Abstract: Methods and apparatus are provided for detection of a synchronization mark based on a position of an extreme distance metric. A synchronization mark is detected in a received signal by computing a distance metric between the received signal and an ideal version of the received signal expected when reading the synchronization mark, wherein the distance metric is computed for a plurality of positions within a search window; determining a substantially extreme distance metric within the search window; and detecting the synchronization mark based on a position of the substantially extreme distance metric. The distance metric can comprise a sum of square differences or a Euclidean distance between the received signal and the ideal version of the received signal.

Abstract: Various embodiments of the present invention provide systems and methods for determining fly-height adjustments. For example, various embodiments of the present invention provide storage devices that include a storage medium, a read/write head assembly disposed in relation to the storage medium (278), and a SAM based fly-height adjustment circuit (214). The storage medium (278) includes a plurality of servo data regions (110) that each include a servo address mark (154). The SAM based fly-height adjustment circuit (214) receives the servo address mark (154) from the plurality of servo data regions (110) via the read/write head assembly (276), and calculates a first harmonics ratio (445) based on the received data. The first harmonics ratio (445) is compared with a second harmonics ratio (450) to determine an error (365) in the distance (295) between the read/write head assembly (276) and the storage medium (278).

Abstract: In a hard-disc drive, a defect region on the hard disc is classified as corresponding to either thermal asperity (TA) or media defect (MD) by generating two statistical measures. A first measure (e.g., ?1) is based on (i) the magnitudes of one or both of signal values (e.g., equalizer input or output signal values) and the corresponding expected values of those signal values and (ii) the signs of one or both of the signal values and the expected signal values. A second measure (e.g., ?2) is based on the magnitudes of one or both of the signal values and the expected signal values, but not the signs of either the signal values or the expected signal values. The two measures are then compared to determine whether the defect region corresponds to TA or MD.

Abstract: In one embodiment, a hard-disk drive system performs fly-height control using a read-back mode and a loop-back mode. The read-back mode measures first and second harmonics pre-recorded on the medium and divides the first measurement by the second to obtain a read-back mode harmonic ratio. The loop-back mode measures the same first and second harmonics; however, the harmonics are provided by a write precompensation circuit rather than the medium. Further, the loop-back mode measurements are performed using asynchronous sampling to address aliasing and quantization errors. The first measurement is divided by the second to generate a loop-back harmonic ratio. In logarithm domain, the loop-back ratio is subtracted from the read-back mode ratio to remove environment-induced variations in the read path electronic circuits. The resulting harmonic ratio is subtracted from an initial harmonic ratio determined, for example, during manufacturing, to determine how much the harmonic ratio has changed.

Abstract: Techniques are provided that generate bit reliabilities for a detected sequence. A detector generates the detected sequence. According to one embodiment, a post-processor finds a first set of combinations of one or more error events in the detected sequence satisfying a complete set or a subset of error correction constraints corresponding to the first bit value, finds a second set of combinations of one or more error events in the detected sequence satisfying a complete set or a subset of error correction constraints corresponding to the second bit value, selects a first most likely combination of one or more events of the first set and a second most likely combination of one or more events of the second set, and generates a bit reliability based on the first and the second most likely values.

Abstract: A detector generates a detected sequence, and a post processor generates probability values that indicate the likelihood of a plurality of error events in the detected sequence. The post processor partitions the values into first and second subsets. The post processor selects a first most likely value from the first subset of the values and a second most likely value from the second subset of the values. The post processor generates a bit reliability based on the first and the second most likely values.

Abstract: In a hard-disc drive read channel, frequency-based measures are generated at two different data frequencies (e.g., 2T and DC) by applying a transform, such as a discrete Fourier transform (DFT), to signal values, such as ADC or equalizer output values, corresponding to, e.g., a 2T data pattern stored on the hard disc. The frequency-based measures are used to detect defect regions on the hard disc and/or to classify defect regions as being due to either thermal asperity (TA) or drop-out media defect (MD).

Abstract: In a hard-disc drive, a defect region on the hard disc is classified as corresponding to either thermal asperity (TA) or media defect (MD) by generating two statistical measures. A first measure (e.g., ?1) is based on (i) the magnitudes of one or both of signal values (e.g., equalizer input or output signal values) and the corresponding expected values of those signal values and (ii) the signs of one or both of the signal values and the expected signal values. A second measure (e.g., ?2) is based on the magnitudes of one or both of the signal values and the expected signal values, but not the signs of either the signal values or the expected signal values. The two measures are then compared to determine whether the defect region corresponds to TA or MD.

Abstract: Various embodiments of the present invention provide systems and methods for using channel bit density estimates to adjust fly-height. For example, various embodiments of the present invention provide methods for adaptively adjusting fly-height. Such methods include providing a storage medium that includes information corresponding to a process data set, and a read/write head assembly that is disposed a variable distance from the storage medium. The process data set is accessed from the storage medium. A first channel bit density estimate is adaptively calculated based at least in part on the process data set and a second channel bit density estimate that was previously calculated. The variable distance is modified based at least in part on the first channel bit density estimate. A third channel bit density is adaptively calculated based at least in part on the process data set and a fourth channel bit density estimate that was previously calculated.

Abstract: In a hard-disc drive read channel, frequency-based measures are generated at two different data frequencies (e.g., 2T and DC) by applying a transform, such as a discrete Fourier transform (DFT), to signal values, such as ADC or equalizer output values, corresponding to, e.g., a 2T data pattern stored on the hard disc. The frequency-based measures are used to detect defect regions on the hard disc and/or to classify defect regions as being due to either thermal asperity (TA) or drop-out media defect (MD).

Abstract: Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.

Abstract: Various embodiments of the present invention provide systems and methods for estimating noise components in a received signal set. For example, one embodiment of the present invention provides a noise estimation circuit that includes a data detector circuit and a noise component calculation circuit. The data detector circuit receives a series of data samples and provides a detected output, and the noise component calculation circuit provides an electronics noise power output and a media noise power output each calculated based at least in part on the detected output and the series of data samples.

Abstract: Various embodiments of the present invention provide systems and methods for updating detector parameters in a data processing circuit. For example, a data processing circuit is disclosed that includes a first detector circuit, a second detector circuit, and a calibration circuit. The first detector circuit is operable to receive a first data set and to apply a data detection algorithm to the first data set, and the second detector circuit is operable to receive a second data set and to apply the data detection algorithm to the second data set. The calibration circuit is operable to calculate a data detection parameter based upon a third data set. The data detection parameter is used by the first detector circuit in applying the data detection algorithm to the first data set during a period that the data detection parameter is used by the second detector circuit in applying the data detection algorithm to the second data set.

Abstract: Various embodiments of the present invention provide systems and methods for providing a corrected dibit signal. As an example, various embodiments of the present invention provide dibit correction circuits. Such dibit correction circuits include a dibit sample buffer, a maximum sample detector circuit, a side sample detector circuit, and a dibit correction circuit. The dibit sample buffer includes a plurality of samples of an uncorrected dibit signal. The maximum sample detector circuit identifies a maximum sample of the plurality of samples of the uncorrected dibit signal, and the side sample detector circuit identifies a first side sample prior to the maximum sample on the uncorrected dibit signal and a second side sample following the maximum sample on the uncorrected dibit signal.

Abstract: Various embodiments of the present invention provide data processing circuits that include a multiplexer, a memory buffer, a data processing circuit, and a channel setting modification circuit. A first input of the multiplexer receives an input data set and a second input of the multiplexer receives a buffered data set. The multiplexer provides either the input data set or the buffered data set as a multiplexer output based upon a select signal. The memory buffer receives the multiplexer output and provides the buffered data set. Operation of the data processing circuit is at least in part governed by channel settings. The data processing circuit receives the multiplexer output and performs a data detection process. The select signal is asserted to select the buffered data set when the data detection process fails, and is asserted to select the input data set when the data detection process succeeds.

Abstract: Various embodiments of the present invention provide systems and methods for reducing head distortion. For example, various embodiments of the present invention provide storage devices that include a storage medium, a read/write head assembly, and an adaptive distortion modification circuit. The storage medium includes information that may be sensed by the read/write head assembly that is disposed in relation to the storage medium. The adaptive distortion modification circuit receives the information sensed by the read/write head assembly and adaptively estimates and implements a distortion compensation factor in the analog domain. In some instances of the aforementioned embodiments, the read/write head assembly includes a magneto resistive head. In such instances, the distortion compensation factor is designed to compensate for non-linear distortion introduced by the magneto resistive head.

Abstract: Various embodiments of the present invention provide systems and methods for equalizing an input signal. For example, various embodiments of the present invention provide a method for performing equalization in a storage device. Such methods include providing an equalizer circuit that is governed by a target value, and a filter circuit that is governed by a filter coefficient. An initial value is provided to the equalizer circuit as the target value, and an overall target based at least in part on the initial value and the filter coefficient is calculated. An updated value is calculated based on the overall target, and the updated value is provided to the equalizer circuit as the target value.

Abstract: Various embodiments of the present invention provide systems and methods for write pre-compensation. For example, various embodiments of the present invention provide methods for modifying magnetic information transfer. The methods include retrieving magnetically represented data from a storage medium, and converting the magnetically represented data to a series of data samples. A preceding pattern and a transition status is identified in the series of data samples, and an equalized channel response is computed based on an estimated NLTS value. An error value is computed that corresponds to a difference between the estimated NLTS value and an actual NLTS value, and a pre-compensation value is computed based at least in part on the error value.

Abstract: Various embodiments of the present invention provide systems and methods for data processing. For example, some embodiments of the present invention provide noise reduced data processing circuits. Such circuits include a selector circuit, a sample set averaging circuit, and a data detection circuit. The selector circuit provides either a new sample set or an averaged sample set as a sample output based on a select control signal. The sample set averaging circuit receives the new sample set and provides the averaged sample set. The averaged sample set is based upon two or more instances of the new sample set. The data detection circuit receives the sample output, and performs a data detection algorithm on the sample output and provides the select control signal and a data output.

Abstract: Various embodiments of the present invention provide systems and methods for acquiring timing and/or gain information. For example, various embodiments of the present invention provide data processing circuits that include a sample splitting circuit, a first averaging circuit, a second averaging circuit and a parameter calculation circuit. The sample splitting circuit receives a data input that includes a series of samples that repeat periodically over at least a first phase and a second phase. The sample splitting circuit divides the series of samples into at least a first sub-stream corresponding to the first phase and a second sub-stream corresponding to the second phase. The first averaging circuit averages values from the first sub-stream to yield a first average, and the second averaging circuit averages values from the second sub-stream to yield a second average. The parameter calculation circuit calculates a parameter value based at least in part on the first average and the second average.