Patents by Inventor Yasuji Seko

Yasuji Seko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8170329
    Abstract: A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.
    Type: Grant
    Filed: March 5, 2009
    Date of Patent: May 1, 2012
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
  • Publication number: 20110063435
    Abstract: A position measuring target includes four or more reference points and a plurality of shading pattern portions. The four or more reference points are defined on a plane. The references points have positional relationships among them. The plurality of shading pattern portions corresponds a plurality of geometric curved surfaces in relation to the degree of shading used for defining the reference points.
    Type: Application
    Filed: March 30, 2010
    Publication date: March 17, 2011
    Applicant: FUJI XEROX CO., LTD.
    Inventor: YASUJI SEKO
  • Patent number: 7830605
    Abstract: A longitudinal interference fringe pattern projection lens with a lens body is provided. The lens body includes a lens first surface that has two convex portions or two concave portions that extend in parallel to each other in a constant direction and have the same shape, and a lens second surface. Laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.
    Type: Grant
    Filed: May 18, 2007
    Date of Patent: November 9, 2010
    Assignee: Fuji Xerox Co., Ltd.
    Inventor: Yasuji Seko
  • Publication number: 20100231709
    Abstract: A position measurement system includes a marker set attached to an object, a camera and a computing apparatus. The marker set includes three or more directed basic markers each having a shape indicating a direction. The directed basic markers are oriented in directions toward a specific point. A positional relationship among the directed basic markers is known. The camera includes a two-dimensional imaging device configured to take an image of the marker set. The computing apparatus computes at least one of a position of the object and an angle of the object based on an image, taken by the camera, of the directed basic markers, which are oriented in the directions toward the specific point.
    Type: Application
    Filed: August 21, 2009
    Publication date: September 16, 2010
    Applicant: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
  • Patent number: 7791736
    Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
    Type: Grant
    Filed: July 24, 2009
    Date of Patent: September 7, 2010
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
  • Patent number: 7742895
    Abstract: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.
    Type: Grant
    Filed: April 8, 2008
    Date of Patent: June 22, 2010
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
  • Publication number: 20100014750
    Abstract: A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.
    Type: Application
    Filed: March 5, 2009
    Publication date: January 21, 2010
    Applicant: Fuji Xerox Co., Ltd.
    Inventors: Yasuji SEKO, Hiroyuki Hotta, Yasuyuki Saguchi
  • Publication number: 20090310142
    Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
    Type: Application
    Filed: July 24, 2009
    Publication date: December 17, 2009
    Applicant: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
  • Patent number: 7633628
    Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: December 15, 2009
    Assignee: Fuji Xerox Co., Ltd.
    Inventor: Yasuji Seko
  • Patent number: 7583388
    Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: September 1, 2009
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
  • Patent number: 7562821
    Abstract: A position measurement system, includes: a plurality of concentric pattern projectors each for projecting a concentric pattern; an image sensor that has a sensor plane and that detects the concentric pattern; and an arithmetic unit that calculates a position of the image sensor and a normal direction of the sensor plane from a detection signal of the image sensor.
    Type: Grant
    Filed: February 14, 2006
    Date of Patent: July 21, 2009
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Tsutomu Abe, Yoshinori Yamaguchi, Hiroyuki Miyake
  • Patent number: 7554676
    Abstract: A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.
    Type: Grant
    Filed: September 15, 2004
    Date of Patent: June 30, 2009
    Assignee: Fuji Xerox Co., Ltd.
    Inventor: Yasuji Seko
  • Publication number: 20090103104
    Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.
    Type: Application
    Filed: December 19, 2008
    Publication date: April 23, 2009
    Applicant: FUJI XEROX CO., LTD.
    Inventor: Yasuji SEKO
  • Publication number: 20090070065
    Abstract: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.
    Type: Application
    Filed: April 8, 2008
    Publication date: March 12, 2009
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
  • Patent number: 7489406
    Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.
    Type: Grant
    Filed: August 13, 2007
    Date of Patent: February 10, 2009
    Assignee: Fuji Xerox Co., Ltd.
    Inventor: Yasuji Seko
  • Patent number: 7474418
    Abstract: A position measurement system includes a photographing unit and an arithmetic processing unit. The photographing unit has a lens and a light-receiving element. The lens forms an optical ring image from light from a light source through spherical aberration. The light-receiving element detects the optical ring image formed by the lens. The arithmetic processing unit measures a distance to the light source on the basis of the quantity of light of the optical ring image detected by the light-receiving element.
    Type: Grant
    Filed: August 19, 2005
    Date of Patent: January 6, 2009
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Yoshinori Yamaguchi, Hiroyuki Miyake
  • Publication number: 20080112054
    Abstract: A longitudinal interference fringe pattern projection lens includes: a lens body; a lens first surface that constitutes one surface of the lens body, and that has two convex or concave portions, which extend in parallel to each other in constant direction and have a same shape; and a lens second surface that constitutes the other surface of the lens body, wherein laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.
    Type: Application
    Filed: May 18, 2007
    Publication date: May 15, 2008
    Applicant: FUJI XEROX CO., LTD.
    Inventor: Yasuji Seko
  • Patent number: 7360708
    Abstract: An information processing method using a terminal apparatus, including: applying light with a concentric ring-like interference fringe pattern on one of subjects by using a pointer provided in the terminal apparatus; detecting the interference fringe pattern by using a detector; calculating an optical axis of the pointer on the basis of a detection signal obtained from the detector; specifying attribute information of the subject on the basis of arrangement information of the subject intersected by the optical axis in the condition that arrangement information of the subjects and attribute information of the subjects are stored in a storage device in advance while the arrangement information of each subject and the attribute information of the subject are associated with each other; and displaying the attribute information of the specified subject on the terminal apparatus.
    Type: Grant
    Filed: April 11, 2006
    Date of Patent: April 22, 2008
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Hiroyuki Miyake, Yasuji Seko, Yoshinori Yamaguchi, Shoji Sakamoto
  • Publication number: 20070291278
    Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.
    Type: Application
    Filed: August 13, 2007
    Publication date: December 20, 2007
    Applicant: FUJI XEROX CO., LTD.
    Inventor: Yasuji SEKO
  • Patent number: 7274461
    Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.
    Type: Grant
    Filed: December 17, 2004
    Date of Patent: September 25, 2007
    Assignee: Fuji Xerox Co., Ltd.
    Inventor: Yasuji Seko