Abstract: A method for operating a memory device includes: receiving a first read command and a first address; reading a first read data and a first error correction code from memory cells selected based on the first address; detecting and correcting an error of the first read data using the first error correction code; storing the first address as an error detection address in an address latch circuit; storing an error-corrected bit of the first read data and a position of the error-corrected bit of the first read data in a data latch circuit; and transmitting an error-corrected first read data to an external device.

Abstract: A method for operating a memory device includes: receiving a first read command and a first address; reading a first read data and a first error correction code from memory cells selected based on the first address; detecting and correcting an error of the first read data using the first error correction code; storing the first address as an error detection address in an address latch circuit; storing an error-corrected bit of the first read data and a position of the error-corrected bit of the first read data in a data latch circuit; and transmitting an error-corrected first read data to an external device.

Abstract: An operating method of a memory device including a plurality of memory cells may include: measuring data retention times of at least a portion of the plurality of memory cells; and optimizing a refresh operation on the plurality of memory cells using the measurement result.

Abstract: A semiconductor memory device includes: a plurality of memory blocks; a plurality of bit-line sense amplifiers shared by neighboring memory blocks among the plurality of the memory blocks, and suitable for sensing and amplifying data read from memory cells coupled to activated word lines through bit lines, and outputting the amplified data through a plurality of segment data lines; a word line driver suitable for activating word lines of memory blocks that do not share the bit-line sense amplifiers during a test mode; and a weak cell detection circuit suitable for compressing the amplified data transferred through the plurality of the segment data lines for generating compressed data and detecting a weak cell based on the compressed data during the test mode.

Abstract: A semiconductor memory device includes: a plurality of memory blocks; a plurality of bit-line sense amplifiers shared by neighboring memory blocks among the plurality of the memory blocks, and suitable for sensing and amplifying data read from memory cells coupled to activated word lines through bit lines, and outputting the amplified data through a plurality of segment data lines; a word line driver suitable for activating word lines of memory blocks that do not share the bit-line sense amplifiers during a test mode; and a weak cell detection circuit suitable for compressing the amplified data transferred through the plurality of the segment data lines for generating compressed data and detecting a weak cell based on the compressed data during the test mode.

Abstract: A method of refreshing a semiconductor device may be provided. A semiconductor device may include a refresh control circuit and a memory circuit. The refresh control circuit may be configured to compare addresses generated based on a command with fail addresses to generate a normal word line signal and a redundancy word line signal which are enabled during a predetermined time section from a point of time that the command is inputted to the refresh control circuit. The memory circuit may be configured to inactivate a fail word line connected to a failed memory cell based on the addresses if the normal word line signal is enabled and activates a redundancy word line replacing the fail word line if the redundancy word line signal is enabled.

Abstract: A semiconductor memory device includes: a weak cell controller for programming weak cell information, outputting the weak cell information in response to an initialization signal or a write end signal, and outputting a read end signal whenever the weak cell information is outputted; a memory cell array region that includes memory cells for storing data in response to a row active signal and a column selection signal, and includes a first cell region for storing the weak cell information; an information transfer control circuit for generating a column address based on a column counting signal generated by using the read end signal, and generating a row address whenever the column counting signal reaches a predetermined value in response to the initialization signal; a row circuit for enabling the row active signal; and a column circuit for outputting the column selection signal by decoding the column address.

Abstract: A memory device includes a plurality of memory cells; a nonvolatile memory block suitable for simultaneously sensing one or more programmed weak addresses, and sequentially transmitting the sensed weak addresses; a weak address control block suitable for latching the weak addresses transmitted from the nonvolatile memory block, and outputting sequentially the latched weak addresses in a weak refresh operation; and a refresh control block suitable for controlling the memory cells corresponding to the counting address to be refreshed, in a normal refresh operation, and controlling the memory cells corresponding to the weak address to be refreshed, in the weak refresh operation.

Abstract: A refresh control device is disclosed, which relates to a technology for efficiently storing weak cell refresh addresses. The refresh control device includes a weak cell address storage circuit to store a weak address, a weak cell address control circuit, and a row address control circuit. The weak cell address control circuit outputs a weak enable signal and a row address by comparing a refresh address with the weak address, and only activates the refresh address according to the comparison result or activates both the refresh address and the row address. The row address control circuit controls a refresh operation by selectively activating a word line of a bank in response to the refresh address, the weak enable signal, and the row address.

Abstract: A test circuit includes a phase difference detection unit and a determination unit. The phase difference detection unit detects a phase difference between a first signal received through a first pad and a second signal received through a second pad. The determination unit compares the detected phase difference with a preset amount of delay and outputs a result signal.

Abstract: A signal transfer circuit includes a signal input unit suitable for generating an input signal corresponding to a first voltage level and a second voltage level, a transfer control unit suitable for controlling a driving path of a transfer node in response to a control signal and selectively driving the transfer node to the second voltage level or a third voltage level, which is higher than the first voltage level, based on the driving path in response to the input signal, and an output control unit suitable for outputting an output signal by driving an output node based on a voltage level of the transfer node or maintaining a previous voltage level of the output node in response to the control signal.

Abstract: A signal transfer circuit includes a signal input unit suitable for generating an input signal corresponding to a first voltage level and a second voltage level a transfer control unit suitable for controlling a driving path of a transfer node in response to a control signal and selectively driving the transfer node to the second voltage level or a third voltage level, which is higher than the first voltage level, based on the driving path in response to the input signal, and an output control unit suitable for outputting an output signal by driving an output node based on a voltage level of the transfer node or maintaining a previous voltage level of the output node in response to the control signal.

Abstract: A test circuit includes a phase difference detection unit and a determination unit. The phase difference detection unit detects a phase difference between a first signal received through a first pad and a second signal received through a second pad. The determination unit compares the detected phase difference with a preset amount of delay and outputs a result signal.

Abstract: A precharge signal generator having a latch signal generator, an internal signal generator, and a pulse generator is presented. The latch signal generator is configured to generate a latch signal that is activated in response to an auto-precharge command and inactivated in response to an active pulse. The internal signal generator is configured to generate an internal signal activated when a delayed active signal and the latch signal are all activated. The pulse generator is configured to generate a precharge signal including a pulse that is activated in a period for which the internal signal is being active.

Abstract: A pipe latch circuit comprises a reset signal generating unit which receives a read-write flag signal and a read period signal and generates a reset signal, wherein the reset signal is enabled upon entry into a write operation or after all data are outputted to an outside upon read operation, an input/output control signal generating unit which generates a plurality of input control signals and output control signals in response to a read strobe signal and a clock signal, and is reset in response to the reset signal, and a pipe latch unit which latches inputted data in response to the input control signals and outputs the latched data in response to the output control signals.

Abstract: Disclosed are a thermal code transmission circuit and a semiconductor memory device using the same. The thermal code transmission circuit includes a select signal generator which generates a select signal in response to a first enable signal, a level signal generator which receives the first enable signal to generate a level signal, an update signal generator which receives the level signal and a first update signal to generate a second update signal, a latch unit which receives a thermal code in response to the second update signal and outputs the thermal code as an output thermal code, and a thermal code output unit which selectively outputs the output thermal code in response to the select signal.

Abstract: A driving strength control circuit and a data output circuit for controlling driving strength of a data driver based on a user's demand are provided to make it possible to control the driving strength through a fuse cutting. The driving strength control circuit includes a fuse signal generating unit for generating a fuse signal based on a fuse cutting, a select signal generating unit for generating select signals in response to the fuse signal, a driving control signal generating unit for receiving set-up signals and generate driving control signals in response to the select signals, and a driving signal generating unit for driving signals by decoding the driving control signals.

Abstract: A precharge signal generator having a latch signal generator, an internal signal generator, and a pulse generator is presented. The latch signal generator is configured to generate a latch signal that is activated in response to an auto-precharge command and inactivated in response to an active pulse. The internal signal generator is configured to generate an internal signal activated when a delayed active signal and the latch signal are all activated. The pulse generator is configured to generate a precharge signal including a pulse that is activated in a period for which the internal signal is being active.

Abstract: A pipe latch circuit comprises a reset signal generating unit which receives a read-write flag signal and a read period signal and generates a reset signal, wherein the reset signal is enabled upon entry into a write operation or after all data are outputted to an outside upon read operation, an input/output control signal generating unit which generates a plurality of input control signals and output control signals in response to a read strobe signal and a clock signal, and is reset in response to the reset signal, and a pipe latch unit which latches inputted data in response to the input control signals and outputs the latched data in response to the output control signals.

Abstract: A wafer burn-in test circuit includes an address toggle signal generating unit for generating an address toggle signal in response to address signals having a constant time period, a reset signal generating unit for receiving a wafer burn-in mode activation signal, the address signals, and a reset determination signal among the address signals and then generating a reset signal, a refresh test mode signal generating unit for receiving the address toggle signal and the reset signal and then generating a refresh test mode signal, and a refresh period signal generating unit for receiving the address toggle signal and the refresh test mode signal and then generating a refresh period signal.