 2022
    Inventors: Jingfu Liu, Behrooz Jalalahmadi, Ziye Liu, Andrew Vechart, Xiawa Wu