Abstract: A detection circuit is provided herein, which includes a first transistor, a second transistor, a third transistor, a light sensor, a capacitor, and a fourth transistor. The first transistor has a control terminal, a first terminal, and a second terminal. The second transistor is coupled to the control terminal. The third transistor is coupled to the control terminal and the second terminal. The light sensor is coupled to the control terminal. The capacitor is coupled to the control terminal. The fourth transistor is coupled to the second terminal.

Abstract: A flash memory and an erase method thereof are provided. The flash memory includes at least a memory array and a memory control circuit. The memory control circuit biases plural word lines, a common source line and a global bit line included in the memory array to erase plural memory cells in the flash memory. The method comprises grouping the plural word lines into plural word line groups according to erase depths corresponding to each word line; generating an erase voltage and plural multiple-step word line erase voltages; applying the erase voltage from at least one of the common source line and the global bit line; and during a period when the erase voltage is applied, the plural multiple-step word line erase voltages is respectively applied to the plural word line groups, wherein the plural multiple-step word line erase voltages is one-by-one corresponding to the plural word line groups.

Abstract: A memory controller receives a command to program information to a memory storage array controlled by the memory controller. The memory controller determines a target memory state to store the information, and a target threshold voltage level corresponding to the target memory state. Based at least on the target memory state, the memory controller determines one or more program pulses for a pre-program cycle, including voltage levels for the one or more program pulses based at least on the target threshold voltage level. The memory controller selects a memory location in the memory storage array to program the information, and pre-programs the selected memory location by applying the one or more program pulses at respective voltage levels, the one or more program pulses applied without program verify operations. Following the pre-programming, the memory controller programs the information to the selected memory location.

Abstract: A method for programming a memory device and a memory system are provided, wherein the method for programming the memory device includes steps below. First, a program command is proposed. Second, a width of a pulse about to provide to strings of memory cells of the memory device is determined according to a temperature data of the memory device. Then, the pulse is provided to the strings of memory cells to start doing a program operation. The width of the pulse becomes narrower as a temperature of the memory device is raised.

Abstract: A memory device and a reading method thereof are provided. During a second reading period, a second bit line voltage is provided to a bit line having a read finished memory cell. Thus, a voltage difference between a bit line voltage and a pass voltage of memory cells on unselected word lines is reduced. A data value stored in the memory cells on a selected word line is determined according to whether the memory cells on the selected word line enter a preset state during a first reading period and the second reading period.

Abstract: A memory device and a write method thereof are provided. A control circuit performs a first write operation and a first write verification operation on a plurality of memory cells of a non-volatile memory, and after the plurality of memory cells pass the first write verification operation, the control circuit performs a second write verification operation on target memory cells corresponding to at least one target threshold voltage in the plurality of memory cells, and when a failure bit count of the target memory cells is not less than a preset number of bits, the control circuit performs a second write operation and a third write verification operation on the plurality of memory cells.

Abstract: A flash memory and an operation method thereof are provided. The flash memory includes a plurality of memory cell strings and a pass voltage generator. Each of the memory cell strings includes a plurality of memory cells. The pass voltage generator is configured to provide a pass voltage to a plurality of word lines of a plurality of unselected memory cells of a selected memory string. During a reading operation, the pass voltage generator raises the pass voltage from a first voltage at a first time point, and raises the pass voltage to a second voltage at a second time point. The second voltage is lower than a target voltage times a preset ratio The first time point is earlier than a start time point of a bit line voltage received by the selected memory cell, and the second time point occurs at the start time point of the bit line voltage.

Abstract: A memory device and a program verification method thereof are provided. The write verification method includes: reading a previous page to obtain first read data, writing input data to a current page, reading the previous page or the current page to obtain second read data, and analyzing at least one of the first read data and the second read data to determine whether to back up at least one of the first read data and the input data to a redundant block of the memory device.

Abstract: Methods, systems and apparatus for effectively erasing blocks with few programmed pages are provided. In one aspect, a system includes a memory and a controller coupled to the memory. The memory includes blocks each having pages. The controller is configured to determine whether a threshold page with a particular page number in a block of the memory is programmed, to erase the block according to a normal erase action in response to determining that the threshold page is programmed, and to erase the block according to a particular erasing action that is configured to erase the block deeper than the normal erase action in response to determining that the threshold page is not programmed. The particular erasing action can include pre-programming the block before erasing the block, decreasing an erase verify voltage before erasing the block, or adding one or more erasing pulses with a new erasing voltage.

Abstract: Provided is an operation method for a memory device. The memory device includes a memory array having a plurality of word lines and a plurality of bit lines. The operation method for the memory device includes: applying a program voltage to at least one selected word line of the word lines; and during a high level of the program voltage, based on respective locations of a plurality of selected bit line, which are to be written into data 0, on the word lines, applying different plurality of bit line voltages to the selected bit line which are to be written into data 0.

Abstract: Provided is an operation method for a memory device. The memory device includes a memory array having a plurality of word lines and a plurality of bit lines. The operation method for the memory device includes: applying a program voltage to at least one selected word line of the word lines; and during a high level of the program voltage, based on respective locations of a plurality of selected bit line, which are to be written into data 0, on the word lines, applying different plurality of bit line voltages to the selected bit line which are to be written into data 0.

Abstract: A non-volatile memory and a program method thereof are provided. The program method of the non-volatile memory includes: setting a first incremental value, and providing a plurality of first pulses of incrementally increasing voltages in sequence according to the first incremental value for performing a programming operation on a plurality of non-volatile memory cells during a first time period; and setting a second incremental value, and providing a plurality of second pulses of incrementally increasing voltages in sequence according to the second incremental value for performing a programming operation on the non-volatile memory cells during a second time period which is after the first time period, wherein the first incremental value is smaller than the second incremental value.

Abstract: A memory device and a programming method thereof are provided, and the programming method of the memory device includes following steps. A memory cell grouping procedure is performed to divide a plurality of memory cells into a plurality of groups. After the memory cell grouping procedure is performed, a programming procedure is performed, and the programming procedure includes following steps. A first programming pulse, a second programming pulse and a verification pulse are provided to a word line. A first group is programmed by the first programming pulse, and a second group is programmed by the second programming pulse. Whether the first group and the second group respectively pass a verification operation is determined by the verification pulse.

Abstract: A memory device and a programming method thereof are provided, and the programming method of the memory device includes following steps. A memory cell grouping procedure is performed to divide a plurality of memory cells into a plurality of groups. After the memory cell grouping procedure is performed, a programming procedure is performed, and the programming procedure includes following steps. A first programming pulse, a second programming pulse and a verification pulse are provided to a word line. A first group is programmed by the first programming pulse, and a second group is programmed by the second programming pulse. Whether the first group and the second group respectively pass a verification operation is determined by the verification pulse.

Abstract: A non-volatile memory and a programming method thereof are provided. The programming method for the non-volatile memory includes: setting at least one first isolation cell between a first side cell and at least one first pass cell of an inhibited memory string; cutting off the at least one first isolation cell and providing a pre-boosting voltage to a word line of the first side cell and at a first time point; turning on the at least one first isolation cell at a second time point for transporting the pre-boosting potential to channels of the at least one first pass cell and a primary cell at a second time period; and providing a boosting voltage to word lines of the at least one first pass cell during a boosting time period.

Abstract: A memory device including multiple word lines, multiple bit lines and a memory cell array is provided. The word lines intersect the bit lines, and an included angle between the word lines and the bit lines is not a right angle. The memory cell array includes multiple memory cells respectively disposed at the intersections of the word lines and the bit lines. Each row of the memory cells is electrically connected to one of the word lines, and each column of the memory cells is electrically connected to one of the bit lines.

Abstract: First threshold voltages of one or more memory cells in a memory array are obtained. For each memory cell in the one or more memory cells, a target threshold voltage for the memory cell is identified. A number of programming shots to reach the target threshold voltage of the memory cell is determined based on the first threshold voltage of the memory cell. Respective number of programming shots, which are determined for the one or more memory cells, are applied to the one or more memory cells. Whether respective target threshold voltages for the one or more memory cells are reached is verified upon applying the respective number of programming shots to the one or more memory cells.

Abstract: A memory device and a method for operating the same are provided. The memory device includes a substrate, a plurality of word lines, and a plurality of dummy word lines. The word lines and the dummy word lines are located on the substrate. At least one side of each dummy word line is adjacent to the word line. At least one word line and at least one dummy word line form a group. The method for operating the memory device includes the following. At least one group is selected, and the group is operated. A first operational voltage is applied to the word line of the group. A second operational voltage is applied to the dummy word line of the group.

Abstract: Methods and apparatuses are contemplated herein for enhancing the read performance and data retention of nonvolatile memory devices. In an example embodiment, a method is provided for controlling a nonvolatile memory device that includes a matrix of memory cells, wherein each memory cell in the matrix includes a programmable floating gate. The method includes programming a floating gate of a first memory cell of the nonvolatile memory device, and shifting a voltage of the floating gate of the first memory cell of the nonvolatile memory device by creating a coupling effect that impacts the floating gate of the first memory cell. In this regard, the method may include programming one or more nearby memory cells, in which case the coupling effect may comprise a floating gate coupling effect between the first memory cell and the one or more nearby memory cells.

Abstract: Provided are methods, devices, and/or the like for reducing the bit line interference when programming non-volatile memory. One method comprises providing a non-volatile memory device comprising a set of cells, each cell associated with a bit line; shooting a programming voltage across each cell; detecting a threshold voltage for each cell; identifying a fast subset of the set of cells and a slow subset of the set of cells based at least in part on the detected threshold voltage for each cell; and shooting the programming voltage until the threshold voltage for each cell is greater than a verify voltage. For each shot a fast bit line bias is applied to the bit line associated each cell of the fast subset and a slow bit line bias is applied to the bit line associated with each cell of the slow subset.