Abstract: Various implementations described herein relate to systems and methods for programming data, including determining a target row corresponding to a program command and setting row-based programming parameters for the target row using target physical device parameters of the target row and optimized programming parameters corresponding to the physical device parameters.

Abstract: A semiconductor device of an embodiment includes a seed generator circuit configured to generate a seed from inputted data by using first random number sequence data generated by an XorShift circuit; and a random number generator circuit configured to receive the seed as input to generate second random number sequence data by a second XorShift circuit.

Abstract: A semiconductor device of an embodiment includes a seed generator circuit configured to generate a seed from inputted data by using first random number sequence data generated by an XorShift circuit; and a random number generator circuit configured to receive the seed as input to generate second random number sequence data by a second XorShift circuit.

Abstract: A method for dynamically estimating interference compensation thresholds of a page of memory includes computing a histogram and a corresponding threshold based on a plurality of interference states of an interference source; clustering the plurality of interference states to determine an effective number of interference states; and estimating a read threshold to dynamically compensate an interference noise associated with each interference state of the effective number of interference states of the target row based on the histogram.

Abstract: Systems, methods, non-transitory computer-readable media for dynamically estimating interference compensation thresholds for read operations in non-volatile memory devices, including determining a plurality of interference states with respect to an interference source of a target row of a non-volatile memory to be read, determining compensation shifts for the plurality of interference states by determining a compensation shift for each of two or more interference states of the plurality of interference states, and applying the compensation shifts for the plurality of interference states to reading the target row.

Abstract: A memory device includes control circuitry that executes a first programming operation and executes a second programming operation after the first programming operation. The first programming operation includes setting a threshold voltage of each of a second set of memory cells in a second section corresponding to write data, and setting a threshold voltage of each of the third set of memory cells in a third section. The second programming operation includes setting the threshold voltage of each of the second set of memory cells in a fifth section corresponding to the write data, and setting the threshold voltage of each of the third set of memory cells in a sixth section or a seventh section among a plurality of fourth sections in accordance with temperature information. The sixth section includes the same voltage range as the third section. The seventh section is higher in voltage than the third section.

Abstract: Various implementations described herein relate to systems and methods for detecting soft errors, including but not limited to, errors introduced after reading a codeword from a non-volatile memory, and before providing data to a host. Embodiments can include decoding the codeword from the non-volatile memory to obtain at least input data, and determining validity of the input data using a first signature after processing the input data through a data path. If it is determined that the input data is valid using the first signature, the input data is sent to a host.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller configured to execute a patrol process, in response to a first command set from a host device. In the patrol process, the memory controller is configured to read first data from the nonvolatile memory, and not to output the first data to the host device.

Abstract: A method, of decoding error correction code of a memory device with dynamic bit error estimation, can include generating at least one metric corresponding to one or more syndromes associated with a code word, the code word comprising an error correction code of a memory device, decoding the code word by a first decoder integrated with the memory device, in response to a determination that the metric satisfies a threshold associated with the syndromes, the first decoder having a first execution property, and decoding the code word by a second decoder integrated with the memory device, in response to a determination that the metric does not satisfy the threshold associated with the syndromes, the second decoder having a second execution property distinct from the first execution property, or in response to a determination that the metric satisfies the threshold associated with the syndromes, and in response to a determination to perform further decoding.

Abstract: Various implementations described herein relate to systems and methods for detecting soft errors, including but not limited to, errors introduced after reading a codeword from a non-volatile memory, and before providing data to a host. Embodiments can include decoding the codeword from the non-volatile memory to obtain at least input data, and determining validity of the input data using a first signature after processing the input data through a data path. If it is determined that the input data is valid using the first signature, the input data is sent to a host.

Abstract: A semiconductor device of an embodiment includes a seed generator circuit configured to generate a seed from inputted data by using first random number sequence data generated by an XorShift circuit; and a random number generator circuit configured to receive the seed as input to generate second random number sequence data by a second XorShift circuit.

Abstract: A method for dynamically estimating interference compensation thresholds of a page of memory includes computing a histogram and a corresponding threshold based on a plurality of interference states of an interference source; clustering the plurality of interference states to determine an effective number of interference states; and estimating a read threshold to dynamically compensate an interference noise associated with each interference state of the effective number of interference states of the target row based on the histogram.

Abstract: A method for dynamically estimating interference compensation thresholds of a page of memory includes performing a mock read on a target row using a mock read threshold, performing a read operation on an interference source and reading an interference state of the interference source, computing a histogram and a corresponding threshold based on the mock read threshold and the interference state of the interference source, and estimating a read threshold to dynamically compensate the interference state of the target row based on the histogram.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller configured to execute a patrol process, in response to a first command set from a host device. In the patrol process, the memory controller is configured to read first data from the nonvolatile memory, and not to output the first data to the host device.

Abstract: A semiconductor device of an embodiment includes a seed generator circuit configured to generate a seed from inputted data by using first random number sequence data generated by an XorShift circuit; and a random number generator circuit configured to receive the seed as input to generate second random number sequence data by a second XorShift circuit.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller configured to execute a patrol process, in response to a first command set from a host device. In the patrol process, the memory controller is configured to read first data from the nonvolatile memory, and not to output the first data to the host device.

Abstract: A nonvolatile memory includes a memory array, a sensor for measuring a temperature, an interface through which a write command is to be received, and a control circuit. The control circuit is configured to write information of the temperature measured by the sensor in a data storing area of the memory array in which user data associated with the write command is not capable of being written into, when writing the user data in the memory array in response to the received write command.

Abstract: Various implementations described herein relate to systems and methods for detecting soft errors, including but not limited to, reading a codeword from a non-volatile memory, decoding the codeword to obtain at least input data, determining validity of the input data using a first signature after processing the input data through a data path, and in response to determining that the input data is valid using the first signature, sending the input data to a host.

Abstract: Various implementations described herein relate to systems and methods for programming data, including determining a target row corresponding to a program command and setting row-based programming parameters for the target row using target physical device parameters of the target row and optimized programming parameters corresponding to the physical device parameters.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller configured to execute a patrol process, in response to a first command set from a host device. In the patrol process, the memory controller is configured to read first data from the nonvolatile memory, and not to output the first data to the host device.