Abstract: A DIMM slot test system without series connection of test board through JTAG and a method thereof are disclosed. A DIMM connector interface of a test board is inserted to a DIMM slot of a circuit board under test, a CPU generates test data or a test signal based on a test signal with JTAG signal format, the CPU transmits test data to a specified CPLD chip through differential pins or IO pins, the specified CPLD chip records the received data as a test result; the CPU transmits the generated test signal to the specified CPLD chip, which then tests power pins or ground pins, reads and records values of the power pins or the ground pins as the test result; the CPU generates and transmits a test result read signal to the specified CPLD chip through the control pins, obtains the test result through data transmission pins.

Abstract: A processing system for monitoring the power-on self-test information is used for monitoring an operating state of a complex programmable logic device (CPLD) of a main board. The processing system includes a basic input/output system (BIOS) device, a CPLD and a monitoring device. The BIOS device sends power-on self-test information at a first frequency. The CPLD is electrically connected to the BIOS device. The CPLD further includes a first in first out (FIFO) register, and the FIFO register is used for storing the received power-on self-test information. The CPLD sends the power-on self-test information stored in the FIFO register at a second frequency. The monitoring device is electrically connected to the CPLD. The monitoring device is used for receiving the power-on self-test information sent from the CPLD.

Abstract: An automatic inspection system and method for a notebook computer keyboard interface are described. The method includes the following steps including scanning a notebook computer keyboard array to obtain a keyboard position corresponding table; running a testing software in the notebook computer to obtain a position value of a key under test from the keyboard position corresponding table; receiving a testing command from the testing software by an USB interface; constituting a virtual keyboard matrix with at least one matrix switching chip, for controlling the close action of a corresponding key position in the virtual keyboard matrix according to the testing command; transferring the actual key position value corresponding to the output close action to the notebook computer according to the configuration of the notebook computer keyboard interface; and receiving and comparing the actual key position value with the position value of the key under test.

Abstract: An accessory-testing device for an information processing apparatus includes a micro-processing unit (MPU) and a signal conversion unit. The MPU sends a mimic signal. The signal conversion unit is electrically connected to the MPU and an accessory respectively, for receiving the mimic signal and converting the mimic signal into a test signal to test the accessory. The accessory receives the test signal and then responds to the test signal to output a feedback signal. The feedback signal is received by the signal conversion unit and transmitted to the MPU, such that the MPU determines if the accessory operates normally according to the feedback signal. Conventional testing methods are Therefore, it is achieved that the effects of reducing the inspection time and improving the production efficiency.

Abstract: A system and method for parallel burning using multiplex technology is used for burning chips of different bus types on the same transmission bus at the same time in parallel. A main control unit divides bandwidth of the transmission bus into different frequency bands, sends a control command including a command for sending data carrying bus signals of designated types, and controls data carrying the bus signals of the designated types to be transmitted in designated frequency bands of the transmission bus. Then, a sending unit sends the data carrying the bus signals of the designated types in the designated frequency band. Finally, receiving units receive the data transmitted in the designated frequency bands, and then output them to a plurality of burners such as to burn the data onto the chips of the designated bus types in parallel.