Patents by Inventor Yoshihiro Maruyama

Yoshihiro Maruyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Surface-enhanced Raman scattering unit including integrally formed handling board
    Patent number: 10551322
    Abstract: A SERS unit comprises an integrally formed handling board and a SERS element secured within a container space provided in the handling board so as to open to one side in a thickness direction of the handling board. The SERS element has a substrate arranged on an inner surface of the container space and an optical function part formed on the substrate, for generating surface-enhanced Raman scattering.
    Type: Grant
    Filed: August 9, 2013
    Date of Patent: February 4, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Toshimitsu Kawai, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama, Takafumi Yokino, Masaki Hirose, Anna Yoshida
  • Surface-enhanced Raman scattering element
    Patent number: 10408761
    Abstract: A surface-enhanced Raman scattering element comprises a substrate having a principal surface; a molded layer having a support part formed on the principal surface of the substrate so as to extend along the principal surface and a fine structure part formed on the support part; a frame part formed on the principal surface of the substrate so as to surround the support part and fine structure part along the principal surface; and a conductor layer formed on at least the fine structure part and constituting an optical functional part for generating surface-enhanced Raman scattering; while the fine structure part are formed integrally with the support part.
    Type: Grant
    Filed: August 9, 2013
    Date of Patent: September 10, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Takafumi Yokino, Masaki Hirose, Toshimitsu Kawai, Kazuto Ofuji, Yoshihiro Maruyama
  • Surface-enhanced raman scattering element and method for manufacturing same
    Patent number: 10393663
    Abstract: An SERS element includes a substrate, a fine structure portion formed on a surface of the substrate and having a plurality of pillars, and a conductor layer formed on the fine structure portion and constituting an optical functional portion that causes surface-enhanced Raman scattering. A groove is provided in an outer surface of each pillar. A plurality of gaps are formed in the conductor layer by forming the conductor layer on the outer surface of each pillar in a state in which at least a portion of an inner surface of the groove is exposed.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: August 27, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Katsumi Shibayama, Masashi Ito, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama, Nao Inoue
  • Surface-enhanced raman scattering unit and raman spectroscopic analysis method
    Patent number: 10281404
    Abstract: A SERS unit 1A comprises a SERS element 2 having a substrate and an optical function part 20 formed on the substrate, the optical function part 20 for generating surface-enhanced Raman scattering; a measurement board 3 supporting the SERS element 2 upon measurement; and a holding part 4 mechanically holding the SERS element 2 in the measurement board 3.
    Type: Grant
    Filed: March 22, 2018
    Date of Patent: May 7, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama
  • Surface-enhanced raman scattering unit, and method for using same
    Patent number: 10184895
    Abstract: A SERS unit comprises a substrate; an optical function part formed on the substrate, for generating surface-enhanced Raman scattering; and a package containing the optical function part in an inert space and configured to irreversibly expose the space.
    Type: Grant
    Filed: April 27, 2017
    Date of Patent: January 22, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Katsumi Shibayama, Masashi Ito, Takafumi Yokino, Masaki Hirose, Anna Yoshida, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D838001
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: January 8, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito
  • Substrate for spectroscopic analysis
    Patent number: D838002
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: January 8, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito, Toshiyuki Nagata, Hisashi Takamori
  • Substrate for spectroscopic analysis
    Patent number: D838003
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: January 8, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito
  • Substrate for spectroscopic analysis
    Patent number: D843010
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: March 12, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D843011
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: March 12, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D843012
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: March 12, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrates for spectroscopic analysis
    Patent number: D843013
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: March 12, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D843594
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: March 19, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D854184
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 16, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D855205
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 30, 2019
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D855206
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 30, 2019
    Inventors: Masahi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D855207
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 30, 2019
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D855208
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 30, 2019
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D855209
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 30, 2019
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama
  • Substrate for spectroscopic analysis
    Patent number: D855210
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: July 30, 2019
    Inventors: Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama