Patents by Inventor Yoon-Oh HAN

Yoon-Oh HAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing an object and apparatus for performing the same
    Patent number: 9013201
    Abstract: A method of testing objects and an apparatus for performing the same, the method including loading the objects into a testing unit through a loading unit; testing the objects in the testing unit and determining whether the objects are normal objects or abnormal objects; unloading the tested objects from the testing unit to an unloading unit; directly reversely loading the abnormal objects from the unloading unit into the testing unit when the objects are determined to be abnormal objects; and re-testing the abnormal objects in the testing unit.
    Type: Grant
    Filed: June 27, 2012
    Date of Patent: April 21, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jae-Ho Park, Tea-Seog Um, In-Sik Kim, Suk-Lae Kim, Yoon-Oh Han
  • METHOD OF TESTING AN OBJECT AND APPARATUS FOR PERFORMING THE SAME
    Publication number: 20130118956
    Abstract: A method of testing objects and an apparatus for performing the same, the method including loading the objects into a testing unit through a loading unit; testing the objects in the testing unit and determining whether the objects are normal objects or abnormal objects; unloading the tested objects from the testing unit to an unloading unit; directly reversely loading the abnormal objects from the unloading unit into the testing unit when the objects are determined to be abnormal objects; and re-testing the abnormal objects in the testing unit.
    Type: Application
    Filed: June 27, 2012
    Publication date: May 16, 2013
    Inventors: Jae-Ho PARK, Tea-Seog UM, In-Sik KIM, Suk-Lae KIM, Yoon-Oh HAN