Patents by Inventor Yosuke Komma

Yosuke Komma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detecting mura defects in master panel of flat panel displays during fabrication
    Patent number: 10867382
    Abstract: A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: December 15, 2020
    Assignee: Keysight Technologies, Inc.
    Inventors: Manuel Moertelmaier, Tomonori Ura, Yosuke Komma, Michael Dieudonne
  • DETECTING MURA DEFECTS IN MASTER PANEL OF FLAT PANEL DISPLAYS DURING FABRICATION
    Publication number: 20190362481
    Abstract: A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.
    Type: Application
    Filed: March 29, 2019
    Publication date: November 28, 2019
    Inventors: Manuel Moertelmaier, Tomonori Ura, Yosuke Komma, Michael Dieudonne