Abstract: A method for preparing quartz glass with low content of hydroxyl and high purity, includes providing silica powders including hydroxyl groups. The silica powders are dehydroxylated, which includes drying the silica powders at a first temperature, heating the silica powders up to a second temperature and introducing a first oxidizing gas including halogen gas, thereby obtaining first dehydroxylated powders, and heating the first dehydroxylated powders up to a third temperature and introducing a second oxidizing gas including oxygen or ozone, thereby obtaining second dehydroxylated powders. The second dehydroxylated powders are heated up to a fourth temperature to obtain a vitrified body. The vitrified body is cooled to obtain the quartz glass with low content of hydroxyl and high purity. The quartz glass prepared by the above method has low content of hydroxyl and high purity. A quartz glass with low content of hydroxyl and high purity is also provided.

Abstract: Within a method for fabricating a semiconductor integrated circuit microelectronic fabrication, there is employed a planarizing method for forming, in a self aligned fashion, a patterned second gate electrode material layer laterally adjacent but not over a patterned first gate electrode material layer, such that upon further patterning of the patterned first gate electrode material layer and the patterned second gate electrode material layer there may be formed a first gate electrode over a first active region of a semiconductor substrate and a second gate electrode over a laterally adjacent second active region of the semiconductor substrate. The method is particularly useful within the context of complementary metal oxide semiconductor (CMOS) semiconductor integrated circuit microelectronic fabrications.