Patents by Inventor Yoshiki Hirano
Yoshiki Hirano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11969984Abstract: A laminate includes a core obtained by impregnating a mat of fibers with a thermoplastic resin (B); and a skin obtained by impregnating continuous fiber(s) with a thermoplastic resin (A), wherein sheet-form intermediate substrates in the laminate have a thermal expansibility, the usable temperature region of said thermoplastic resin (A) and that of said thermoplastic resin (B) overlap over a temperature range of at least 5° C., said thermoplastic resin (A) has a temperature region that does not melt at a lower limit of said usable temperature region, said fibers contained in said mat penetrate through interface layers formed by said thermoplastic resin (A) and said thermoplastic resin (B), and said thermoplastic resin (A) and said thermoplastic resin (B) form interface layers each with a concave-convex shape having a maximum height Ry of not less than 50 ?m and an average roughness Rz of not less than 30 ?m.Type: GrantFiled: June 7, 2021Date of Patent: April 30, 2024Assignee: Toray Industries, Inc.Inventors: Yoshiki Takebe, Hiroki Kihara, Noriyuki Hirano
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Patent number: 8324568Abstract: A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.Type: GrantFiled: June 4, 2010Date of Patent: December 4, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama
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Publication number: 20100323206Abstract: A film composed of a metal or a semimetal is formed on a surface of a soft magnetic powder including iron and oxygen (in step S102). In this case, a silicon-containing film is desirably formed on a surface of the film. Next, compaction is performed on the soft magnetic powder, so that a green compact is obtained (in step S103). Since the film is a metal film or a semimetal film having a high ductility, the density of the green compact produced by the compaction can be higher, and generation of damage, such as cracks or the like, can be prevented in the film. The effects can be also obtained in a case of formation of the silicon-containing film. Next, the green compact is subjected to heating, so that a surface and an interface of the soft magnetic powder of the green compact are oxidized, so that an insulation film is formed (in step S104). Generation of eddy current loss can be prevented by the oxide film. As a result, productivity and magnetic properties can be improved.Type: ApplicationFiled: January 8, 2009Publication date: December 23, 2010Inventors: Shingo Soma, Kazuhito Hiraga, Yoshiki Hirano
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Publication number: 20100243884Abstract: A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.Type: ApplicationFiled: June 4, 2010Publication date: September 30, 2010Applicant: CANON ANELVA CORPORATIONInventors: Yoshiro Shiokawa, Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama
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Patent number: 7202474Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: GrantFiled: March 22, 2006Date of Patent: April 10, 2007Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 7164121Abstract: An ion attachment mass spectrometry method causes positively charged metal ions generated in a metal ion generation region to attach to molecules of a measured gas in an attachment region to generate attached ions, and then performs mass spectrometry on the attached ions in a mass spectrometry region. In the method, further, a pressure of the attachment region is set so as to be included in a pressure range enabling free flight of the metal ions and the attached ions in the attachment region, an electrostatic field is formed for decelerating the metal ions in the attachment region, and only the measured gas is introduced to the attachment region. Thereby, quantitative analysis enabling accurate measurement of the concentration of the measured gas is realized.Type: GrantFiled: September 10, 2003Date of Patent: January 16, 2007Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa
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Publication number: 20060169888Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: ApplicationFiled: March 22, 2006Publication date: August 3, 2006Applicant: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 7084397Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: GrantFiled: March 31, 2004Date of Patent: August 1, 2006Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Publication number: 20050019649Abstract: A fuel cell electrode is proposed which has a positive electrode layer (20), a negative electrode layer (19) and an ion exchange film (21) interposed between these. Before a solution for making one of the other of positive and negative electrodes has dried, a solution for making the ion exchange film is applied to it, and then a solution for making the other electrode is applied while the solution for making the ion exchange film is not yet dry. Because the layers are not dry, the intimacy of the layers improves. By the ion exchange film being made a solution, the applied film can be made thin.Type: ApplicationFiled: November 26, 2002Publication date: January 27, 2005Inventors: Osamu Kakutani, Gen Okiyama, Takashi Suzuki, Tetsuo Shibata, Youichi Kamiyama, Hideki Watanabe, Tomoko Date, Yoshiki Hirano
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Publication number: 20040251408Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: ApplicationFiled: March 31, 2004Publication date: December 16, 2004Applicant: ANELVA CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 6800850Abstract: A reflection type ion attachment mass spectrometry apparatus is provided with a metal ion generation region, an attachment region and a mass spectrometry region. The metal ion generation region and the mass spectrometry region are formed as a common compartment and the attachment region is provided adjoining the common compartment. The attachment region has an electrostatic field generation unit for forming an electrostatic field in order to reflect the metal ions introduced from the metal ion generation region so as to guide them to the mass spectrometry region. Thereby, a trace ingredient can be detected with a high measurement sensitivity, the problems of disturbance of the mass spectrometer, deterioration of the metal ion emitter, the size of the apparatus, direct sampling, etc. are solved, and broad use in industry is possible.Type: GrantFiled: September 10, 2003Date of Patent: October 5, 2004Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa
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Patent number: 6768108Abstract: An ion attachment mass spectrometry apparatus provided with a first chamber and a second chamber separated by a partition having an aperture (nozzle), an emitter, a mass spectrometer, a vacuum pump, and a sample gas introduction mechanism for introducing a sample gas and making metal ions attach to sample gas molecules to make the sample gas positive ions. Further, the Knudsen number of the aperture is made not more than 0.01, the pressure of the second chamber is not more than {fraction (1/10)}th of the first chamber, gas of the sample gas in the first chamber is blown out from the aperture to the second chamber, and a supersonic jet formed in the second chamber is provided. Sample gas and metal ions are injected into the supersonic jet region and metal ions are made to attach to the sample gas molecules.Type: GrantFiled: July 2, 2003Date of Patent: July 27, 2004Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Toshihiro Fujii, Munetaka Nakata, Masao Takayanagi
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Publication number: 20040084616Abstract: A reflection type ion attachment mass spectrometry apparatus is provided with a metal ion generation region, an attachment region and a mass spectrometry region. The metal ion generation region and the mass spectrometry region are formed as a common compartment and the attachment region is provided adjoining the common compartment. The attachment region has an electrostatic field generation unit for forming an electrostatic field in order to reflect the metal ions introduced from the metal ion generation region so as to guide them to the mass spectrometry region. Thereby, a trace ingredient can be detected with a high measurement sensitivity, the problems of disturbance of the mass spectrometer, deterioration of the metal ion emitter, the size of the apparatus, direct sampling, etc. are solved, and broad use in industry is possible.Type: ApplicationFiled: September 10, 2003Publication date: May 6, 2004Inventors: Yoshiki Hirano, Yoshiro Shiokawa
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Publication number: 20040079876Abstract: An ion attachment mass spectrometry method causes positively charged metal ions generated in a metal ion generation region to attach to molecules of a measured gas in an attachment region to generate attached ions, and then performs mass spectrometry on the attached ions in a mass spectrometry region. In the method, further, a pressure of the attachment region is set so as to be included in a pressure range enabling free flight of the metal ions and the attached ions in the attachment region, an electrostatic field is formed for decelerating the metal ions in the attachment region, and only the measured gas is introduced to the attachment region. Thereby, quantitative analysis enabling accurate measurement of the concentration of the measured gas is realized.Type: ApplicationFiled: September 10, 2003Publication date: April 29, 2004Inventors: Yoshiki Hirano, Yoshiro Shiokawa
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Publication number: 20040011955Abstract: An ion attachment mass spectrometry apparatus provided with a first chamber and a second chamber separated by a partition having an aperture (nozzle), an emitter, a mass spectrometer, a vacuum pump, and a sample gas introduction mechanism for introducing a sample gas and making metal ions attach to sample gas molecules to make the sample gas positive ions. Further, the Knudsen number of the aperture is made not more than 0.01, the pressure of the second chamber is not more than {fraction (1/10)}th of the first chamber, gas of the sample gas in the first chamber is blown out from the aperture to the second chamber, and a supersonic jet formed in the second chamber is provided. Sample gas and metal ions are injected into the supersonic jet region and metal ions are made to attach to the sample gas molecules.Type: ApplicationFiled: July 2, 2003Publication date: January 22, 2004Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Toshihiro Fujii, Munetaka Nakata, Masao Takayanagi
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Patent number: 6559443Abstract: An ionization apparatus and ionization method, wherein an ion trap type structural unit is used as the ion source and an ion emitter for emitting metal ions is provided inside or outside the ion source, metal ions are attached to ingredients of a sample gas to ionize the sample gas, a separation parameter is changed to separate ions relating to a target substance for analysis and the metal ions, the metal ions are trapped and accumulated inside the ion source, and the ions relating to a target substance are ejected to a mass spectrometry unit. Due to this configuration, in ion mass spectrometry, it is possible to accurately separate the ions desired to be analyzed and the ions desired to be trapped by a simple configuration and relatively low resolution and possible to improve the sensitivity of analysis.Type: GrantFiled: November 5, 2001Date of Patent: May 6, 2003Assignee: Anelva CorporationInventors: Yoshiro Shiokawa, Megumi Nakamura, Yoshiki Hirano, Toshihiro Fujii
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Publication number: 20020053636Abstract: An ionization apparatus and ionization method, wherein an ion trap type structural unit is used as the ion source and an ion emitter for emitting metal ions is provided inside or outside the ion source, metal ions are attached to ingredients of a sample gas to ionize the sample gas, a separation parameter is changed to separate ions relating to a target substance for analysis and the metal ions, the metal ions are trapped and accumulated inside the ion source, and the ions relating to a target substance are ejected to a mass spectrometry unit. Due to this configuration, in ion mass spectrometry, it is possible to accurately separate the ions desired to be analyzed and the ions desired to be trapped by a simple configuration and relatively low resolution and possible to improve the sensitivity of analysis.Type: ApplicationFiled: November 5, 2001Publication date: May 9, 2002Applicant: ANELVA CORPORATIONInventors: Yoshiro Shiokawa, Megumi Nakamura, Yoshiki Hirano, Toshihiro Fujii
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Patent number: 6018134Abstract: A main circuit portions are arranged in the order of a breaking section fixed-side conductor, a breaking section movable-side conductor, a disconnecting section movable-side conductor, and a disconnecting section fixed-side conductor, and first and second grounding conductors are respectively provided for grounding the breaking section fixed-side conductor and the disconnecting section fixed-side conductor at both end portions of the apparatus. The arrangement of operating devices is set in the order of a first grounding-section operating device, a breaking-section operating device, a disconnecting-section operating device, and a second grounding-section operating device. In addition, a breaking section is supported by a single supporting insulator to reduce the number of creepage insulation portions.Type: GrantFiled: February 10, 1998Date of Patent: January 25, 2000Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Yoshiki Hirano, Naoyuki Nakatsukasa, Daisuke Yoshida, Kouichirou Wada, Mikio Mori, Masashi Matsuki
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Patent number: 5514844Abstract: A switch for use in electric power includes a fixed contact, a moving contact performing a switching operation with respect to the fixed contact, a cylinder working with the moving contact, a piston slidably provided in the cylinder, a buffer chamber which is surrounded by the cylinder and the piston, and is filled with an arc-extinguishing gas, and a second insulating nozzle mounted to an end of the cylinder on the side of the fixed contact, wherein the arc-extinguishing gas in the buffer chamber is sprayed through the nozzle on an arc generating between the fixed contact and the moving contact at an opening time of the moving contact.Type: GrantFiled: July 22, 1993Date of Patent: May 7, 1996Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Suenobu Hamano, Hiroyuki Sasao, Katsuhiko Horinouchi, Mikio Hidaka, Yoshiki Hirano, Haruhiko Kohyama
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Patent number: 5367134Abstract: In a closing operation of a circuit breaker with resistor contact, a resister contact is closed prior to closing of a main contact by the same first hydraulic operation system. In opening operation, the resistor contact is driven by a second hydraulic operation system used to close the main contact after operating the main contact by the first hydraulic operation system. Opening timing of the resistor contact is controlled by a mechanical interlock mechanism or hydraulic control circuit.Type: GrantFiled: April 16, 1993Date of Patent: November 22, 1994Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Toshiaki Yoshizumi, Mikio Hidaka, Yoshiki Hirano