Abstract: Treatment device with clip is reciprocally closed and opened in one operation and locked in a second, distinct operation. The clip has a first arm and second arm which are configured to move in a direction toward and away from each other to close and open the clip; a wire connected to a proximal end of the clip configured to reciprocally move within a sheath to close and open the clip; and one or more latch elements on the clip configured to lock the clip in a closed state. Operating the wire does not lock the clip in a closed state in a single operation. Rather, the clip can be locked by another operation that is distinct from operating the wire for reciprocal movement, such as operating a stopper, an inner sheath reciprocally movable to slid over the clip arms, or a locking ring slidable over the clip arms.

Abstract: A clip device includes a sheath having a lumen with at least one open end and a plurality of clip arms movable between a first configuration in which the plurality of clip arms are opened to receive a target tissue, and a second configuration in which the plurality of clip arms are closed to grip the target tissue. Locking mechanisms respectively provided on the plurality of clip arms engage one another for maintaining the second configuration. A restraining mechanism is optionally configured to be associated with the locking mechanisms to prevent the target tissue from being pinched between the locking mechanisms.

Abstract: A clip for gripping tissue can having a first arm with a first claw at a distal end of the first arm, and second arm, with a second claw at a distal end of the second arm, in which the first arm and second arm are configured to move in a direction toward each other to close the clip. The clips include one or more anchors on the arms of the clip which protrude in a direction other than the direction that the first arm and second arm are configured to move toward each other to close the clip. Such anchors can more readily attach to tissue of a patient upon contact than clips without an anchor.

Abstract: An observation method using a compound microscope of an inverted optical microscope and an atomic force microscope includes scanning a cantilever so that a probe approaches a sample until surface layer information is acquired, observing the cantilever through the optical microscope to acquire shape information of the cantilever, moving an observation position of the optical microscope downward based on a length of the probe, performing fluorescence observation through the optical microscope, and scanning the cantilever to acquire the surface layer information. The probe approach, cantilever observation, and observation position movement are performed in order. The fluorescence observation is performed after the observation position movement. The surface layer information acquisition is performed after the probe approach.

Abstract: A scanning mechanism includes a movable portion to which a scanning target object is attached, and an X-Y actuator to scan the movable portion in an X direction and a Y direction perpendicular to the X direction. The X-Y actuator is symmetrical with respect to a straight line parallel to the Y direction and asymmetrical with respect to a straight line parallel to the X direction.

Abstract: A scanning probe microscope to measure a sample set on a sample mount in liquid includes a scanning mechanism to scan a cantilever provided with a probe at a free end along an X-axis, a Y-axis, and a Z-axis perpendicular to each other, and a liquid contact member including an optical transmission portion to transmit detection light for detecting a displacement of the cantilever, and arranged at least partially in contact with the liquid. The liquid contact member is not scanned by the scanning mechanism.

Abstract: A compound microscope of an optical microscope and a scanning probe microscope includes a stage to support a sample substrate holding a sample, and a cantilever chip having a substrate, a cantilever supported by the substrate, and a probe provided at the free end of the cantilever. The compound microscope further includes a scanner to hold the cantilever chip so that the probe faces the sample substrate and so that the substrate is inclined with respect to the sample substrate and to three-dimensionally scan the cantilever chip with respect to the sample substrate, a displacement sensor to optically detect the displacement of the cantilever, and an illumination light source to apply illumination light for observation by the optical microscope to the sample through the space between the substrate and the sample substrate.

Abstract: A scanning mechanism includes a movable portion to which a scanning target object is attached, and an X-Y actuator to scan the movable portion in an X direction and a Y direction perpendicular to the X direction. The X-Y actuator is symmetrical with respect to a straight line parallel to the Y direction and asymmetrical with respect to a straight line parallel to the X direction.

Abstract: A scanning probe microscope to measure a sample set on a sample mount in liquid includes a scanning mechanism to scan a cantilever provided with a probe at a free end along an X-axis, a Y-axis, and a Z-axis perpendicular to each other, and a liquid contact member including an optical transmission portion to transmit detection light for detecting a displacement of the cantilever, and arranged at least partially in contact with the liquid. The liquid contact member is not scanned by the scanning mechanism.

Abstract: A compound microscope includes an optical microscope to acquire time-series successive optical observation images of an observation target, a scanning probe microscope to acquire time-series successive probe-derived observation images of the observation target, and a control device to simultaneously give a common control command to the optical microscope and the scanning probe microscope.

Abstract: A compound microscope of an optical microscope and a scanning probe microscope includes a stage to support a sample substrate holding a sample, and a cantilever chip having a substrate, a cantilever supported by the substrate, and a probe provided at the free end of the cantilever. The compound microscope further includes a scanner to hold the cantilever chip so that the probe faces the sample substrate and so that the substrate is inclined with respect to the sample substrate and to three-dimensionally scan the cantilever chip with respect to the sample substrate, a displacement sensor to optically detect the displacement of the cantilever, and an illumination light source to apply illumination light for observation by the optical microscope to the sample through the space between the substrate and the sample substrate.