Patents by Inventor Yoshiyuki Takizawa
Yoshiyuki Takizawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11977219Abstract: An optical correction is predictively performed based on a result of AI learning previously performed by use of learning data including measurement data. The optical compensation system is provided with wavefront correction optics, a sensor and a controller. The wavefront correction optics corrects a wavefront of light that passes through a given optical path. The sensor obtains environmental information in the optical path. The controller calculates, based on the environmental information, a predicted wavefront disturbance of the light that has passed through the optical path and controls the wavefront correction optics so as to cancel the predicted wavefront disturbance.Type: GrantFiled: August 7, 2019Date of Patent: May 7, 2024Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., RIKEN, INSTITUTE FOR LASER TECHNOLOGYInventors: Masashi Iwashimizu, Hiroyuki Daigo, Shingo Nishikata, Kazunori Masukawa, Atsushi Ochiai, Toshikazu Ebisuzaki, Satoshi Wada, Yoshiyuki Takizawa, Masayuki Maruyama, Shinji Motokoshi
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Patent number: 11802990Abstract: An optical system that obtains characteristics of a transmission path in atmosphere, when laser light propagates through this transmission path, at a place separated from this transmission path and before the propagation, and corrects wavefront of the laser light based on the obtained characteristics, is provided. The optical system is provided with an irradiation device and an atmospheric characteristics obtaining system. The irradiation device irradiates an external target with light via a first optical path. The atmospheric characteristics obtaining system is arranged in a second optical path separated from the first optical path and obtains characteristics of atmospheric environment in the first optical path with respect to the irradiated light. The irradiation device is provided with wavefront correction optics. The wavefront correction optics correct wavefront of the irradiated light based on the obtained characteristics.Type: GrantFiled: August 23, 2019Date of Patent: October 31, 2023Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., RIKEN, INSTITUTE FOR LASER TECHNOLOGYInventors: Masashi Iwashimizu, Hiroyuki Daigo, Shingo Nishikata, Kazunori Masukawa, Atsushi Ochiai, Toshikazu Ebisuzaki, Satoshi Wada, Yoshiyuki Takizawa, Masayuki Maruyama, Shinji Motokoshi
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Patent number: 11387618Abstract: A laser beam irradiation apparatus including: a plurality of laser light sources emitting first laser beams; and a light-condensing optics system having an incident face on which the first laser beams are made incident and performing an optical operation on the first laser beams to emit second laser beams. The plurality of laser light sources are configured to emit the first laser beams so that beam diameters are expanded towards the incident face. Each first laser beam overlaps at least one of the other laser beams on the incident face. The light-condensing optics system is configured so that beam diameters of second laser beams emitted from the light-condensing optics system are minimal on a target face, and a distance between a center of each second laser beam and the optical axis on the target face is smaller than a beam radius of each second laser beam on the target face.Type: GrantFiled: April 25, 2018Date of Patent: July 12, 2022Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., RIKENInventors: Masashi Iwashimizu, Hiroyuki Daigo, Shingo Nishikata, Kazunori Masukawa, Atsushi Ochiai, Toshikazu Ebisuzaki, Satoshi Wada, Yoshiyuki Takizawa
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Patent number: 11163150Abstract: A driving optical system is used to observe a disturbance of a wavefront of reference light received from a target and generate a wavefront in a conjugate relationship with the wavefront. A plurality of control signals are generated on a basis of a plurality of Zernike coefficients calculated as a Zernike polynomial which approximates the wavefront disturbance in order to respectively drive a plurality of deformable mirrors included in the driving optical system. An adaptive optical system is provided which can optically compensate a wavefront disturbance derived from an atmospheric fluctuation even in a case of radiating laser light to a target moving at a high speed.Type: GrantFiled: April 25, 2018Date of Patent: November 2, 2021Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., RIKENInventors: Masashi Iwashimizu, Hiroyuki Daigo, Shingo Nishikata, Kazunori Masukawa, Atsushi Ochiai, Toshikazu Ebisuzaki, Satoshi Wada, Yoshiyuki Takizawa
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Publication number: 20210318534Abstract: An optical correction is predictively performed based on a result of AI learning previously performed by use of learning data including measurement data. The optical compensation system is provided with wavefront correction optics, a sensor and a controller. The wavefront correction optics corrects a wavefront of light that passes through a given optical path. The sensor obtains environmental information in the optical path. The controller calculates, based on the environmental information, a predicted wavefront disturbance of the light that has passed through the optical path and controls the wavefront correction optics so as to cancel the predicted wavefront disturbance.Type: ApplicationFiled: August 7, 2019Publication date: October 14, 2021Inventors: Masashi IWASHIMIZU, Hiroyuki DAIGO, Shingo NISHIKATA, Kazunori MASUKAWA, Atsushi OCHIAI, Toshikazu EBISUZAKI, Satoshi WADA, Yoshiyuki TAKIZAWA, Masayuki MARUYAMA, Shinji MOTOKOSHI
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Publication number: 20210311225Abstract: An optical system that obtains characteristics of a transmission path in atmosphere, when laser light propagates through this transmission path, at a place separated from this transmission path and before the propagation, and corrects wavefront of the laser light based on the obtained characteristics, is provided. The optical system is provided with an irradiation device and an atmospheric characteristics obtaining system. The irradiation device irradiates an external target with light via a first optical path. The atmospheric characteristics obtaining system is arranged in a second optical path separated from the first optical path and obtains characteristics of atmospheric environment in the first optical path with respect to the irradiated light. The irradiation device is provided with wavefront correction optics. The wavefront correction optics correct wavefront of the irradiated light based on the obtained characteristics.Type: ApplicationFiled: August 23, 2019Publication date: October 7, 2021Inventors: Masashi IWASHIMIZU, Hiroyuki DAIGO, Shingo NISHIKATA, Kazunori MASUKAWA, Atsushi OCHIAI, Toshikazu EBISUZAKI, Satoshi WADA, Yoshiyuki TAKIZAWA, Masayuki MARUYAMA, Shinji MOTOKOSHI
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Publication number: 20210270568Abstract: A laser irradiation apparatus is provided with a controller that calculates at least one predicted movement position into which a target is predicted to move at a specific time in future, a transmission laser source that generates a transmission laser, irradiation optics configured to emit the transmission laser to the target and emit search laser to the predicted movement position and wavefront correction optics. The wavefront correction optics are configured to correct a wavefront of the transmission laser at the specific time based on observation light that returns when the search laser is emitted to the predicted movement position.Type: ApplicationFiled: July 3, 2019Publication date: September 2, 2021Inventors: Masashi IWASHIMIZU, Hiroyuki DAIGO, Shingo NISHIKATA, Kazunori MASUKAWA, Atsushi OCHIAI, Toshikazu EBISUZAKI, Satoshi WADA, Yoshiyuki TAKIZAWA, Masayuki MARUYAMA, Shinji MOTOKOSHI
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Publication number: 20200227881Abstract: A laser beam irradiation apparatus including: a plurality of laser light sources emitting first laser beams; and a light-condensing optics system having an incident face on which the first laser beams are made incident and performing an optical operation on the first laser beams to emit second laser beams. The plurality of laser light sources are configured to emit the first laser beams so that beam diameters are expanded towards the incident face. Each first laser beam overlaps at least one of the other laser beams on the incident face. The light-condensing optics system is configured so that beam diameters of second laser beams emitted from the light-condensing optics system are minimal on a target face, and a distance between a center of each second laser beam and the optical axis on the target face is smaller than a beam radius of each second laser beam on the target face.Type: ApplicationFiled: April 25, 2018Publication date: July 16, 2020Inventors: Masashi IWASHIMIZU, Hiroyuki DAIGO, Shingo NISHIKATA, Kazunori MASUKAWA, Atsushi OCHIAI, Toshikazu EBISUZAKI, Satoshi WADA, Yoshiyuki TAKIZAWA
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Publication number: 20200209610Abstract: Observing a disturbance of a wavefront of reference light received from a target and generating a wavefront in a conjugate relationship with the wavefront by use of a driving optical system. Generating a plurality of control signals on a basis of a plurality of Zernike coefficients calculated as a Zernike polynomial which approximates the wavefront disturbance in order to respectively drive a plurality of deformable mirrors included in the driving optical system. Providing an adaptive optical system which can optically compensate a wavefront disturbance derived from an atmospheric fluctuation even in a case of radiating laser light to a target moving at a high speed.Type: ApplicationFiled: April 25, 2018Publication date: July 2, 2020Inventors: Masashi IWASHIMIZU, Hiroyuki DAIGO, Shingo NISHIKATA, Kazunori MASUKAWA, Atsushi OCHIAI, Toshikazu EBISUZAKI, Satoshi WADA, Yoshiyuki TAKIZAWA
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Patent number: 9697998Abstract: A mass spectrometer includes: an ionization unit configured to ionize an analyte gas; a filter unit configured to allow passage of only a target ion which is a component of the analyte gas ionized in the ionization unit and which has a specific mass-to-charge ratio; and an ion detection unit configured to detect an ion detection value based on the target ion having passed through the filter unit, wherein the ion detection unit includes a Faraday electrode which includes an electrode portion disposed along a centerline of the filter unit and a bottom electrode provided at a position downstream of the electrode portion in a flow of the target ion, the electrode portion and the bottom electrode being connected to each other, a secondary electron multiplier provided to face the electrode portion with the centerline located therebetween, and a blocking portion connected to the bottom electrode.Type: GrantFiled: December 28, 2015Date of Patent: July 4, 2017Assignee: CANON ANELVA CORPORATIONInventors: Megumi Nakamura, Yoshiyuki Takizawa, Masayuki Sugiyama, Yuji Shimada, Hiroki Mita
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Publication number: 20160240364Abstract: A mass spectrometer includes: an ionization unit configured to ionize an analyte gas; a filter unit configured to allow passage of only a target ion which is a component of the analyte gas ionized in the ionization unit and which has a specific mass-to-charge ratio; and an ion detection unit configured to detect an ion detection value based on the target ion having passed through the filter unit, wherein the ion detection unit includes a Faraday electrode which includes an electrode portion disposed along a centerline of the filter unit and a bottom electrode provided at a position downstream of the electrode portion in a flow of the target ion, the electrode portion and the bottom electrode being connected to each other, a secondary electron multiplier provided to face the electrode portion with the centerline located therebetween, and a blocking portion connected to the bottom electrode.Type: ApplicationFiled: December 28, 2015Publication date: August 18, 2016Inventors: Megumi Nakamura, Yoshiyuki Takizawa, Masayuki Sugiyama, Yuji Shimada, Hiroki Mita
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Patent number: 9373491Abstract: An object of the present invention is to provide a mass spectrometer having a simple structure and being capable of precisely measuring a total pressure and performing mass spectrometry with high precision. A mass spectrometer according to one embodiment includes a quadrupole configured to selectively pass therethrough an ion of a target gas having a predetermined mass-to-charge ratio among components of a measurement gas ionized by an ion source, an ion detector configured to detect an ion current value based on the ion of the target gas that passes through the quadrupole, a total pressure measurer configured to detect a photoelectric current value based on vacuum ultraviolet light generated when the ion source ionizes the measurement gas, and an arithmetic unit configured to calculate a partial pressure of the target gas by using the photoelectric current value and the ion current value.Type: GrantFiled: May 27, 2015Date of Patent: June 21, 2016Assignee: CANON ANELVA CORPORATIONInventors: Megumi Nakamura, Masayuki Sugiyama, Lei Chen, Yoshiyuki Takizawa
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Publication number: 20150262807Abstract: An object of the present invention is to provide a mass spectrometer having a simple structure and being capable of precisely measuring a total pressure and performing mass spectrometry with high precision. A mass spectrometer according to one embodiment includes a quadrupole configured to selectively pass therethrough an ion of a target gas having a predetermined mass-to-charge ratio among components of a measurement gas ionized by an ion source, an ion detector configured to detect an ion current value based on the ion of the target gas that passes through the quadrupole, a total pressure measurer configured to detect a photoelectric current value based on vacuum ultraviolet light generated when the ion source ionizes the measurement gas, and an arithmetic unit configured to calculate a partial pressure of the target gas by using the photoelectric current value and the ion current value.Type: ApplicationFiled: May 27, 2015Publication date: September 17, 2015Inventors: Megumi NAKAMURA, Masayuki SUGIYAMA, Lei CHEN, Yoshiyuki TAKIZAWA
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Patent number: 7450299Abstract: The light of a broad energy band can be observed by reflecting the light of the broad energy band, for example, the light from the visible light region to the x-ray region at a high reflectance respectively, by a composite telescope including a normal incidence optical system and an oblique incidence optical system. A broadband telescope comprise an oblique incidence optical system unit in which the light is obliquely incident on a surface part for reflecting the incident light, a normal incidence optical system unit in which the light is substantially vertically incident on a surface part for reflecting the incident light, and an analyzer for spectrum analysis of the light reflected by the surface part of the obliquely incidence optical system unit and the light reflected by the surface part of the normal incidence optical system unit.Type: GrantFiled: December 25, 2002Date of Patent: November 11, 2008Assignee: RikenInventors: Yoshiyuki Takizawa, Yoshiyuki Takahashi, Hirohiko Shimizu, Chiko Otani, Toshikazu Ebisuzaki
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Publication number: 20080135328Abstract: A plurality of openings are provided on the surface of a body casing which comprises a noise reduction chamber, and plate members (a reflecting plate and a sound waves introduction plate) are provided extending from an edge of each opening to the noise reduction chamber. The opening edges at which these plate members are attached have acute corners or rounded corners.Type: ApplicationFiled: August 16, 2007Publication date: June 12, 2008Applicant: MK SEIKO CO., LTD.Inventors: Shoichi Takeda, Yukito Obinata, Tsuyoshi Arai, Naoki Gohdo, Yoshiyuki Takizawa, Yuuki Nakamura
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Publication number: 20050122603Abstract: The light of a broad energy band can be observed by reflecting the light of the broad energy band, for example, the light from the visible light region to the x-ray region at a high reflectance respectively, by a composite telescope including a normal incidence optical system and an oblique incidence optical system. A broadband telescope comprise an oblique incidence optical system unit in which the light is obliquely incident on a surface part for reflecting the incident light, a normal incidence optical system unit in which the light is substantially vertically incident on a surface part for reflecting the incident light, and an analyzer for spectrum analysis of the light reflected by the surface part of the obliquely incidence optical system unit and the light reflected by the surface part of the normal incidence optical system unit.Type: ApplicationFiled: December 25, 2002Publication date: June 9, 2005Inventors: Yoshiyuki Takizawa, Yoshiyuki Takahashi, Hirohiko Shimizu, Chiko Otani, Toshikazu Ebisuzaki
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Publication number: 20020089739Abstract: In order to make possible to observe light rays in a wide energy band by reflecting the respective light rays therein, for example those in a region extending from soft X-ray to visible light at high reflection factors, a wide band normal incident telescope comprises a reflecting mirror involving a surface part wherein different types of multilayer films have been formed, respectively, in every regions of predetermined shapes, and reflecting light rays, which were input, by the surface part; and a detector to which the light rays reflected by the surface part are input, and which detects spectrally the light rays thus input.Type: ApplicationFiled: December 28, 2001Publication date: July 11, 2002Inventors: Yoshiyuki Takizawa, Yoshiyuki Takahashi, Toshikazu Ebisuzaki, Hirohiko M. Shimizu
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Patent number: 4558213Abstract: A pickup level control device for a system for reading out recorded information which has a pickup element producing a pickup output signal. The device detects a dc component of the pickup output signal and produces a level control signal. A voltage level of the pickup output signal is controlled in response to the level control signal produced by the dc level detection operation. The control of the voltage level of the pickup output signal is performed by a variable impedance element connected to a terminal of the pickup element, so that a peak level of an ac component of the pickup output signal is controlled below a predetermined level.Type: GrantFiled: May 31, 1983Date of Patent: December 10, 1985Assignee: Pioneer Electronic CorporationInventors: Koki Aizawa, Yoshiyuki Takizawa, Akira Haeno, Akira Motoyama
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Patent number: 4510458Abstract: An amplifier circuit has an operational amplifier and a negative feedback circuit. An input signal is applied to the non-inverting input terminal of the operational amplifier, whereby a first output signal is provided from the output terminal of the operational amplifier. The first output signal is fed back to the inverting input terminal of the operational amplifier through the negative feedback circuit. The negative feedback signal of the negative feedback circuit is fed back to the inverting input terminal through an impedance converter. Thus, a second output signal of low distortion factor is derived from the output terminal of the impedance converter.Type: GrantFiled: August 18, 1982Date of Patent: April 9, 1985Assignees: Hitachi, Ltd., Pioneer Electronic Corp.Inventors: Tetsuo Sato, Yasuo Kominami, Yoshiyuki Takizawa, Akira Haeno
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Patent number: 4476502Abstract: A noise reduction system is provided which can operate as either a Dolby B-type or C-type system. In either case, an input signal is applied to the variable impedance of a high-level side chain through an identical shared filter circuit network. The high-level side chain has two voltage-current converters for controlling the variable impedance. By substantially inhibiting the operation of one of the two converters, the system operates as a C-type Dolby system. On the other hand, when the system operates as a B-type Dolby system, a bias current is applied to each of the two converters during periods of no input signal. This bias current is about half of a minute bias control current which is applied during no signal periods to the single converter used when the system operates as the C-type Dolby system.Type: GrantFiled: August 27, 1982Date of Patent: October 9, 1984Assignees: Hitachi, Ltd., Pioneer Electronic CorporationInventors: Kazuo Watanabe, Yasuo Kominami, Yoshiyuki Takizawa, Akira Haeno