Patents by Inventor Yonatan Karlik

Yonatan Karlik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • BER model evaluation
    Patent number: 10191799
    Abstract: A memory system is configured to perform a test operation to determine a deviation of a target storage location's bit error rate response relative to a model. The memory system determines the deviation level by measuring data sets stored in the target storage location to determine an actual bit error rate value and another actual parameter value used to estimate bit error rate. The memory system obtains an estimated value from the model based on the actual values and identifies the deviation by comparing the estimated value with the actual values.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: January 29, 2019
    Assignee: SanDisk Technologies LLC
    Inventors: Yonatan Karlik, Judah Gamliel Hahn, Ariel Navon, Alex Bazarsky, Ofer Shapira
  • BER MODEL EVALUATION
    Publication number: 20180189125
    Abstract: A memory system is configured to perform a test operation to determine a deviation of a target storage location's bit error rate response relative to a model. The memory system determines the deviation level by measuring data sets stored in the target storage location to determine an actual bit error rate value and another actual parameter value used to estimate bit error rate. The memory system obtains an estimated value from the model based on the actual values and identifies the deviation by comparing the estimated value with the actual values.
    Type: Application
    Filed: December 29, 2016
    Publication date: July 5, 2018
    Applicant: SanDisk Technologies LLC
    Inventors: Yonatan Karlik, Yehuda Hahn, Ariel Navon, Alex Bazarsky, Ofer Shapira