Abstract: A server Joint Test Action Group (JTAG) component adaptive interconnection system and method. The system includes a JTAG master device, a programmable device, and a plurality of JTAG components. The programmable device is configured to simulate JTAG timing according to a JTAG protocol and test JTAG channels of the JTAG components connected to the programmable device one by one. The programmable device connects in series a Test Data Output (TDO) signal of a previous JTAG component with a Test Data Input (TDI) signal of a next JTAG component in the programmable device, connects a TDI signal of a first JTAG component with a TDI signal of the JTAG master device, and connects a TDO signal of a last JTAG component with a TDO signal of the JTAG master device, so as to form a JTAG interconnection chain.

Abstract: Disclosed are a refrigerant leakage detection method and device, an air conditioner and a storage medium. The method includes: acquiring an exhaust temperature of an air conditioner at various moments during a preset time period, in response to the exhaust temperature of the air conditioner being greater than a preset exhaust temperature and a target operating exhaust parameter of the air conditioner exceeding a preset range of the exhaust parameter of refrigerant leakage; determining an extreme value of the exhaust temperature and an exhaust moment corresponding to the extreme value of the exhaust temperature of the air conditioner based on the exhaust temperature at various moments; acquiring an exhaust period of the air conditioner based on the exhaust moment; and determining whether there is the refrigerant leakage in the air conditioner based on the exhaust period.

Abstract: A server Joint Test Action Group (JTAG) component adaptive interconnection system and method. The system includes a JTAG master device, a programmable device, and a plurality of JTAG components. The programmable device is configured to simulate JTAG timing according to a JTAG protocol and test JTAG channels of the JTAG components connected to the programmable device one by one. The programmable device connects in series a Test Data Output (TDO) signal of a previous JTAG component with a Test Data Input (TDI) signal of a next JTAG component in the programmable device, connects a TDI signal of a first JTAG component with a TDI signal of the JTAG master device, and connects a TDO signal of a last JTAG component with a TDO signal of the JTAG master device, so as to form a JTAG interconnection chain.