Abstract: Various embodiments of the present disclosure are directed towards a method for forming a semiconductor structure, the method includes forming a buffer layer over a substrate. An active layer is formed on the buffer layer. A top electrode is formed on the active layer. An etch process is performed on the buffer layer and the substrate to define a plurality of pillar structures. The plurality of pillar structures include a first pillar structure laterally offset from a second pillar structure. At least portions of the first and second pillar structures are spaced laterally between sidewalls of the top electrode.

Abstract: An automatic system for processing and testing gears has a processing machine, a testing machine, and a robotic arm. The processing machine has a controller and a gear exchanging platform. The testing machine is connected to the processing machine via wired or wireless signals, and has a calculator and a testing platform. The calculator is connected to the controller via the wired or wireless signals, and the testing platform is electrically connected to the calculator. The robotic arm connects the processing machine and the testing machine, and has at least one claw that is able to move gears from the gear exchanging platform to the testing platform.

Abstract: A network device, a network connection detector and a detection method thereof are disclosed. The network device includes a socket, a waveform generator and a reflected wave detector. The waveform generator sends a first test wave to at least a first contact of a plurality of contacts of a socket and then the reflected wave detector detects a first reflected wave that is corresponding to the first test wave and is reflected from the first contact. Thus a first control signal is generated according to detection result of the first reflected wave.

Abstract: A network device, a network connection detector and a detection method thereof are disclosed. The network device comprises a socket, a waveform generator and a reflected wave detector. The waveform generator sends a first test wave to at least a first contact of a plurality of contacts of a socket and then the reflected wave detector detects a first reflected wave that is corresponding to the first test wave and is reflected from the first contact. Thus a first control signal is generated according to detection result of the first reflected wave.

Abstract: A network device, a network connection detector and a detection method thereof are disclosed. The network device comprises a socket, a waveform generator and a reflected wave detector. The waveform generator sends a first test wave to at least a first contact of a plurality of contacts of a socket and then the reflected wave detector detects a first reflected wave that is corresponding to the first test wave and is reflected from the first contact. Thus a first control signal is generated according to detection result of the first reflected wave.

Abstract: A network device, a network connection detector and a detection method thereof are disclosed. The network device comprises a socket, a waveform generator and a reflected wave detector. The waveform generator sends a first test wave to at least a first contact of a plurality of contacts of a socket and then the reflected wave detector detects a first reflected wave that is corresponding to the first test wave and is reflected from the first contact. Thus a first control signal is generated according to detection result of the first reflected wave.