Patents by Inventor Yoshimi Hatsukade

Yoshimi Hatsukade has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8548542
    Abstract: There is provided a directly-coupled high-temperature superconductor SQUID magnetic sensor in a single thin film structure, which suppresses flux trapping or jumping generated in the sensor in a magnetic field, prevents the degradation in performance of the SQUID sensor, and operates stably with high sensitivity even in the magnetic field. The SQUID magnetic sensor including a bi-crystal substrate 1 having a bi-crystal grain boundary, pickup loops 7a-7d formed from a first high-temperature superconducting thin film on the bi-crystal substrate 1, and a SQUID ring 3 formed from the first high-temperature superconducting thin film on the bi-crystal grain boundary, directly connected with the pickup loops 7a-7d, wherein a plurality of pickup loops 7a-7d are disposed equally spaced from a bi-crystal grain boundary line 2 so as not to overlap with the bi-crystal grain boundary.
    Type: Grant
    Filed: April 13, 2010
    Date of Patent: October 1, 2013
    Assignee: National University Corporation, Toyohashi University of Technology
    Inventors: Yoshimi Hatsukade, Saburo Tanaka, Sho Kanai
  • Patent number: 8330458
    Abstract: There is provided a nondestructive inspection apparatus using a SQUID magnetic sensor which allows nondestructive and accurate detection of magnetic particles in an insulator such as an electronic device or in a magnetizable member. The nondestructive inspection apparatus using the SQUID magnetic sensor comprises: a magnet for horizontal magnetization 4, the magnet applying a magnetic field to a specimen in the longitudinal direction of the specimen 3?; an inspection unit on which a specimen 3 is set, the specimen 3 being horizontally magnetized in the longitudinal direction by the magnet for horizontal magnetization 4; and belt conveyers 2, 5 for conveying the horizontally magnetized specimen 3; and a gradiometer 8 for detecting a particle horizontally magnetized along with a magnetizable member as the horizontally magnetized specimen 3.
    Type: Grant
    Filed: March 5, 2009
    Date of Patent: December 11, 2012
    Assignee: National University Corporation TOYOHASHI UNIVERSITY OF TECHNOLOGY
    Inventors: Saburo Tanaka, Yoshimi Hatsukade
  • Publication number: 20120053059
    Abstract: There, is provided a directly-coupled high-temperature superconductor SQUID magnetic sensor in a single thin film structure, which suppresses flux trapping or jumping generated in the sensor in a magnetic field, prevents the degradation in performance of the SQUID sensor, and operates stably with high sensitivity even in the magnetic field. The SQUID magnetic sensor including a bi-crystal substrate 1 having a bi-crystal grain boundary, pickup loops 7a-7d formed from a first high-temperature superconducting thin film on the bi-crystal substrate 1, and a SQUID ring 3 formed from the first high-temperature superconducting thin film on the bi-crystal grain boundary, directly connected with the pickup loops 7a-7d, wherein a plurality of pickup loops 7a-7d are disposed equally spaced from a bi-crystal grain boundary line 2 so as not to overlap with the bi-crystal grain boundary.
    Type: Application
    Filed: April 13, 2010
    Publication date: March 1, 2012
    Applicant: National University Corporation TOYOHASHI UNIVERSITY OF TECHNOLOGY
    Inventors: Yoshimi Hatsukade, Saburo Tanaka, Sho Kanai
  • Publication number: 20110031967
    Abstract: There is provided a nondestructive inspection apparatus using a SQUID magnetic sensor which allows nondestructive and accurate detection of magnetic particles in an insulator such as an electronic device or in a magnetizable member. The nondestructive inspection apparatus using the SQUID magnetic sensor comprises: a magnet for horizontal magnetization 4, the magnet applying a magnetic field to a specimen in the longitudinal direction of the specimen 3?; an inspection unit on which a specimen 3 is set, the specimen 3 being horizontally magnetized in the longitudinal direction by the magnet for horizontal magnetization 4; and belt conveyers 2, 5 for conveying the horizontally magnetized specimen 3; and a gradiometer 8 for detecting a particle horizontally magnetized along with a magnetizable member as the horizontally magnetized specimen 3.
    Type: Application
    Filed: March 5, 2009
    Publication date: February 10, 2011
    Applicant: National University Corporation TOYOHASHI UNVERSITY OF TECHNOLOGY
    Inventors: Saburo Tanaka, Yoshimi Hatsukade