Patents by Inventor Yoshimi Nagai

Yoshimi Nagai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10359903
    Abstract: Provided are a method and an apparatus that are capable of easily obtaining a data sheet including characteristics under desired operating conditions based on an actual measurement. A method of evaluating an electronic and an apparatus configured to execute the method are provided. The method includes displaying a characteristic parameter item or a characteristic graph item in a data sheet format; editing the characteristic parameter item or the characteristic graph item; and providing a button for initiating execution of a measurement of the characteristic parameter item or the characteristic graph item.
    Type: Grant
    Filed: April 13, 2016
    Date of Patent: July 23, 2019
    Assignee: Keysight Technologies, Inc.
    Inventor: Yoshimi Nagai
  • Patent number: 10197618
    Abstract: Provided are a measurement apparatus and a measurement method capable of measuring inter-terminal capacitances of a three-terminal device while reproducibility is high and influences of residual inductances are cancelled. The measurement apparatus includes: a route selector including a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, and a sixth terminal, the fourth to sixth terminals being configured to connect to any of the first to third terminals; an LCR meter; a device under test, which is a three-terminal device; first, second, and third cables for respectively connecting the fourth to sixth terminals of the first route selector and first, second, and third terminals of the device under test to each other; and fourth, fifth, and sixth cables for respectively connecting the first to third terminals of the first route selector and first, second, and third terminals of the LCR meter to each other.
    Type: Grant
    Filed: April 21, 2015
    Date of Patent: February 5, 2019
    Assignee: Keysight Technologies, Inc.
    Inventors: Koji Tokuno, Yoshimi Nagai
  • Publication number: 20160320432
    Abstract: Provided are a method and an apparatus that are capable of easily obtaining a data sheet including characteristics under desired operating conditions based on an actual measurement. A method of evaluating an electronic and an apparatus configured to execute the method are provided. The method includes displaying a characteristic parameter item or a characteristic graph item in a data sheet format; editing the characteristic parameter item or the characteristic graph item; and providing a button for initiating execution of a measurement of the characteristic parameter item or the characteristic graph item.
    Type: Application
    Filed: April 13, 2016
    Publication date: November 3, 2016
    Inventor: Yoshimi Nagai
  • Patent number: 9310408
    Abstract: A device analyzer for analyzing power devices. An example device analyzer comprises a collector supply to generate supply signal pulses with selected voltage or current levels and a supply signal pulse width at a high current. The supply signal pulses are applied at a collector supply source terminal when DUT is connected to conduct current between the collector supply source terminal and a collector supply common terminal. A supply switch closes or opens the DUT current path in narrow pulses having a narrow pulse width narrower than the supply signal pulses to conduct the supply signal pulses as narrowed sweep signal pulses having the high current capacity of the collector supply current. The supply switch alternatively regulates the current in the current path at constant current levels. Other modules capable of high power test capabilities may also be added.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: April 12, 2016
    Assignee: Keysight Technologies, Inc.
    Inventors: Atsushi Mikata, Hisao Kakitani, Koji Tokuno, Shinichi Tanida, Yoshimi Nagai
  • Publication number: 20150309109
    Abstract: Provided are a measurement apparatus and a measurement method capable of measuring inter-terminal capacitances of a three-terminal device while reproducibility is high and influences of residual inductances are cancelled. The measurement apparatus includes: a route selector including a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, and a sixth terminal, the fourth to sixth terminals being configured to connect to any of the first to third terminals; an LCR meter; a device under test, which is a three-terminal device; first, second, and third cables for respectively connecting the fourth to sixth terminals of the first route selector and first, second, and third terminals of the device under test to each other; and fourth, fifth, and sixth cables for respectively connecting the first to third terminals of the first route selector and first, second, and third terminals of the LCR meter to each other.
    Type: Application
    Filed: April 21, 2015
    Publication date: October 29, 2015
    Inventors: Koji Tokuno, Yoshimi Nagai