Patents by Inventor Yasuhiro Oshiro

Yasuhiro Oshiro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Junction inspection method and apparatus for electronic parts
    Patent number: 5052816
    Abstract: A plurality of lead wires such as those from an IC (an integrated circuit) is irradiated by a fan beam at same time. Infrared rays radiated from the portion which is irradiated by the fan beam and the periphery of the portion are detected so as to catch a thermogram exhibiting the temperature distribution. The thermogram is processed by image processing so as to produce a temperature distribution image. This image is visually compared with a standard temperature distribution-pattern on a display apparatus to judge whether soldering on those lead wires is defective or not.
    Type: Grant
    Filed: August 29, 1989
    Date of Patent: October 1, 1991
    Assignee: Denyo Kabushiki Kaisha
    Inventors: Minoru Nakamura, Yasuhiro Oshiro