Abstract: Provided is a plant disease control composition having a broad spectrum against various plant pathogens, and shows excellent controlling effects (synergistic controlling effects) which cannot be expected from a single component alone. The plant disease control composition includes (Group a) at least one quinoline compound represented by the formula: (wherein R1, R2: an alkyl which may be substituted, an aryl which may be substituted, etc.; R3, R4: H, an alkyl which may be substituted, etc.; X: halogen, an alkyl which may be substituted, etc.; Y: halogen, alkyl, etc.; n: 0 to 4; m: 0 to 6) or a salt thereof, and at least one of fungicidal compounds selected from the group consisting of a Strobilurin series compound, a triazole series compound, etc., as effective ingredients.

Abstract: A grease composition includes: a poly-?-olefin having a kinematic viscosity at 40 degrees C. of 60 to 320 mm2/s, the poly-?-olefin being contained in an amount of 50 mass % or more relative to a whole composition; a thickener that is a lithium salt of a hydroxyl-free fatty acid having 10 to 22 carbon atoms; and an ashless dithiocarbamate and/or zinc dithiocarbamate that are contained in an amount of 0.1 to 1.5 mass % in terms of sulfur relative to a whole composition. In the grease composition, a phosphorous content is 0.05 mass % or less relative to the whole composition, and a worked penetration is in a range from 265 to 310.

Abstract: A grease composition includes: a poly-?-olefin having a kinematic viscosity at 40 degrees C. of 60 to 320 mm2/s, the poly-?-olefin being contained in an amount of 50 mass % or more relative to a whole composition; a thickener that is a lithium salt of a hydroxyl-free fatty acid having 10 to 22 carbon atoms; and an ashless dithiocarbamate and/or zinc dithiocarbamate that are contained in an amount of 0.1 to 1.5 mass % in terms of sulfur relative to a whole composition. In the grease composition, a phosphorous content is 0.05 mass % or less relative to the whole composition, and a worked penetration is in a range from 265 to 310.

Abstract: A circuit automatic generation apparatus includes storage means 4 for retaining input/output information of each function circuit and circuit information to which the function circuit is connected, test mode generation specifications for generating a test mode signal, test specifications added to the function circuit, terminal test specifications for specifying the input/output directions of terminals and circuit terminal information to which the terminals are connected, and input/output information of a top-layer circuit and circuit information to which the top-layer circuit is connected; connection information check means 5 for determining the presence or absence of a connection defect of the function circuit; test mode generation circuit generation means 10 for generating a test mode generation circuit; test specification addition function circuit generation means 9 for generating a function circuit to which test specifications are added; terminal test circuit generation means 11 for generating a terminal

Abstract: A circuit automatic generation apparatus includes storage means 4 for retaining input/output information of each function circuit and circuit information to which the function circuit is connected, test mode generation specifications for generating a test mode signal, test specifications added to the function circuit, terminal test specifications for specifying the input/output directions of terminals and circuit terminal information to which the terminals are connected, and input/output information of a top-layer circuit and circuit information to which the top-layer circuit is connected; connection information check means 5 for determining the presence or absence of a connection defect of the function circuit; test mode generation circuit generation means 10 for generating a test mode generation circuit; test specification addition function circuit generation means 9 for generating a function circuit to which test specifications are added; terminal test circuit generation means 11 for generating a terminal

Abstract: From layout information which was generated from a net list of a semiconductor integrated circuit, extracted are a critical path to guaranteed operating frequency and physical information such as wiring congestion and via density, and on the basis of the physical information, a place to be easily broken down is specified, and a critical path, in which a delay fault is envisaged, is sorted out from critical paths, and a test pattern is generated only as to the selected critical path. On that occasion, by use of automatic test pattern generation software, and by use of a weighting application verification model which is obtained from critical path sorting information based on physical information, a weighting factor of a critical path is given.