Patents by Inventor Yih-Chau Chen

Yih-Chau Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Short-circuit probe card, wafer test system, and fault detection method for the wafer test system
    Patent number: 11821919
    Abstract: The present invention provides a short-circuit probe card, including: a substrate having an upper surface and a lower surface; a plurality of first contacts formed on the upper surface; and a plurality of second contacts formed on the lower surface and connected to the plurality of first contacts. The first contacts and second contacts are all grounded.
    Type: Grant
    Filed: June 25, 2020
    Date of Patent: November 21, 2023
    Assignee: WINDBOND ELECTRONICS CORP.
    Inventors: Chung-Hsuan Kan, Shu-Chi Lin, Yih-Chau Chen, Yuan-Long Tsai, Hsuan-Min Ho
  • SHORT-CIRCUIT PROBE CARD, WAFER TEST SYSTEM, AND FAULT DETECTION METHOD FOR THE WAFER TEST SYSTEM
    Publication number: 20210123951
    Abstract: The present invention provides a short-circuit probe card, including: a substrate having an upper surface and a lower surface; a plurality of first contacts formed on the upper surface; and a plurality of second contacts formed on the lower surface and connected to the plurality of first contacts. The first contacts and second contacts are all grounded.
    Type: Application
    Filed: June 25, 2020
    Publication date: April 29, 2021
    Applicant: Winbond Electronics Corp.
    Inventors: Chung-Hsuan KAN, Shu-Chi LIN, Yih-Chau CHEN, Yuan-Long TSAI, Hsuan-Min HO
  • Manual tester for testing device and method thereof
    Patent number: 6949941
    Abstract: This present invention is about a manual tester for testing a device and method thereof. The manual tester includes a controller, a first display, and a second display. The controller transmits a testing signal to the device in response to a start voltage and obtains a state signal and a site signal. The first display is electrically connected to the controller for displaying a first image in response to the state signal. The second display is electrically connected to the controller for displaying a second image in response to the site signal. By observing the first image and the second image, we can gain the states of the device.
    Type: Grant
    Filed: November 25, 2002
    Date of Patent: September 27, 2005
    Assignee: Winbond Electronics Corp.
    Inventor: Yih-Chau Chen
  • Manual tester for testing device and method thereof
    Publication number: 20030160629
    Abstract: This present invention is about a manual tester for testing a device and method thereof. The manual tester includes a controller, a first display, and a second display. The controller transmits a testing signal to the device in response to a start voltage and obtains a state signal and a site signal. The first display is electrically connected to the controller for displaying a first image in response to the state signal. The second display is electrically connected to the controller for displaying a second image in response to the site signal. By observing the first image and the second image, we can gain the states of the device.
    Type: Application
    Filed: November 25, 2002
    Publication date: August 28, 2003
    Applicant: Winbond Electronics Corp.
    Inventor: Yih-Chau Chen