Abstract: Provided is a technique for making a user analyze a sample while providing convenience to the user. An information providing system is provided with a determination unit configured to determine whether or not the part needs to be replaced, a display unit, and a display control unit configured to control the display unit. The display control unit causes the display unit to display supplier information on a supplier of the part when the part needs to be replaced.

Abstract: Provided is a technique that makes a user analyze a sample without stressing the user as much as possible. An analyzer is provided with a display unit and a display control unit for controlling the display unit. The display control unit causes the display unit to display predetermined information in a step in which the user is waiting among steps of analyzing the sample.

Abstract: A cantilever has a probe at a tip end. An optical system emits laser light to the cantilever and detects the laser light reflected by the cantilever. A measurement unit measures characteristics of a sample based on a displacement of the cantilever obtained by a change in a position of the laser light detected by the optical system. The laser light adjustment unit adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample. The imaging unit captures an image of a range including the position of the probe when adjusting the optical axis of the laser light. The display unit displays the captured image.

Abstract: A cantilever (2) has a probe (7) at a tip end. An optical system (80) emits laser light to the cantilever (2) and detects the laser light reflected by the cantilever (2). A measurement unit (14) measures characteristics of a sample (9) based on a displacement of the cantilever (2) obtained by a change in a position of the laser light detected by the optical system (80). The laser light adjustment unit (20) adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample (8). The imaging unit (10) captures an image of a range including the position of the probe (7) when adjusting the optical axis of the laser light. The display unit (12) displays the captured image.

Abstract: An information processing system includes: a failure detector, a first failure handling unit and a second failure handling unit. The failure detector detects any of inference processing apparatuses in which a failure has occurred. The first failure handling unit causes another inference processing apparatus other than the inference processing apparatus in which the failure has occurred to execute an inference process of the inference processing apparatus in which the failure has occurred. The second failure handling unit inputs a result of an inference process at a preceding stage of the inference processing apparatus in which the failure has occurred to the another inference processing apparatus and outputs an inference result that the another inference processing apparatus generates based on the input inference result to an inference processing apparatus at a subsequent stage of the inference processing apparatus in which the failure has occurred.

Abstract: An inference processing system includes inference processing devices and performs inference processing such that a succeeding inference processing device performs inference processing to a result of inference processing by a preceding inference processing device.

Abstract: An information processing device includes: a main processor. The main processor receives resource information related to a processing status from each of N processors assuming that N is an integral number equal to or larger than 2, applies the received resource information of the N processors to a computational expression, and calculates processing times corresponding to a processing request from an application for the respective N processors, selects one processor from among the N processors based on the processing times of the N processors, and transmits the processing request to the one processor.

Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.

Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.

Abstract: A communication simulating system includes: a communication recording device that records, into a vehicle condition database, a vehicle condition including a step, a place and a vehicle stringed together, vehicle state information that has been input as communication content between a vehicle electric equipment system and a vehicle communication apparatus in a step performed at a predetermined place; a vehicle state information acquiring device that acquires vehicle state information from the vehicle condition database in accordance with a selected vehicle condition; a storage unit that stores communication definition files specifying the respective ones of the same processes as the communication processes executed by a plurality of ECUs included in the vehicle electric equipment system; and a communication control device that communicates with a vehicle communication apparatus in accordance with the communication process and the vehicle state information.

Abstract: An inspection terminal measures a wireless quality of a host machine during inspection of an object to be inspected, and acquires performance measurement data indicative of the wireless quality. An environment measuring device measures a radio wave intensity in the vicinity of the host machine during inspection of the object to be inspected, and acquires environment measurement data indicative of the radio wave intensity. A movable body (vehicle) which is the object to be inspected, or a movable body that transports the object to be inspected, moves together with the inspection terminal and the environment measuring device, through execution points of a plurality of inspection processes performed within an inspection area. A LET server associates the performance measurement data and the environment measurement data with measurement times and/or the inspection processes.

Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.

Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.

Abstract: An inspection terminal measures a wireless quality of a host machine during inspection of an object to be inspected, and acquires performance measurement data indicative of the wireless quality. An environment measuring device measures a radio wave intensity in the vicinity of the host machine during inspection of the object to be inspected, and acquires environment measurement data indicative of the radio wave intensity. A movable body (vehicle) which is the object to be inspected, or a movable body that transports the object to be inspected, moves together with the inspection terminal and the environment measuring device, through execution points of a plurality of inspection processes performed within an inspection area. A LET server associates the performance measurement data and the environment measurement data with measurement times and/or the inspection processes.

Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.

Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.

Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.

Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.

Abstract: The invention provides a scanning probe microscope capable of eliminating the influence of vibration noise and obtaining, accurately and with high resolution, surface information of a sample S. A scanning probe microscope 1 includes: a main body unit 10; a control unit 30; and a wireless stand 60 that is connected to the control unit 30 through a power supply signal cable 42 and includes a power supplying coil 63 and a transmission and reception unit 64. The main body unit 10 includes: a cantilever 21 with a probe 21a; a sensor 23 for detecting displacement of the cantilever 21; an XYZ drive mechanism 25 that is controlled by the control unit 30 to move the cantilever 21 or the sample S; a vibration isolation mechanism 12; a power receiving coil 13; and a transmission and reception unit 14 for communicating with the transmission and reception unit 64.

Abstract: A semiconductor device PKG includes a semiconductor chip CP, a lead LD3, a wire BW5 electrically connecting a pad electrode PD2 of the semiconductor chip CP to the lead LD3, a wire BW3 electrically connecting a pad electrode PD3 of the semiconductor chip CP to the lead LD3, and a sealing body sealing them with a resin. The semiconductor chip CP includes internal circuits 5b and 5c, and a switch circuit unit SW. Signal transmission is possible between the internal circuit 5c and the pad electrode PD3. The switch circuit unit SW is a circuit capable of being set in a first state in which signal transmission is possible between the internal circuit 5b and the pad electrode PD2, and in a second state in which signal transmission is not possible between the internal circuit 5b and the pad electrode PD2. The switch circuit unit SW is fixed to the second state during operation of the semiconductor device PKG.