Patents by Inventor Yosef Weitzman

Yosef Weitzman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190226829
    Abstract: Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. Light is generated using an extended broadband light source. The light is directed toward the object, such as to create respective images of the light source on the respective layers of the object. Light that is reflected from a point of the object is gathered into a conjugate point in a detector. The thicknesses of the plurality of layers at the point of the object are determined, by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.
    Type: Application
    Filed: April 2, 2019
    Publication date: July 25, 2019
    Inventors: Yoel ARIELI, Yosef WEITZMAN
  • Patent number: 10288407
    Abstract: Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. An extended broadband light source produces light, and directs the light toward the object, such as to create respective images of the light source on the respective layers of the object. An imaging system gathers light that is reflected from a point of the object into a conjugate point in the detector. The detector determines the thicknesses of the plurality of layers at the point of the object by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.
    Type: Grant
    Filed: May 25, 2017
    Date of Patent: May 14, 2019
    Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES, LTD.
    Inventors: Yoel Arieli, Yosef Weitzman
  • Patent number: 10274371
    Abstract: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.
    Type: Grant
    Filed: December 11, 2015
    Date of Patent: April 30, 2019
    Assignee: ADOM, Advanced Optical Technologies Ltd.
    Inventors: Yoel Arieli, Yosef Weitzman
  • Publication number: 20170261308
    Abstract: Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. An extended broadband light source produces light, and directs the light toward the object, such as to create respective images of the light source on the respective layers of the object. An imaging system gathers light that is reflected from a point of the object into a conjugate point in the detector. The detector determines the thicknesses of the plurality of layers at the point of the object by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.
    Type: Application
    Filed: May 25, 2017
    Publication date: September 14, 2017
    Inventors: Yoel ARIELI, Yosef WEITZMAN
  • Patent number: 9696134
    Abstract: A system (10) for measuring a physical characteristic of an object (11) using dual path, two-dimensional Optical Coherence Tomography (OCT) includes an extended broadband light source (13) producing an incident light beam (14) and an interferometer (15) having a beam splitter (16) that splits the incident beam into first and second component (17, 18) beams and directs the second component beam (18) on to a moveable mirror (19) for creating an optical path difference between the first component beam (17) and a reflection (20) of the second component beam. A focusing lens (21) having a focal plane (22) focuses the first component beam and the reflection of the second component beam to form a fringe pattern (23) on the focal plane, and a configurable imaging system (25) images the fringe pattern on to a plane (12) of the object to allow two-dimensional measurement of the object without spatial scanning.
    Type: Grant
    Filed: July 28, 2013
    Date of Patent: July 4, 2017
    Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
    Inventors: Yoel Arieli, Yosef Weitzman
  • Publication number: 20160097678
    Abstract: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.
    Type: Application
    Filed: December 11, 2015
    Publication date: April 7, 2016
    Inventors: Yoel Arieli, Yosef Weitzman
  • Patent number: 9250133
    Abstract: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.
    Type: Grant
    Filed: May 16, 2011
    Date of Patent: February 2, 2016
    Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
    Inventors: Yoel Arieli, Yosef Weitzman
  • Publication number: 20150168125
    Abstract: A system (10) for measuring a physical characteristic of an object (11) using dual path, two-dimensional Optical Coherence Tomography (OCT) includes an extended broadband light source (13) producing an incident light beam (14) and an interferometer (15) having a beam splitter (16) that splits the incident beam into first and second component (17, 18) beams and directs the second component beam (18) on to a moveable mirror (19) for creating an optical path difference between the first component beam (17) and a reflection (20) of the second component beam. A focusing lens (21) having a focal plane (22) focuses the first component beam and the reflection of the second component beam to form a fringe pattern (23) on the focal plane, and a configurable imaging system (25) images the fringe pattern on to a plane (12) of the object to allow two-dimensional measurement of the object without spatial scanning.
    Type: Application
    Filed: July 28, 2013
    Publication date: June 18, 2015
    Inventors: Yoel Arieli, Yosef Weitzman
  • Publication number: 20110216324
    Abstract: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.
    Type: Application
    Filed: May 16, 2011
    Publication date: September 8, 2011
    Inventors: Yoel Arieli, Yosef Weitzman
  • Publication number: 20080158550
    Abstract: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.
    Type: Application
    Filed: March 29, 2006
    Publication date: July 3, 2008
    Inventors: Yoel Arieli, Yosef Weitzman