Patents by Inventor Yasushi Nagasawa
Yasushi Nagasawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11932595Abstract: Provided are vitamin D3 derivatives of formula (I), pharmaceutical compositions thereof, and pharmaceutical or medical uses thereof for treating metabolic disease, a liver disease, obesity, diabetes, cardiovascular disease, or cancer in a patient in need thereof.Type: GrantFiled: September 17, 2021Date of Patent: March 19, 2024Assignee: KYOTO UNIVERSITY, NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY, TEIKYO UNIVERSITY and THE UNIVERSITY OF TOKYOInventors: Motonari Uesugi, Yasushi Takemoto, Kazuo Nagasawa, Atsushi Kittaka, Fumihiro Kawagoe, Hayato Nakagawa
-
Patent number: 9410884Abstract: A component measurement device, namely a blood-glucose measurement device, that has a measurement unit that focuses measurement light on a test paper through an illumination lens and receives reflected light from the test paper. The blood-glucose measurement device measures blood components on the basis of results from detecting the reflected light. The illumination lens is provided in the measurement unit such that the focal point of the measurement light is beyond the test paper.Type: GrantFiled: July 19, 2011Date of Patent: August 9, 2016Assignee: TERUMO KABUSHIKI KAISHAInventors: Takashi Morita, Yasushi Nagasawa, Masami Murayama, Yoshio Nagaoka, Eiki Izumi
-
Publication number: 20130177479Abstract: A component measurement device, namely a blood-glucose measurement device, that has a measurement unit that focuses measurement light on a test paper through an illumination lens and receives reflected light from the test paper. The blood-glucose measurement device measures blood components on the basis of results from detecting the reflected light. The illumination lens is provided in the measurement unit such that the focal point of the measurement light is beyond the test paper.Type: ApplicationFiled: July 19, 2011Publication date: July 11, 2013Applicant: TERUMO KABUSHIKI KAISHAInventors: Takashi Morita, Yasushi Nagasawa, Masami Murayama, Yoshio Nagaoka, Eiki Izumi
-
Patent number: 8206649Abstract: A component measuring apparatus is provided with a case having a cylindrical case main body and a cover arranged to cover the base end opening section of the case main body; a chip mounting section for mounting a chip; a light measuring section for detecting a prescribed component; a printed board whereupon a control section having a function of controlling the operation of the light measuring section is arranged; a liquid crystal display device; a battery arranging section for arranging a battery provided on the cover; an O-ring arranged between the case main body and the light measuring section on the leading end section of the case main body; and an O-ring arranged between the case main body and the cover on the base end opening section of the case main body. Sealing of inside the case is ensured by the O-ring.Type: GrantFiled: January 8, 2008Date of Patent: June 26, 2012Assignees: Terumo Kabushiki Kaisha, Hosiden CorporationInventors: Yoshiro Suzuki, Yasushi Nagasawa, Eiji Arita, Masakazu Ishizu, Yasuhiro Yamamoto
-
Publication number: 20100317092Abstract: A component measuring apparatus is provided with a case having a cylindrical case main body and a cover arranged to cover the base end opening section of the case main body; a chip mounting section for mounting a chip; a light measuring section for detecting a prescribed component; a printed board whereupon a control section having a function of controlling the operation of the light measuring section is arranged; a liquid crystal display device; a battery arranging section for arranging a battery provided on the cover; an O-ring arranged between the case main body and the light measuring section on the leading end section of the case main body; and an O-ring arranged between the case main body and the cover on the base end opening section of the case main body. Sealing of inside the case is ensured by the O-ring.Type: ApplicationFiled: January 8, 2008Publication date: December 16, 2010Applicants: Terumo Kabushiki Kaisha, Hosiden CorporationInventors: Yoshiro Suzuki, Yasushi Nagasawa, Eiji Arita, Masakazu Ishizu, Yasuhiro Yamamoto
-
Patent number: 7586610Abstract: A component measuring device for measuring the quantity and/or the property of a given component in a specimen by calorimetrically measuring a test strip includes a tip mount on which is to be mounted a tip having the test strip, and a photometric unit. The photometric unit comprises a light-emitting element that applies light to the test strip while the tip is mounted on the tip mount, a light-detecting element that detects light reflected from the test strip, and a holder in which is held the light-emitting element and the light-detecting element. The holder possesses a passage through which passes the light and the reflected light. A light-transmissive member closes the passage with a sealing member interposed therebetween in a portion of the holder which faces the test strip. The component measuring device can also be provided with a stain detecting device which is adapted to detect a stain on the light-transmissive member.Type: GrantFiled: May 21, 2004Date of Patent: September 8, 2009Assignee: Terumo Kabushiki KaishaInventor: Yasushi Nagasawa
-
Publication number: 20060243031Abstract: A component measuring device for measuring the quantity and/or the property of a given component in a specimen by colorimetrically measuring a test strip includes a tip mount on which is to be mounted a tip having the test strip, and a photometric unit. The photometric unit comprises a light-emitting element that applies light to the test strip while the tip is mounted on the tip mount, a light-detecting element that detects light reflected from the test strip, and a holder in which is held the light-emitting element and the light-detecting element. The holder possesses a passage through which passes the light and the reflected light. A light-transmissive member closes the passage with a sealing member interposed therebetween in a portion of the holder which faces the test strip. The component measuring device can also be provided with a stain detecting device which is adapted to detect a stain on the light-transmissive member.Type: ApplicationFiled: May 21, 2004Publication date: November 2, 2006Applicant: TERUMO KABUSHIKI KAISHAInventors: Akira Kondo, Yasushi Nagasawa
-
Publication number: 20030053496Abstract: A cooling block 17 has three water channels 21 formed so as to be located near an LD device 18 fixed to a side surface 17c, each water channel 21 having a water channel sectional shape like an elongated hole, and being inclined relative to the side surface 17c. Heat generated by the LD device 18 is eliminated by cooling water flowing through the water channels 21. The water channel sectional area of an inlet manifold water channel is rendered not less than twice the water channel sectional area of the cooling block water channel. Irregularities are formed on the inner surface of each of the cooling block water channels. Further, an inlet portion of the cooling block water channel is chamfered or given a curvature.Type: ApplicationFiled: April 3, 2002Publication date: March 20, 2003Inventors: Osamu Noda, Yasushi Nagasawa, Syozo Hirai, Masaharu Watanabe, Takashi Akaba
-
Patent number: 6076959Abstract: A novel method for measuring a deposit point is provided, which makes it possible to quickly and accurately measure a cloud point. A test sample is irradiated at an angle of incidence .theta. with an incoming light beam which satisfies an expression .theta.<.theta..sub.2 while gradually cooling the test sample such as gas oil, and a totally reflected light beam from the test sample is detected for every temperature, provided that .theta..sub.2 represents a critical angle of total reflection of a deposit such as a paraffin component deposited when the test sample is cooled. The deposit point of the test sample is determined from a change in intensity of the totally reflected light beam with respect to the change in temperature. The light intensity distributions, detected by a sensor array at respective temperatures, are statistically processed to more accurately determine the deposit point.Type: GrantFiled: April 6, 1998Date of Patent: June 20, 2000Assignee: Japan Energy CorporationInventor: Yasushi Nagasawa
-
Patent number: 5690998Abstract: The present invention relates to a probe needle wherein a conductive film is formed over a first insulating film formed around the outer periphery of a rod-like member through which a signal current flows, a second insulating film is formed over the outer periphery of the conductive film, and the conductive film is grounded. Since the rod-like member through which a signal current flows is thereby shielded, it is not affected by noise, and mutual crosstalk between signal currents is also prevented. Moreover, since ill effects caused by mutual contact with other probe needles is prevented by the second insulating film, reliable and stable measurement is possible.Type: GrantFiled: March 29, 1996Date of Patent: November 25, 1997Assignees: Tokyo Electron Kabushiki kaisha, Tokyo Electron Yamanashi Kabushiki KaishaInventors: Yasushi Nagasawa, Satoru Yamashita, Masahiko Matsudo
-
Patent number: 5565978Abstract: A refractive index sensor of a total-reflection type comprises a waveguiding layer of a cladding/core/cladding waveguide structure formed on a substrate. The waveguiding layer has an input face connected to either a single optical fiber or a plurality of optical fibers for injecting a light(s) into the layer, a detection face which, obeying Snell's law, totally reflects/transmits the light beam or beams that have arrived there with an expansion angle from the optical fiber or fibers and which constitutes a surface with which a material whose refractive index is to be measured comes in contact, and an output face which outputs the light reflected from the detection face and is connected to an optical detector. The refractive index of the material of interest is detected from a bright-dark boundary of the presence of the corresponding total reflected light from the detection face. With no need of a bulk prism or lamp-type light source, the sensor is small in size and high in sensitivity.Type: GrantFiled: December 13, 1994Date of Patent: October 15, 1996Assignee: Japan Energy CorporationInventors: Shuichi Okubo, Yasushi Nagasawa, Kazunari Naya
-
Patent number: 5532613Abstract: The present invention relates to a probe needle wherein a conductive film is formed over a first insulating film formed around the outer periphery of a rod-like member through which a signal current flows, a second insulating film is formed over the outer periphery of the conductive film, and the conductive film is grounded. Since the rod-like member through which a signal current flows is thereby shielded, it is not affected by noise, and mutual crosstalk between signal currents is also prevented. Moreover, since ill effects caused by mutual contact with other probe needles is prevented by the second insulating film, reliable and stable measurement is possible.Type: GrantFiled: April 14, 1994Date of Patent: July 2, 1996Assignees: Tokyo Electron Kabushiki Kaisha, Tokyo Electron Yamanashi Kabushiki KaishaInventors: Yasushi Nagasawa, Satoru Yamashita, Masahiko Matsudo
-
Patent number: 5399983Abstract: A semiconductor probe method and apparatus for avoiding collision between probe and semiconductor. A method of the present invention includes the step of setting a probe card adjacent a semiconductor wafer which is to be tested. A reading location data step then reads semiconductor wafer location data. A high speed advancing step then moves the probe card and semiconductor wafer together at a sufficiently high speed. A low speed advancing step then moves the probe card and semiconductor wafer together at a low speed. Finally, a detecting step detects when probe card needles contact the semiconductor wafer, at which point, the engaging operation is stopped and contact point data is stored in memory. A probe apparatus includes a probe card holder for supporting a probe card including probe needles. A memory element is arranged on the probe card and contains data of the position of the probe needles.Type: GrantFiled: June 22, 1994Date of Patent: March 21, 1995Assignee: Tokyo Electron Yamanashi LimitedInventor: Yasushi Nagasawa