Abstract: The present disclosure discloses method for constructing a locomotive collaborative transportation scheduling system based on cyber-physical fusion, which provides a solution for multi-processor coordinated control of locomotive scheduling. The method includes the following steps: step 1, planning the actual on-site location of the device; step 2: constructing a distributed cyber-physical system collaborative architecture; step 3: describing the information transmission relationship between physical devices in a matrix manner to construct an information collaboration computing model; step 4: analyzing and selecting the matching controller type according to the device function implementation program; step 5: writing the controller function scheduling program to complete the construction of the locomotive collaborative transportation scheduling cyber-physical system, and realizing the locomotive automatic scheduling through this system.

Abstract: Among other things there is disclosed a method for determining corrected load values. The method includes obtaining a set of input features, each input feature being one of: i) a reported load value that was reported by a target base station to a source base station and ii) a derived load value derived using the reported load value; obtaining a set of output features, each output feature being a determined load value determined by the source base station, wherein each output feature is associated with a single one of the input features; and determining, using the set of input features and the set of output features, a set of one or more parameters for a mathematical model for determining a corrected load value based on one or more load values provided by the target base station.

Abstract: Among other things there is disclosed a method for determining corrected load values. The method includes obtaining a set of input features, each input feature being one of: i) a reported load value that was reported by a target base station to a source base station and ii) a derived load value derived using the reported load value; obtaining a set of output features, each output feature being a determined load value determined by the source base station, wherein each output feature is associated with a single one of the input features; and determining, using the set of input features and the set of output features, a set of one or more parameters for a mathematical model for determining a corrected load value based on one or more load values provided by the target base station.

Abstract: A method for predicting high-temperature operating life of an integrated circuit (IC) includes performing bias temperature instability tests and high-temperature operating life tests on a device of the IC, establishing a relationship between the device bias temperature instability and the IC's high-temperature operating life based on a result of the bias temperature instability tests and the high-temperature operating life tests. The method further includes providing a lot of subsequent integrated circuits (ICs), performing wafer-level bias temperature instability tests on a device of the ICs, and predicting high-temperature operating life of the ICs based on a result of the wafer-level bias temperature instability tests and based on the established relationship between the device's bias temperature instability and the IC's high-temperature operating life. The method can save significant effort and time over conventional approaches for accurate prediction of high-temperature operating life of an IC.

Abstract: A method for predicting high-temperature operating life of an integrated circuit (IC) includes performing bias temperature instability tests and high-temperature operating life tests on a device of the IC, establishing a relationship between the device bias temperature instability and the IC's high-temperature operating life based on a result of the bias temperature instability tests and the high-temperature operating life tests. The method further includes providing a lot of subsequent integrated circuits (ICs), performing wafer-level bias temperature instability tests on a device of the ICs, and predicting high-temperature operating life of the ICs based on a result of the wafer-level bias temperature instability tests and based on the established relationship between the device's bias temperature instability and the IC's high-temperature operating life. The method can save significant effort and time over conventional approaches for accurate prediction of high-temperature operating life of an IC.

Abstract: The invention achieves control over mixing controlled atmosphere storage of fruit vegetables by preparing an air-conditioned cold store, selecting fruits and vegetables, precooling, and stacking. Fruits and vegetables, upon pickup. are precooled to 9-11° C. in a vacuum pre-cooler for 12-24 hours. They are then stacked in a controlled atmosphere storage house. O2, CO2, N2 and Ar with different proportions are used for modified atmosphere packaging. The invention can extend the storage of mixing storage of various kinds of typical fruits and vegetables to more than 50 days, during which the fruits and vegetables are maintained in good color and flavor and have higher peroxidase, superoxide dismutase, catalase and cellulose activity; also, accumulation of hazardous substances such as superoxide anion free radical, hydrogen peroxide and malonaldehyde is effectively reduced, the retention rate of Vc is up to 80%-90%, and the weight loss ratio can be controlled to be below 8%.