Patents by Inventor Yuenie Lau

Yuenie Lau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8952770
    Abstract: The self-keying waveguide interconnection system for repeatable waveguide calibration and connection comprises a plug with a centrally disposed aperture, a jack provided with a counterbore to accept a plug diameter. The jack includes a plurality of self-keying channels. A shim having a shape complementary to the plurality of self keying thru slots has a plurality of self keying thru slots for aligning the centrally disposed aperture of the plug to the centrally disposed aperture of the jack. The system identifies the orientation and flange face polarity of the line or adapter without the use of alignment pins as two or more of these independent waveguide interfaces are coupled. In use, the device functions as a self-keying shim/spacer/adapter for a calibration kit or adapter in waveguide sections.
    Type: Grant
    Filed: June 21, 2013
    Date of Patent: February 10, 2015
    Assignee: OML, Inc.
    Inventor: Yuenie Lau
  • Publication number: 20130342288
    Abstract: The self-keying waveguide interconnection system for repeatable waveguide calibration and connection comprises a plug with a centrally disposed aperture, a jack provided with a counterbore to accept a plug diameter. The jack includes a plurality of self-keying channels. A shim having a shape complementary to the plurality of self keying thru slots has a plurality of self keying thru slots for aligning the centrally disposed aperture of the plug to the centrally disposed aperture of the jack. The system identifies the orientation and flange face polarity of the line or adapter without the use of alignment pins as two or more of these independent waveguide interfaces are coupled. In use, the device functions as a self-keying shim/spacer/adapter for a calibration kit or adapter in waveguide sections.
    Type: Application
    Filed: June 21, 2013
    Publication date: December 26, 2013
    Inventor: Yuenie Lau
  • Patent number: 6590399
    Abstract: A method for taking measurements using a vector network analyzer (VNA) enables a reduction in interference created when the VNA is operated in the presence of external signals. For the method, three measurements are taken, one at a desired measurement frequency, another at a frequency slightly less than the desired measurement frequency, and another at a slightly greater frequency than the desired measurement frequency. An interfering signal may occur at or near the frequency of one of the three measurements. To eliminate measurement error from the interfering signal, the measurement signal with the median, or middle, magnitude is selected to provide the measurement results.
    Type: Grant
    Filed: April 27, 2000
    Date of Patent: July 8, 2003
    Assignee: Anritsu Company
    Inventors: Eric Branden Karl, Yuenie Lau