Abstract: A method of fabricating a conductive line of a semiconductor device is disclosed. The method includes the steps of: sequentially forming a conductive material layer and a mask on a semiconductor substrate, wherein a thickness of the conductive material layer is between 30000 angstroms (?) and 90000 angstrom (?); performing a first etching process to remove a part of the conductive material layer to form at least an upper side; and performing a second etching process to remove a part of the conductive material layer to form at least a lower side, wherein a curvature of the upper side is different from a curvature of the lower side.

Abstract: A method of fabricating a conductive line of a semiconductor device is disclosed. The method includes the steps of: sequentially forming a conductive material layer and a mask on a semiconductor substrate, wherein a thickness of the conductive material layer is between 30000 angstroms (?) and 90000 angstrom (?); performing a first etching process to remove a part of the conductive material layer to form at least an upper side; and performing a second etching process to remove a part of the conductive material layer to form at least a lower side, wherein a curvature of the upper side is different from a curvature of the lower side.

Abstract: A conductive line of a semiconductor device includes a conductive layer disposed on a semiconductor substrate. A thickness of the conductive layer is substantially larger than 10000 angstrom (?), and at least a side of the conductive layer has at least two different values of curvature.

Abstract: A conductive line of a semiconductor device includes a conductive layer disposed on a semiconductor substrate. A thickness of the conductive layer is substantially larger than 10000 angstrom (?), and at least a side of the conductive layer has at least two different values of curvature.

Abstract: A process of a micro-display is provided. First, a substrate having a pixel region and a periphery circuit region is provided, in which a metal reflection layer is formed in the pixel region, and a periphery circuit is formed in the periphery circuit region. Next, a dielectric layer is formed on the substrate to cover the pixel region and the periphery circuit region. Then, a patterned mask layer exposing the dielectric layer on the metal reflection layer is formed on the dielectric layer. Thereafter, a portion of the exposed dielectric layer is removed by using the patterned mask layer as a mask. Next, the patterned mask layer is removed. And then, a portion of the dielectric layer is removed to expose the metal reflection layer.

Abstract: A semiconductor device is described, including a substrate, a transistor, a hard mask layer and an anti-reflection layer. The substrate includes a first area and a second area, wherein the second area includes a photosensing area. The transistor is disposed on the substrate in the first area and the hard mask layer over the substrate in the second area. The anti-reflection layer is disposed between the hard mask layer and the substrate.

Abstract: A semiconductor device is described, including a substrate, a transistor, a hard mask layer and an anti-reflection layer. The substrate includes a first area and a second area, wherein the second area includes a photosensing area. The transistor is disposed on the substrate in the first area and the hard mask layer over the substrate in the second area. The anti-reflection layer is disposed between the hard mask layer and the substrate.

Abstract: A semiconductor image sensor includes a metal layer formed on a semiconductor substrate. An oxide layer is disposed over the semiconductor substrate to cover the metal layer. A SOG is disposed on the oxide layer, a color filter is disposed on the SOG and a silicon-oxy-nitride layer is disposed thereon. By using the high transmittance of the SOG and the silicon-oxy-nitride layer, the blue light transmittance by the semiconductor image sensor is therefore enhanced.