Patents by Inventor Yasuko Tsuruga

Yasuko Tsuruga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7850305
    Abstract: The object of the invention is to provide a favorable spectral characteristic that reduces variation depending on the frequency of received light intensity, and that is gentle on a subject eye. It also eliminates displacement between positions of respective spectral images of the same part even if a change in alignment occurs between the eye and apparatus with the lapse of time.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: December 14, 2010
    Assignee: Topcon Corporation
    Inventors: Yoko Hirohara, Tatsuo Yamaguchi, Toshifumi Mihashi, Hiroyuki Aoki, Yasuko Tsuruga
  • Patent number: 7539340
    Abstract: A three-dimensional coordinate measuring apparatus has a first and second incident angle adjusting sections for adjusting the attitude of the object in the directions of first and second neutral axes, respectively, to adjust the incident angle of the beam projected on the object from an imaging optical system relative to the object so that first and second stereoscopic images of the object can be formed, a matching process section for searching for corresponding points corresponding to measurement points in first and second search directions generally perpendicular to the first and second neutral axes, respectively, in the first and second stereoscopic images, and a shape measuring section for obtaining three-dimensional coordinate data of the object based on the relation between the measurement points and the corresponding points in the first and second stereoscopic images.
    Type: Grant
    Filed: April 23, 2004
    Date of Patent: May 26, 2009
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Yasuko Tsuruga
  • Patent number: 7329867
    Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.
    Type: Grant
    Filed: August 18, 2006
    Date of Patent: February 12, 2008
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Hirotami Koike, Yasuko Tsuruga, Shinichi Okada
  • Publication number: 20080007692
    Abstract: To provide a spectroscopic fundus measuring apparatus capable of identifying each part in spectral fundus images easily and accurately based on its spectral characteristic and a measuring method therefor. A spectral fundus image measuring apparatus 1 of the present invention includes: an illumination optical system 10 having an illumination light source 11 for illuminating a fundus; a light receiving optical system 20 for receiving a wavelength-tunable light beam reflected from the illuminated fundus to photograph a series of spectral fundus images of different wavelengths; an image processing section 7 for processing the spectral fundus images; a storage section 7A for storing the spectral fundus images; and a display section 7B for displaying the spectral fundus images.
    Type: Application
    Filed: June 14, 2007
    Publication date: January 10, 2008
    Inventors: Toshifumi Mihashi, Yoko Hirohara, Hiroyuki Aoki, Yasuko Tsuruga
  • Publication number: 20070002276
    Abstract: The object of the invention is to provide a favorable spectral characteristic that reduces variation depending on the frequency of received light intensity, and that is gentle on a subject eye. It also eliminates displacement between positions of respective spectral images of the same part even if a change in alignment occurs between the eye and apparatus with the lapse of time.
    Type: Application
    Filed: December 2, 2005
    Publication date: January 4, 2007
    Inventors: Yoko Hirohara, Tatsuo Yamaguchi, Toshifumi Mihashi, Hiroyuki Aoki, Yasuko Tsuruga
  • Publication number: 20060289757
    Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.
    Type: Application
    Filed: August 18, 2006
    Publication date: December 28, 2006
    Inventors: Nobuo Kochi, Hirotami Koike, Yasuko Tsuruga, Shinichi Okada
  • Patent number: 7151258
    Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.
    Type: Grant
    Filed: July 23, 2004
    Date of Patent: December 19, 2006
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Hirotami Koike, Yasuko Tsuruga, Shinichi Okada
  • Patent number: 6959227
    Abstract: A lens layout setting apparatus for lens grinding processing apparatus having a display screen of a display device for various settings for processing data of eyeglass lens shape for an eyeglass frame, and data of lens grinding process to grind the lens based on the data of lens shape for the frame, further including a control means to add, delete or rearrange a setting condition. The display device displays data of eyeglass lens shape for an eyeglass frame, and of eyeglass lens grinding process required for grinding the lens based on the data, and further displays tabs arranged to display a layout operating screen to set a layout of the data of lens shape for the frame, a state of measuring an edge thickness of the lens, simulation of the shape of a V-shaped protrusion formed on an edge of the lens, and a grinding process screen.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: October 25, 2005
    Assignee: Kabushiki Kaisha Topcon
    Inventors: Hiroyuki Okada, Mitsuo Ishii, Jun Onose, Takahiro Watanabe, Toshihiro Iwai, Akihiro Harada, Yasuko Tsuruga
  • Publication number: 20050061972
    Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.
    Type: Application
    Filed: July 23, 2004
    Publication date: March 24, 2005
    Inventors: Nobuo Kochi, Hirotami Koike, Yasuko Tsuruga, Shinichi Okada
  • Publication number: 20040264764
    Abstract: [Problem to be Solved] To provide a three-dimensional coordinate measuring apparatus which does not show no significant differences in measurement accuracy depending upon the measurement direction even in three-dimensional shape measurement using anisotropic shape measurement in which measuring accuracy varies depending upon the measurement direction.
    Type: Application
    Filed: April 23, 2004
    Publication date: December 30, 2004
    Applicant: TOPCON CORPORATION
    Inventors: Nobuo Kochi, Yasuko Tsuruga
  • Publication number: 20040153198
    Abstract: A lens layout setting apparatus for lens grinding processing apparatus having a display screen of a display device for various settings for processing data of eyeglass lens shape for an eyeglass frame, and data of lens grinding process to grind the lens based on the data of lens shape for the frame, further including a control means to add, delete or rearrange a setting condition. The display device displays data of eyeglass lens shape for an eyeglass frame, and of eyeglass lens grinding process required for grinding the lens based on the data, and further displays tabs arranged to display a layout operating screen to set a layout of the data of lens shape for the frame, a state of measuring an edge thickness of the lens, simulation of the shape of a V-shaped protrusion formed on an edge of the lens, and a grinding process screen.
    Type: Application
    Filed: January 21, 2004
    Publication date: August 5, 2004
    Applicant: Kabushiki Kaisha Topcon
    Inventors: Hiroyuki Okada, Mitsuo Ishii, Jun Onose, Takahiro Watanabe, Toshihiro Iwai, Akihiro Harada, Yasuko Tsuruga
  • Patent number: 6751522
    Abstract: A lens layout display apparatus for lens grinding processing apparatus having a display screen on which is displayed data of eyeglass lens shape for an eyeglass frame, and data of eyeglass lens grinding process to grind the eyeglass lens based on the data of eyeglass lens shape for an eyeglass frame, the display means also displaying various icons which show a state of measuring an edge thickness of the eyeglass lens, a state of simulation of the shape of a V-shaped protrusion formed on an edge of the eyeglass lens, a state processing the edge portion of the eyeglass lens, and a completion of the grinding process of an eyeglass lens.
    Type: Grant
    Filed: August 29, 2001
    Date of Patent: June 15, 2004
    Assignee: Kabushiki Kaisha TOPCON
    Inventors: Hiroyuki Okada, Mitsuo Ishii, Jun Onose, Takahiro Watanabe, Toshihiro Iwai, Akihiro Harada, Yasuko Tsuruga
  • Publication number: 20020026262
    Abstract: A lens layout setting apparatus for lens grinding processing apparatus on having a display screen of a liquid crystal display device 8 for various settings required for processing data of eyeglass lens shape for an eyeglass frame, and data of eyeglass lens grinding process to grind the eyeglass lens based on the data of eyeglass lens shape for an eyeglass frame.
    Type: Application
    Filed: August 29, 2001
    Publication date: February 28, 2002
    Applicant: KABUSHIKI KAISHA TOPCON
    Inventors: Hiroyuki Okada, Mitsuo Ishii, Jun Onose, Takahiro Watanabe, Toshihiro Iwai, Akihiro Harada, Yasuko Tsuruga