Patents by Inventor Yiwu He

Yiwu He has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • QUANTITAQUANTITATIVE DIAGNOSTIC METHODS USING MULTIPLE PARAMETERS
    Publication number: 20160341746
    Abstract: Materials and methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
    Type: Application
    Filed: August 5, 2016
    Publication date: November 24, 2016
    Applicant: VINDRAUGA HOLDINGS, LLC
    Inventors: Yiwu He, Bo Pi, John Bilello
  • DIAGNOSING AND MONITORING DEPRESSION DISORDERS
    Publication number: 20160342757
    Abstract: Materials and methods related to developing a disease score for a depression disorder (e.g., unipolar depression or major depressive disorder) in a subject using a multi-parameter system to measure a plurality of parameters, and an algorithm to calculate the score. The materials and methods can be used to, for example, diagnose depression disorders, or determine a subject's predisposition to develop a depression disorder. The methods also can include using a multi-parameter hypermapping system and algorithms related thereto.
    Type: Application
    Filed: August 5, 2016
    Publication date: November 24, 2016
    Applicant: Vindrauga Holdings, LLC
    Inventors: John Bilello, Yiwu He, Bo Pi
  • QUANTITATIVE DIAGNOSTIC METHODS USING MULTIPLE PARAMETERS
    Publication number: 20160011214
    Abstract: Materials and methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
    Type: Application
    Filed: June 18, 2015
    Publication date: January 14, 2016
    Inventors: Yiwu He, Bo Pi, John Bilello
  • DIAGNOSING AND MONITORING DEPRESSION DISORDERS
    Publication number: 20140257708
    Abstract: Materials and methods related to developing a disease score for a depression disorder (e.g., unipolar depression or major depressive disorder) in a subject using a multi-parameter system to measure a plurality of parameters, and an algorithm to calculate the score. The materials and methods can be used to, for example, diagnose depression disorders, or determine a subject's predisposition to develop a depression disorder. The methods also can include using a multi-parameter hypermapping system and algorithms related thereto.
    Type: Application
    Filed: January 14, 2014
    Publication date: September 11, 2014
    Applicant: Ridge Diagnostics, Inc.
    Inventors: John Bilello, Yiwu He, Bo Pi
  • QUANTITATIVE DIAGNOSTIC METHODS USING MULTIPLE PARAMETERS
    Publication number: 20140135224
    Abstract: Materials and methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
    Type: Application
    Filed: May 28, 2013
    Publication date: May 15, 2014
    Applicant: Ridge Diagnostics, Inc.
    Inventors: Yiwu He, Bo Pi, John Bilello
  • Quantitative diagnostic methods using multiple parameters
    Patent number: 8450077
    Abstract: Materials and methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: May 28, 2013
    Assignee: Ridge Diagnostics, Inc.
    Inventors: Yiwu He, Bo Pi, John Bilello
  • QUANTITATIVE DIAGNOSTIC METHODS USING MULTIPLE PARAMETERS
    Publication number: 20120289422
    Abstract: Materials and Methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
    Type: Application
    Filed: April 13, 2012
    Publication date: November 15, 2012
    Inventors: Yiwu He, Bo Pi, John Bilello
  • Quantitative diagnostic methods using multiple parameters
    Patent number: 8158374
    Abstract: Materials and Methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
    Type: Grant
    Filed: September 5, 2007
    Date of Patent: April 17, 2012
    Assignee: Ridge Diagnostics, Inc.
    Inventors: Yiwu He, Bo Pi, John Bilello
  • INFLAMMATORY BIOMARKERS FOR MONITORING DEPRESSIVE DISORDERS
    Publication number: 20110269633
    Abstract: Materials and Methods related to developing a unipolar depression (MDD) disease score in a subject using a multi-parameter system to measure a plurality of parameters, and an algorithm to calculate a score.
    Type: Application
    Filed: March 11, 2009
    Publication date: November 3, 2011
    Inventors: John Bilello, Yiwu He, Bo Pi
  • DIAGNOSING AND MONITORING DEPRESSION DISORDERS BASED ON MULTIPLE SERUM BIOMARKER PANELS
    Publication number: 20110245092
    Abstract: Materials and Methods related to developing a unipolar depression (MDD) disease score in a subject using a multi-parameter system to measure a plurality of parameters, and an algorithm to calculate a score.
    Type: Application
    Filed: March 4, 2009
    Publication date: October 6, 2011
    Inventors: John Bilello, Yiwu He, Bo Pi