Abstract: The present invention is directed to facilitate debugging in a semiconductor integrated circuit device including a plurality of microprocessors. A semiconductor integrated circuit device includes: a plurality of processors; a plurality of debug interfaces enabling debugging of the corresponding processors; a plurality of common terminals shared by the plurality of debug interfaces; a selection circuit capable of selectively connecting the plurality of debug interfaces to the common terminals; and a controller capable of controlling selecting operation in the selection circuit in accordance with a predetermined instruction. A first selector capable of selectively connecting the plurality of debug interfaces to a TRST terminal in the terminal group conformed with the JTAG specifications, and a second selector capable of selectively connecting the plurality of debug interfaces to terminals other than the TRST terminal are provided.

Abstract: The present invention is directed to facilitate debugging in a semiconductor integrated circuit device including a plurality of microprocessors. A semiconductor integrated circuit device includes: a plurality of processors; a plurality of debug interfaces enabling debugging of the corresponding processors; a plurality of common terminals shared by the plurality of debug interfaces; a selection circuit capable of selectively connecting the plurality of debug interfaces to the common terminals; and a controller capable of controlling selecting operation in the selection circuit in accordance with a predetermined instruction. A first selector capable of selectively connecting the plurality of debug interfaces to a TRST terminal in the terminal group conformed with the JTAG specifications, and a second selector capable of selectively connecting the plurality of debug interfaces to terminals other than the TRST terminal are provided.

Abstract: A trace memory in the emulator is formed into a plurality of memory banks. Data to be traced is in principle stored sequentially in each memory bank. A trace condition setting circuit (trace registers) and a trace condition agreement detecting circuit (comparators) are provided to generate a valid/invalid flag FB indicating whether or not the data meet the set condition. This flag FB is stored along with the trace data in each memory bank.

Abstract: A circuit by which an SWI instruction held in a memory circuit is switchedly input in response to a signal supplied externally is provided in a processor, whereby the substitution of a program word can be realized using such an internal circuit, so that a high-speed and reliable break in program execution can be effected. Moreover, an interrupt function separate from normal interrupts is established by setting a specified operation mode, whereby, when a data processor is used as an emulator, the break of a user program including the ordinary interrupt processes can be easily effected by utilizing the special interrupt function. Also, by additionally providing the function of delivering out a signal indicative of the break status, an external circuit can be simplified.

Abstract: A circuit by which an SWI instruction held in a memory circuit is switchedly input in response to a signal supplied externally is provided in a processor, whereby the substitution of a program word can be realized using such an internal circuit, so that a high-speed and reliable break in program execution can be effected. Moreover, an interrupt function separate from normal interrupts is established by setting a specified operation mode, whereby, when a data processor is used as an emulator, the break of a user program including the ordinary interrupt processes can be easily effected by utilizing the special interrupt function. Also, by additionally providing the function of delivering out a signal indicative of the break status, an external circuit can be simplified.

Abstract: A circuit by which an SWI instruction held in a memory circuit is switchedly input in response to a signal supplied externally is provided in a processor, whereby the substitution of a program word can be realized using such an internal circuit, so that a high-speed and reliable break in program excution can be effected. Moreover, an interrupt function separate from normal interrupts is established by setting a specified operation mode, whereby, when a data processor is used as an emulator, the break of a user program including the ordinary interrupt processes can be easily effected by utilizing the special interrupt function. Also, by additionally providing the function of delivering out a signal indicative of the break status, an external circuit can be simplified.