Patents by Inventor Yuichiro Yokoyama

Yuichiro Yokoyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7486404
    Abstract: A size difference measuring method comprising: an optical interference measuring step without wringing, of obtaining, through simultaneous measurement of interference fringes, size information relating to the end standards which are set between interferometers, by an optical interferometer without wringing that comprises: one light emitter that emits coherent light; a beam splitter; the interferometers which are arranged with predetermined separation interval between them and each of which has an optical axis in agreement with the length-measurement axes of the end standards having known preliminary values; and a first interference fringe observation device and a second interference fringe observation device; and a computing step of computing a difference of a size of the end standards, based on the interference fringe phase differences acquired as the size information of the end standards.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: February 3, 2009
    Assignee: Mitutoyo Corporation
    Inventor: Yuichiro Yokoyama
  • Publication number: 20070242278
    Abstract: A size difference measuring method comprising: an optical interference measuring step without wringing, of obtaining, through simultaneous measurement of interference fringes, size information relating to the end standards which are set between interferometers, by an optical interferometer without wringing that comprises: one light emitter that emits coherent light; a beam splitter; the interferometers which are arranged with predetermined separation interval between them and each of which has an optical axis in agreement with the length-measurement axes of the end standards having known preliminary values; and a first interference fringe observation device and a second interference fringe observation device; and a computing step of computing a difference of a size of the end standards, based on the interference fringe phase differences acquired as the size information of the end standards.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 18, 2007
    Applicant: MITUTOYO CORPORATION
    Inventor: Yuichiro Yokoyama