Abstract: A memory system for performing a recovery operation is provided. A memory system includes a memory device including a plurality of memory cells constituting a plurality of sub-sets, and a memory controller for controlling the memory device. The memory controller controls the memory device to manage a read count indicating a number of read operations performed by the memory device for each of the plurality of sub-sets, and to perform a recovery operation on a sub-set, among the plurality of sub-sets, based on the read count corresponding to the read count. Each of a plurality of sub-sets includes a plurality of pages. Each of the plurality of pages is a unit in which a read operation is performed in the plurality of memory cells.

Abstract: The present application relates to a novel linker for use in bioconjugation, comprising two or more electrophilic carbon atoms of a carbonyl group, and a click chemistry functional group and, more specifically, to a linker through which a compound, a peptide, and/or a protein can be directly and/or indirectly linked by a substitution reaction to a desired target molecule, that is, a target molecule.

Abstract: A reverse osmosis apparatus for a seawater desalination system is provided. The reverse osmosis apparatus includes a barrel in which a plurality of vessels receiving reverse osmosis membrane units are arranged, a feed tank provided in an intermediate portion of the barrel and connected to a seawater inlet, a first water tank provided inside a first end portion of the barrel and connected to a plurality of first vessels connected to a first side of the feed tank, and a second water tank provided inside a second end portion of the barrel and connected to a plurality of second vessels connected to a second side of the feed tank.

Abstract: A reverse osmosis system for a seawater desalination system is provided.

Abstract: A reverse osmosis apparatus for a seawater desalination system is provided.

Abstract: A memory controller configured to control a memory device including a plurality of banks. The memory controller may determine whether a number of write commands enqueued in a command queue of the memory controller exceeds a reference value, calculate a level of write power to be consumed by the memory device in response to at least some of the write commands from among the enqueued write commands when the number of enqueued write commands exceeds the reference value, and schedule, based on the calculated level of write power, interleaving commands executing an interleaving operation of the memory device, from among the enqueued write commands.

Abstract: A memory controller is provided. The memory controller includes an error correction code (ECC) circuit configured to correct an error of a read codeword provided from a memory device, the ECC circuit including: a codeword combination generator configured to receive a first read codeword including a plurality of first read codeword bit values that are read from a first region of the memory device, generate a change codeword by changing values of one or more of the plurality of first read codeword bit values, and provide a codeword combination including the change codeword; and an ECC decoder including a plurality of ECC engines, wherein the ECC decoder is configured to perform ECC decoding in parallel on a plurality of codewords included in the codeword combination.

Abstract: A memory controller to control a memory device includes an Error Checking and Correcting (ECC) engine to perform error detection on data read from the memory device and a data operation manager. The data operation manager is to control a first rewrite operation of the memory device on selected memory cells to compensate for a drift in a distribution of the selected memory cells, based on a result of a test read operation of the memory device on test cells, determine a distribution adjustment degree based on a result of a normal read operation, as an ECC decoding operation corresponding to the normal read operation of the memory device is successfully performed by using the ECC engine, and control a second rewrite operation of the memory device based on the determined distribution adjustment degree.

Abstract: A method of predicting membrane fouling in a reverse osmosis process includes collecting information relative to the reverse osmosis process being performed over a predetermined period of time, the collected information including a process factor and a water quality factor, the process factor including a produced water flow rate; calculating a salt removal rate and a pressure drop based on the collected information; normalizing the produced water flow rate, the salt removal rate, and the pressure drop; generating a prediction equation using normalized values of the produced water flow rate, the salt removal rate, and the pressure drop values; and predicting membrane fouling through the generated prediction equation to determine a chemical cleaning time. Process and water quality factors are normalized to temperature and/or flow rate, and the prediction equation uses the normalized factors. Both short-term and long-term predictions are made for chemical cleaning time and membrane module replacement time.

Abstract: A memory controller to control a memory device includes an Error Checking and Correcting (ECC) engine to perform error detection on data read from the memory device and a data operation manager. The data operation manager is to control a first rewrite operation of the memory device on selected memory cells to compensate for a drift in a distribution of the selected memory cells, based on a result of a test read operation of the memory device on test cells, determine a distribution adjustment degree based on a result of a normal read operation, as an ECC decoding operation corresponding to the normal read operation of the memory device is successfully performed by using the ECC engine, and control a second rewrite operation of the memory device based on the determined distribution adjustment degree.

Abstract: A memory system for performing a recovery operation is provided. A memory system includes a memory device including a plurality of memory cells constituting a plurality of sub-sets, and a memory controller for controlling the memory device. The memory controller controls the memory device to manage a read count indicating a number of read operations performed by the memory device for each of the plurality of sub-sets, and to perform a recovery operation on a sub-set, among the plurality of sub-sets, based on the read count corresponding to the read count. Each of a plurality of sub-sets includes a plurality of pages. Each of the plurality of pages is a unit in which a read operation is performed in the plurality of memory cells.

Abstract: A memory controller is provided. The memory controller includes an error correction code (ECC) circuit configured to correct an error of a read codeword provided from a memory device, the ECC circuit including: a codeword combination generator configured to receive a first read codeword including a plurality of first read codeword bit values that are read from a first region of the memory device, generate a change codeword by changing values of one or more of the plurality of first read codeword bit values, and provide a codeword combination including the change codeword; and an ECC decoder including a plurality of ECC engines, wherein the ECC decoder is configured to perform ECC decoding in parallel on a plurality of codewords included in the codeword combination.

Abstract: A memory controller configured to control a memory device including a plurality of banks. The memory controller may determine whether a number of write commands enqueued in a command queue of the memory controller exceeds a reference value, calculate a level of write power to be consumed by the memory device in response to at least some of the write commands from among the enqueued write commands when the number of enqueued write commands exceeds the reference value, and schedule, based on the calculated level of write power, interleaving commands executing an interleaving operation of the memory device, from among the enqueued write commands.

Abstract: Provided are a memory device and a memory system including the same. The memory device may include a first memory rank including at least one first memory chip, a memory controller configured to provide a command to the first memory rank, at least one data buffer configured to buffer data input to the at least one first memory chip or being output from the at least one first memory chip, and a second memory rank connected to the first memory rank and comprising at least one second memory chip. The first memory rank may provide training data and a data strobe signal to the second memory rank based on a data training command from the memory controller without the training data and the data strobe signal passing through the data buffer. The second memory rank may determine a delay of the data strobe signal based on the training data being detected by the second memory rank.

Abstract: Provided are a memory device and a memory system including the same. The memory device may include a first memory rank including at least one first memory chip, a memory controller configured to provide a command to the first memory rank, at least one data buffer configured to buffer data input to the at least one first memory chip or being output from the at least one first memory chip, and a second memory rank connected to the first memory rank and comprising at least one second memory chip. The first memory rank may provide training data and a data strobe signal to the second memory rank based on a data training command from the memory controller without the training data and the data strobe signal passing through the data buffer. The second memory rank may determine a delay of the data strobe signal based on the training data being detected by the second memory rank.

Abstract: A differential amplifier layout includes a current mirror having a first transistor, a second transistor, and a third transistor. The current mirror receives a first power supply through the first transistor. The second transistor is part of a reference current branch and the third transistor is part of a mirror current branch. The first transistor comprises a first group of fingers disposed adjacent one side of the second transistor and a second group of fingers disposed adjacent one side of the third transistor.

Abstract: A differential amplifier layout includes a current mirror having a first transistor, a second transistor, and a third transistor. The current mirror receives a first power supply through the first transistor. The second transistor is part of a reference current branch and the third transistor is part of a mirror current branch. The first transistor comprises a first group of fingers disposed adjacent one side of the second transistor and a second group of fingers disposed adjacent one side of the third transistor.