Patents by Inventor Yuhong Ren

Yuhong Ren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11946908
    Abstract: The present invention discloses a method for constructing a surface stress distribution cloud map based on critical refraction longitudinal wave detection. The method comprises: firstly, meshing a surface of a detected article; secondly, The mean transverse stress on different grid lines and the mean longitudinal stress on different grid lines were obtained by the critical refraction longitudinal wave detection method; next, calculating the equivalent stress of each mesh node according to the mean transverse stress on different mesh transverse lines and the mean longitudinal stress on different mesh longitudinal lines on the surface of the detected article; and finally, drawing a stress distribution cloud map of the surface of the detected article according to the equivalent stress. The present invention can obtain the stress situations at different points on the surface of the detected article.
    Type: Grant
    Filed: September 24, 2023
    Date of Patent: April 2, 2024
    Assignees: Beijing Precision Machinery & Engineering Research Co., Ltd., Beijing University Of Technology
    Inventors: Yuhong Dai, Nana Niu, Zuguang Huang, Junyan Xing, Xiaofeng Zhu, Huiling Ren, Heqiang Liu, Dequan Wang, Yaru Hou, Xiaoqin Hao
  • Publication number: 20240104918
    Abstract: The present invention discloses a non-interferometric, non-iterative complex amplitude reading method and apparatus. The reading method includes the following steps: diffracting a light beam containing amplitude information and phase information to obtain a diffraction pattern with intensity variations; constructing a diffraction intensity-complex amplitude model and training it based on the correlation between the diffraction pattern and amplitude information and phase information, and applying the trained model directly to new diffraction images to obtain amplitude information and phase information. The method can achieve detection of complex amplitude information, including amplitude and phase, from a single diffraction image, improve the stability and accuracy of phase reading results, increase the calculation speed, and simplify the optical system. It is suitable for applications in holographic storage, biomedical image processing, and microscopic imaging, among others.
    Type: Application
    Filed: June 25, 2023
    Publication date: March 28, 2024
    Applicant: Fujian Normal University
    Inventors: Jianying Hao, Xiaodi Tan, Xiao Lin, Yuhong Ren