Patents by Inventor Yosuke OKAZAKI

Yosuke OKAZAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11971633
    Abstract: An electrode structure includes: a plurality of pixel electrodes arranged separately from each other; and a plurality of dielectric layers laminated in a first direction with respect to the plurality of pixel electrodes, in which the plurality of dielectric layers includes: a first dielectric layer that spreads over the plurality of pixel electrodes in a direction intersecting with the first direction; and a second dielectric layer that includes dielectric material having a refractive index higher than that of the first dielectric layer, sandwiches the first dielectric layer together with the plurality of pixel electrodes, and has a slit at a position overlapping space between pixel electrodes adjacent when viewed from the first direction.
    Type: Grant
    Filed: May 15, 2020
    Date of Patent: April 30, 2024
    Assignees: SONY SEMICONDUCTOR SOLUTIONS CORPORATION, SONY GROUP CORPORATION
    Inventors: Takashi Sakairi, Tomoaki Honda, Tsuyoshi Okazaki, Keiichi Maeda, Chiho Araki, Katsunori Dai, Shunsuke Narui, Kunihiko Hikichi, Kouta Fukumoto, Toshiaki Okada, Takuma Matsuno, Yuu Kawaguchi, Yuuji Adachi, Koichi Amari, Hideki Kawaguchi, Seiya Haraguchi, Takayoshi Masaki, Takuya Fujino, Tadayuki Dofuku, Yosuke Takita, Kazuhiro Tamura, Atsushi Tanaka
  • Patent number: 10884035
    Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Grant
    Filed: October 8, 2019
    Date of Patent: January 5, 2021
    Assignee: Renesas Electronics Corporation
    Inventors: Kazuki Fukuoka, Toshifumi Uemura, Yuko Kitaji, Yosuke Okazaki, Akira Murayama
  • Publication number: 20200041547
    Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Application
    Filed: October 8, 2019
    Publication date: February 6, 2020
    Inventors: Kazuki FUKUOKA, Toshifumi UEMURA, Yuko KITAJI, Yosuke OKAZAKI, Akira MURAYAMA
  • Patent number: 10481185
    Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Grant
    Filed: September 14, 2017
    Date of Patent: November 19, 2019
    Assignee: RENESAS ELECTRONICS CORPORATION
    Inventors: Kazuki Fukuoka, Toshifumi Uemura, Yuko Kitaji, Yosuke Okazaki, Akira Murayama
  • Publication number: 20180095115
    Abstract: An object of the present invention is to provide a semiconductor device, a semiconductor system, and a control method of a semiconductor device capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.
    Type: Application
    Filed: September 14, 2017
    Publication date: April 5, 2018
    Inventors: Kazuki FUKUOKA, Toshifumi UEMURA, Yuko KITAJI, Yosuke OKAZAKI, Akira MURAYAMA