Patents by Inventor Yasuji Yoneda

Yasuji Yoneda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Connection/inspection device for semiconductor elements
    Patent number: 6815962
    Abstract: There is provided an electric connection-inspection device which does not impair a freedom of selection of using materials from a viewpoint of restriction in terms of product's function with the aptitude of electric features of electric resistance and physical properties of internal stress, and restriction in terms of manufacture as to the appropriation or not of employment of a plating method, and which has a fine construction provided with the excellent durability that an electrode element is hard to adhere and coagulate.
    Type: Grant
    Filed: August 13, 2002
    Date of Patent: November 9, 2004
    Assignees: Kabushiki Kaisha Kobe Seiko Sho, Genesis Technology Inc.
    Inventors: Takayuki Hirano, Yasuji Yoneda, Hiroshi Gotoh, Eiji Iwamura, Susumu Takeuchi
  • Electric connection-inspection device
    Publication number: 20030034782
    Abstract: There is provided an electric connection-inspection device which does not impair a freedom of selection of using materials from a viewpoint of restriction in terms of product's function with the aptitude of electric features of electric resistance and physical properties of internal stress, and restriction in terms of manufacture as to the appropriation or not of employment of a plating method, and which has a fine construction provided with the excellent durability that an electrode element is hard to adhere and coagulate.
    Type: Application
    Filed: August 13, 2002
    Publication date: February 20, 2003
    Inventors: Takayuki Hirano, Yasuji Yoneda, Hiroshi Gotoh, Eiji Iwamura, Susumu Takeuchi
  • Method and apparatus for detecting position/variance of input light using linear and quadratic outputs
    Patent number: 4874939
    Abstract: An apparatus for detecting position/variance of input light is disclosed which includes a photoelectric conversion device receiving input light constituted of a first resistive layer formed of a first photoelectric conversion material and a second resistive layer formed of a second photoelectric conversion material connected with the first resistive layer through a depletion layer or directly, wherein the first resistive layer is provided with uniform resistivity throughout its surface so that a linear output proportional to the average of the distances between one end of the photoelectric conversion device and positions of the input light is detected and the second resistive layer is provided with resistivity dependent upon the distance from its one end so that a quandratic ouput proportional to the average of the squares of the distances between one end of the photoelectric conversion device and positions of the input light is detected.
    Type: Grant
    Filed: September 25, 1987
    Date of Patent: October 17, 1989
    Assignee: Kabushiki Kaisha Kobe Seiko Sho
    Inventors: Yoshiro Nishimoto, Yasuji Yoneda, Shinichi Imaoka, Yasuhide Nakai, Akimitsu Nakaue, Yoshihiko Onishi, Hiroyuki Tachibana, Takayoshi Inoue, Takuya Kusaka, Hiroyuki Takamatsu, Shigeki Tojyo, Hiroshi Kajikawa, Kozo Nishimura