Patents by Inventor Young Deuk Kim

Young Deuk Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130057559
    Abstract: A display device includes a panel including pixels defined by data lines and gate lines, a housing chassis covering a sidewall and an edge of the panel, a printed circuit board under the panel, the printed circuit board including circuit elements configured to generate at least one of a data signal, a gate signal, and a control signal, a chip on film connecting the printed circuit board to the panel, the chip on film between the housing chassis and the sidewall of the panel, a driver integrated circuit mounted on the chip on film and configured to respond to the control signal and drive at least one of the data signal and the gate signal applied to the data lines and the gate lines, and a connection unit attaching the chip on film to the housing chassis and dissipating heat generated by the driver integrated circuit to the housing chassis.
    Type: Application
    Filed: August 28, 2012
    Publication date: March 7, 2013
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jichul KIM, Young-Deuk KIM, Eunseok CHO, Mi-Na CHOI
  • Publication number: 20130021768
    Abstract: Chip-on-film packages are provided. A chip-on-film package includes a film substrate having a first surface and a second surface opposite to each other, a semiconductor chip on the first surface, and a thermal deformation member adjacent to the second surface. The thermal deformation member has a construction that causes its shape to transform according to a temperature. Related devices and device assembles are also provided.
    Type: Application
    Filed: June 28, 2012
    Publication date: January 24, 2013
    Inventors: Jichul KIM, Jae Choon KIM, Young-deuk KIM, Eunseok CHO
  • Patent number: 8325460
    Abstract: Disclosed are a humidity sensor and a fabricating method thereof. The humidity sensor includes a substrate, an anodic aluminum oxide layer formed on the substrate and having a plurality of holes, and electrodes formed on the anodic aluminum oxide layer, in order to improve sensitivity and accuracy of the humidity sensor. Further, the fabricating method of a humidity sensor includes preparing an aluminum substrate, forming an anodic aluminum oxide layer by oxidizing the aluminum substrate, and forming electrodes on the anodic aluminum oxide layer.
    Type: Grant
    Filed: November 13, 2009
    Date of Patent: December 4, 2012
    Assignee: Postech Academy-Industry Foundation
    Inventors: Hyun-Chul Park, Hye-Jin Kim, Woon-Bong Hwang, Young-Deuk Kim, Kun-Hong Lee
  • Patent number: 8168646
    Abstract: Disclosed are 3,4-dihydroquinazoline derivatives of formula (I), a process of preparing them and a pharmaceutical composition including them.
    Type: Grant
    Filed: May 6, 2008
    Date of Patent: May 1, 2012
    Assignee: Dongwoo Syntech Co., Ltd.
    Inventors: Jae Yeol Lee, Dong Joon Choo, Young Deuk Kim, Chun Rim Oh
  • Publication number: 20120003809
    Abstract: The present invention discloses an isolation process in a semiconductor device. In the present invention, when a SPT process is used for isolation, ISO cut patterns for cutting spacers for SPT in the unit of a specific length are first formed, and ISO partition patterns defining partition regions for forming the spacers are then formed over the ISO cut patterns. Accordingly, there are advantages in that the SPT process can be simplified and costs can be reduced according to the simplified process because the isolation process is simplified.
    Type: Application
    Filed: July 5, 2011
    Publication date: January 5, 2012
    Applicant: Hynix Semiconductor Inc.
    Inventor: Young Deuk KIM
  • Patent number: 7915121
    Abstract: A method for manufacturing a semiconductor device having a buried gate is provided. A gate conductive layer is first formed in the peri region before a bit line contact is formed in the cell region, so that a fabrication process is simplified and the problem caused by a step height between the cell region and the core/peri region is not encountered.
    Type: Grant
    Filed: December 30, 2009
    Date of Patent: March 29, 2011
    Assignee: Hynix Semiconductor Inc.
    Inventor: Young Deuk Kim
  • Publication number: 20100134948
    Abstract: Disclosed are a humidity sensor and a fabricating method thereof. The humidity sensor includes a substrate, an anodic aluminum oxide layer formed on the substrate and having a plurality of holes, and electrodes formed on the anodic aluminum oxide layer, in order to improve sensitivity and accuracy of the humidity sensor. Further, the fabricating method of a humidity sensor includes preparing an aluminum substrate, forming an anodic aluminum oxide layer by oxidizing the aluminum substrate, and forming electrodes on the anodic aluminum oxide layer.
    Type: Application
    Filed: November 13, 2009
    Publication date: June 3, 2010
    Applicant: POSTECH ACADEMY-INDUSTRY FOUNDATION
    Inventors: Hyun-Chul PARK, Hye-Jin KIM, Woon-Bong HWANG, Young-Deuk KIM, Kun-Hong LEE
  • Publication number: 20100120803
    Abstract: The present invention relates to 3,4-dihydroquinazoline derivatives, a process of preparing them and a pharmaceutical composition including them. The 3,4-dihydroquinazoline derivatives of the present invention have excellent T-type calcium channel blocking effect and anti-cancer activity.
    Type: Application
    Filed: May 6, 2008
    Publication date: May 13, 2010
    Applicant: DONGWOO SYNTECH CO., LTD.
    Inventors: Jae Yeol Lee, Dong Joon Choo, Young Deuk Kim, Chun Rim Oh
  • Patent number: 7713832
    Abstract: A method of fabricating a semiconductor device includes forming an interlayer insulating pattern over a semiconductor substrate. The interlayer insulating pattern defines a plurality of storage node regions. A lining conductive film is formed over the interlayer insulating pattern including the storage node region. A capping insulating film is formed over the lining conductive film. The capping insulating film over the interlayer insulating film and the lining conductive film are selectively etched between two neighboring storage node regions to form a recess exposing the interlayer insulating pattern on the bottom of the recess and the lining conductive film on sidewalls of the recess. The capping insulating film and the lining conductive film is shaped to be planar so that the lining conductive layer is electrically separated from each other to form a respective lower storage electrode. A supporting pattern is formed to fill the recess.
    Type: Grant
    Filed: December 4, 2007
    Date of Patent: May 11, 2010
    Assignee: Hynix Semiconductor, Inc.
    Inventor: Young Deuk Kim
  • Publication number: 20090001516
    Abstract: A method of fabricating a semiconductor device includes forming an interlayer insulating pattern over a semiconductor substrate. The interlayer insulating pattern defines a plurality of storage node regions. A lining conductive film is formed over the interlayer insulating pattern including the storage node region. A capping insulating film is formed over the lining conductive film. The capping insulating film over the interlayer insulating film and the lining conductive film are selectively etched between two neighboring storage node regions to form a recess exposing the interlayer insulating pattern on the bottom of the recess and the lining conductive film on sidewalls of the recess. The capping insulating film and the lining conductive film is shaped to be planar so that the lining conductive layer is electrically separated from each other to form a respective lower storage electrode. A supporting pattern is formed to fill the recess.
    Type: Application
    Filed: December 4, 2007
    Publication date: January 1, 2009
    Inventor: Young Deuk Kim
  • Patent number: 6316644
    Abstract: The present invention relates to a polyethoxylated retinamide derivative represented by formula (I), which is useful as an agent for inhibiting skin aging; in R represents hydrogen or C1-6 lower alkyl and n denotes the number of 2 to 100, and the process for preparing the compound of formula (I) as an effective component.
    Type: Grant
    Filed: September 27, 2000
    Date of Patent: November 13, 2001
    Assignee: LG Chemical Ltd.
    Inventors: Bong Youl Chung, Young Keun Kim, In Sang Lee, Bong Jun Park, Wan Goo Cho, Young Sook Song, Mun Eok Park, Young Deuk Kim, Sung Jun Lee