Patents by Inventor Yanliang Tan

Yanliang Tan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160139281
    Abstract: A method for increasing a detection sensitivity of a radon monitor based on an electrostatic collection method and a device thereof increase the detection sensitivity of the radon monitor based on the electrostatic collection method through increasing a collection efficiency of positively charged 218Po in an internal cell of the radon monitor based on the electrostatic collection method. A metal mesh is provided between a wall of the internal cell and a semiconductor detector to increase an electric field intensity close to the wall of the internal cell. A ground wire of a high-voltage module is connected to a surface of the semiconductor detector. High-voltage outputting wires of the high-voltage module are respectively connected to the wall of the internal cell and the metal mesh, in such a manner that high voltages are respectively outputted between the wall of the internal cell and the metal mesh and between the metal mesh and the surface of the semiconductor detector.
    Type: Application
    Filed: January 27, 2015
    Publication date: May 19, 2016
    Inventors: Yanliang Tan, Hongzhi Yuan
  • Patent number: 9329279
    Abstract: A method and device for measuring radon by the electrostatic collection method without the influence of the environmental temperature and humidity is by reducing the pressure that in a electrostatic collection and measuring chamber to below a certain threshold value, in the operating temperature range of 0-45 degrees, and the air relative humidity of the external environment changing in 0%-400%, the collection efficiency of the collection and measuring chamber of the static electricity that collects positively charged 218Po particle to the surface of a semiconductor detector is basically unchanged, so when the temperature and humidity of the external environment change, the detection efficiency does not change; the threshold value relates to the geometric factor and the distribution of the electric field intensity that in different measuring chamber. The device comprises a measuring chamber, a semiconductor detector, a high-voltage module, a sampling pump, a vacuum gauge, and a regulating valve.
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: May 3, 2016
    Assignee: Hengyang Normal University
    Inventors: Yanliang Tan, Hongzhi Yuan
  • Publication number: 20150102228
    Abstract: A method and device for measuring radon by an electrostatic collection method without an influence of an environmental temperature and humidity is by reducing a pressure that in an electrostatic collection and measuring chamber to below a certain threshold value, in an operation temperature range of 0-45 degrees, and an air relative humidity of an external environment changing in 0%-100%, a collection efficiency of the collection and measuring chamber of the static electricity that collects positively charged 218Po particle to a surface of a semiconductor detector is basically unchanged, so when a temperature and a humidity of the external environment change, a detection efficiency does not change; the threshold value relates to a geometric factor and a distribution of an electric field intensity that in different measuring chamber. The device comprises a measuring chamber, a semiconductor detector, a high-voltage module, a sampling pump, a vacuum gauge, and a regulating valve.
    Type: Application
    Filed: May 13, 2013
    Publication date: April 16, 2015
    Inventors: Yanliang Tan, Hongzhi Yuan