Abstract: A pattern matching method comprising the steps of: computing matching scores while shifting a template picture in increments of four pixels so as to find a pixel corresponding to a maximum matching score; performing, starting from the pixel of the maximum matching score obtained in the matching score computing step, matching computations on each of an upper, a lower, a left-hand and a right-hand pixel surrounding the starting pixel in order to reach a pixel having a higher matching score than any other surrounding pixel; coming to a stop when the pixel with the highest matching score is reached; and adding to the highest matching score obtained in the computation performing step a correction value which takes into account the matching scores of the pixels adjacent to the highest matching score pixel, whereby matching score allowances due to dislocated pixels are corrected.

Abstract: A notch inspection method based on shading pattern matching for inspecting notches on semiconductor packages or like objects. A template is created to characteristically express brightness gradations of a notch edge in a picture, i.e., to represent the notch edge in pixels constituting contiguous bright and dark portions of the edge. The template may be created on the basis of notch size information or notch size measurements. The template is checked against pictures under inspection in shading pattern matching whereby presence of a notch is determined. Computations of shading pattern matching are omitted regarding portions of the notch edge where brightness remains unchanged.

Abstract: A measurement apparatus includes two mirrors reflecting light rays obtained when a group of leads arranged on one lateral surface of a semiconductor device and a light-shielding band pattern are illuminated in two different directions. The measurement apparatus thus inputs the light rays into a single imaging device without moving the semiconductor device and the transparent mounting plate so that the distance traveled by one light ray from an illumination unit to the imaging device is equal to the distance traveled by the other light ray through the mirror to a second imaging device. Thus, an inexpensive measurement apparatus automatically measures the dimensions of a semiconductor device at high speed using an automatic feeding function and to produces highly accurate measurements.

Abstract: An apparatus and method for discriminating the linearity of a line segment in an image processing system consisting of elements for extracting and tracking a train of points from a high contrast portion of a video image and for determining whether the position of one ofthe points exceeds a predetermined threshold value representative of a condition which defines the end of the linearity of the train of points.

Abstract: A method and apparatus for determining the shape of a wire or like article is provided in which a plurality of image pickup means are provided that view the wire through coaxial optical systems having their focal planes positioned differently from each other, the wire images imaged on the respective image pickup means are processed to determine the contrast and size of the images, and the results are used to determine the shape of the spatially disposed wire or the like.

Abstract: A stepped combination apparatus comprises transferring means for moving a bundle of component wires arranged in plural rows and plural lines in the longitudinal direction; pushing means for pushing the component wires to the line direction to put out a component wire at the opposite side; shifting means for shifting the component wire which is put out by the pushing means, to the other row; and stepped-bending means for stepped-bending the component wire which is put out. The operation time can be significantly shortened and a U-shape bundle of component wires can be treated by the apparatus.

Abstract: A stepped combination apparatus comprises transferring means for moving a bundle of component wires arranged in plural rows and plural lines in the longitudinal direction; pushing means for pushing the component wires to the line direction to put out a component wire at the opposite side; shifting means for shifting the component wire which is put out by the pushing means, to the other row; and stepped-bending means for stepped-bending the component wire which is put out. The operation time can be significantly shortened and a U-shape bundle of component wires can be treated by the apparatus.

Abstract: A rotary annulus holding a tape feed reel is moved along a taped body while revolving about the body in a plane normal to its longitudinal axis to wind a tape around the body under the control of a small-scaled computer. The computer stores many coordinate points describing the longitudinal axis of the body and, assuming that the longitudinal axis approximates to a series of broken lines defined by the coordinate points, it calculates a command position of the annulus from every three selected coordinate points adjacent to its actual position, a command speed of rotation and command angles of rotation of the annulus required for keeping its plane of revolution normal to the longitudinal axis of the body at the command position of the annulus.

Abstract: A tape winding apparatus including a base member which revolves around a body around which a tape is wound such as a coil conductor used in a large-size rotary machine and advances or retreats in the axial direction of the revolution; first supporting means for a wound tape which is attached to the base member and can deliver the free end of the tape; a second support which is pivotally mounted about an axis to the base member by means of a pivot and is rotatable substantially normal to the rotational direction of the base member; a first roller projecting from the base member in the advancing or rewinding direction of the base member so that the peripheral surface of the first roller is close to or contacts the axial line of the axis thereof; and a second roller which is mounted to project from the second support and be separated from the first roller so that a given portion of the peripheral surface of the second roller is constantly positioned on or close to the axial line of the pivot, wherein the free en